JP6072667B2 - 半導体モジュールとその製造方法 - Google Patents
半導体モジュールとその製造方法 Download PDFInfo
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- JP6072667B2 JP6072667B2 JP2013233902A JP2013233902A JP6072667B2 JP 6072667 B2 JP6072667 B2 JP 6072667B2 JP 2013233902 A JP2013233902 A JP 2013233902A JP 2013233902 A JP2013233902 A JP 2013233902A JP 6072667 B2 JP6072667 B2 JP 6072667B2
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Die Bonding (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013233902A JP6072667B2 (ja) | 2013-11-12 | 2013-11-12 | 半導体モジュールとその製造方法 |
| US14/445,411 US9698078B2 (en) | 2013-11-12 | 2014-07-29 | Semiconductor module and method for manufacturing the same |
| DE102014221636.2A DE102014221636B4 (de) | 2013-11-12 | 2014-10-24 | Halbleitermodul und Verfahren zum Herstellen desselben |
| CN201410645842.2A CN104637910B (zh) | 2013-11-12 | 2014-11-12 | 半导体模块和其制造方法 |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013233902A JP6072667B2 (ja) | 2013-11-12 | 2013-11-12 | 半導体モジュールとその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015095545A JP2015095545A (ja) | 2015-05-18 |
| JP2015095545A5 JP2015095545A5 (enExample) | 2016-02-18 |
| JP6072667B2 true JP6072667B2 (ja) | 2017-02-01 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013233902A Active JP6072667B2 (ja) | 2013-11-12 | 2013-11-12 | 半導体モジュールとその製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9698078B2 (enExample) |
| JP (1) | JP6072667B2 (enExample) |
| CN (1) | CN104637910B (enExample) |
| DE (1) | DE102014221636B4 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6721329B2 (ja) * | 2015-12-21 | 2020-07-15 | 三菱電機株式会社 | パワー半導体装置およびその製造方法 |
| DE102016118784A1 (de) | 2016-10-04 | 2018-04-05 | Infineon Technologies Ag | Chipträger, konfiguriert zur delaminierungsfreien Kapselung und stabilen Sinterung |
| JP6647190B2 (ja) * | 2016-11-28 | 2020-02-14 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JP6730450B2 (ja) * | 2016-12-06 | 2020-07-29 | 株式会社東芝 | 半導体装置 |
| JP6673246B2 (ja) * | 2017-02-06 | 2020-03-25 | 株式会社デンソー | 半導体装置 |
| JP6776923B2 (ja) * | 2017-02-06 | 2020-10-28 | 株式会社デンソー | 半導体装置 |
| US10872846B2 (en) | 2017-06-22 | 2020-12-22 | Renesas Electronics America Inc. | Solid top terminal for discrete power devices |
| JP6945418B2 (ja) * | 2017-10-24 | 2021-10-06 | 三菱電機株式会社 | 半導体装置および半導体装置の製造方法 |
| JP7019024B2 (ja) * | 2018-03-07 | 2022-02-14 | 三菱電機株式会社 | 半導体装置及び電力変換装置 |
| DE112019004313T5 (de) * | 2018-08-29 | 2021-05-20 | Rohm Co., Ltd. | Gehäusestruktur, halbleiterbauteil und verfahren zum bilden einer gehäusestruktur |
| CN113632215A (zh) * | 2019-03-26 | 2021-11-09 | 罗姆股份有限公司 | 电子装置以及电子装置的制造方法 |
| JP2022176744A (ja) * | 2021-05-17 | 2022-11-30 | 三菱電機株式会社 | 半導体装置および半導体装置の製造方法 |
| DE102023202869A1 (de) * | 2023-03-29 | 2024-10-02 | Zf Friedrichshafen Ag | Verfahren zur Herstellung einer elektrischen Anordnung |
| JP2025077454A (ja) * | 2023-11-06 | 2025-05-19 | ミネベアパワーデバイス株式会社 | 半導体装置 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2194477A (en) * | 1986-08-28 | 1988-03-09 | Stc Plc | Solder joint |
| US5842275A (en) * | 1995-09-05 | 1998-12-01 | Ford Motor Company | Reflow soldering to mounting pads with vent channels to avoid skewing |
| JP3420153B2 (ja) * | 2000-01-24 | 2003-06-23 | Necエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
| CN1184684C (zh) | 2000-10-05 | 2005-01-12 | 三洋电机株式会社 | 半导体装置和半导体模块 |
| JP2002280503A (ja) * | 2001-03-16 | 2002-09-27 | Unisia Jecs Corp | 半導体装置 |
| US6774482B2 (en) * | 2002-12-27 | 2004-08-10 | International Business Machines Corporation | Chip cooling |
| US7748440B2 (en) * | 2004-06-01 | 2010-07-06 | International Business Machines Corporation | Patterned structure for a thermal interface |
| JP2006202586A (ja) * | 2005-01-20 | 2006-08-03 | Nissan Motor Co Ltd | 接合方法及び接合構造 |
| JP4539980B2 (ja) * | 2005-03-23 | 2010-09-08 | 富士電機システムズ株式会社 | 半導体装置およびその製造方法 |
| JP4598687B2 (ja) | 2006-02-09 | 2010-12-15 | 株式会社日立製作所 | 金属超微粒子使用接合材及びそれを用いた半導体装置 |
| DE102007063308A1 (de) | 2007-12-28 | 2009-07-02 | Robert Bosch Gmbh | Diode |
| US8124449B2 (en) * | 2008-12-02 | 2012-02-28 | Infineon Technologies Ag | Device including a semiconductor chip and metal foils |
| JP5039070B2 (ja) * | 2009-02-12 | 2012-10-03 | 株式会社東芝 | 半導体装置 |
| JP5467799B2 (ja) * | 2009-05-14 | 2014-04-09 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| WO2011142013A1 (ja) * | 2010-05-12 | 2011-11-17 | トヨタ自動車株式会社 | 半導体装置 |
| US8718720B1 (en) * | 2010-07-30 | 2014-05-06 | Triquint Semiconductor, Inc. | Die including a groove extending from a via to an edge of the die |
| JP2012069640A (ja) * | 2010-09-22 | 2012-04-05 | Toshiba Corp | 半導体装置及び電力用半導体装置 |
| US8766100B2 (en) * | 2011-03-02 | 2014-07-01 | Samsung Electronics Co., Ltd. | Printed circuit board and semiconductor package using the same |
| DE102011078582A1 (de) | 2011-07-04 | 2013-01-10 | Robert Bosch Gmbh | Verfahren zum Herstellen von strukturierten Sinterschichten und Halbleiterbauelement mit strukturierter Sinterschicht |
| ITMI20111776A1 (it) * | 2011-09-30 | 2013-03-31 | St Microelectronics Srl | Sistema elettronico per saldatura a rifusione |
| US8587019B2 (en) * | 2011-10-11 | 2013-11-19 | Ledengin, Inc. | Grooved plate for improved solder bonding |
| US9888568B2 (en) * | 2012-02-08 | 2018-02-06 | Crane Electronics, Inc. | Multilayer electronics assembly and method for embedding electrical circuit components within a three dimensional module |
| US9087833B2 (en) * | 2012-11-30 | 2015-07-21 | Samsung Electronics Co., Ltd. | Power semiconductor devices |
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2013
- 2013-11-12 JP JP2013233902A patent/JP6072667B2/ja active Active
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2014
- 2014-07-29 US US14/445,411 patent/US9698078B2/en active Active
- 2014-10-24 DE DE102014221636.2A patent/DE102014221636B4/de active Active
- 2014-11-12 CN CN201410645842.2A patent/CN104637910B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015095545A (ja) | 2015-05-18 |
| US20150130076A1 (en) | 2015-05-14 |
| US9698078B2 (en) | 2017-07-04 |
| CN104637910A (zh) | 2015-05-20 |
| DE102014221636B4 (de) | 2022-08-18 |
| DE102014221636A1 (de) | 2015-05-13 |
| CN104637910B (zh) | 2018-01-16 |
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