JP6052688B2 - 半導体ウェハーティーチング治具 - Google Patents

半導体ウェハーティーチング治具 Download PDF

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Publication number
JP6052688B2
JP6052688B2 JP2015140774A JP2015140774A JP6052688B2 JP 6052688 B2 JP6052688 B2 JP 6052688B2 JP 2015140774 A JP2015140774 A JP 2015140774A JP 2015140774 A JP2015140774 A JP 2015140774A JP 6052688 B2 JP6052688 B2 JP 6052688B2
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Japan
Prior art keywords
semiconductor wafer
sides
stopper
scale
measuring
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JP2015140774A
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English (en)
Japanese (ja)
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JP2016046518A (ja
Inventor
丁炳鐵
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丁炳鐵
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Publication of JP2016046518A publication Critical patent/JP2016046518A/ja
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D85/00—Containers, packaging elements or packages, specially adapted for particular articles or materials
    • B65D85/30—Containers, packaging elements or packages, specially adapted for particular articles or materials for articles particularly sensitive to damage by shock or pressure
    • B65D85/38—Containers, packaging elements or packages, specially adapted for particular articles or materials for articles particularly sensitive to damage by shock or pressure for delicate optical, measuring, calculating or control apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
JP2015140774A 2014-08-20 2015-07-14 半導体ウェハーティーチング治具 Active JP6052688B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2014-0108433 2014-08-20
KR20140108433A KR101467551B1 (ko) 2014-08-20 2014-08-20 반도체 웨이퍼 티칭 지그

Publications (2)

Publication Number Publication Date
JP2016046518A JP2016046518A (ja) 2016-04-04
JP6052688B2 true JP6052688B2 (ja) 2016-12-27

Family

ID=52677149

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015140774A Active JP6052688B2 (ja) 2014-08-20 2015-07-14 半導体ウェハーティーチング治具

Country Status (4)

Country Link
JP (1) JP6052688B2 (zh)
KR (1) KR101467551B1 (zh)
CN (1) CN105374258B (zh)
TW (1) TWI546237B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107958862B (zh) * 2016-10-18 2021-11-09 台湾积体电路制造股份有限公司 半导体用治具、半导体的保护层针孔测试用的治具及方法
KR102063654B1 (ko) * 2019-03-04 2020-01-09 오세덕 웨이퍼 티칭 지그
CN111013950A (zh) * 2019-12-02 2020-04-17 西安奕斯伟硅片技术有限公司 一种硅片钝化装置及方法
KR102397940B1 (ko) * 2020-05-26 2022-05-16 (주)티에프씨랩 웨이퍼 반송 로봇 티칭 상태 확인 장치
CN113357991B (zh) * 2021-05-28 2023-06-02 艾华(无锡)半导体科技有限公司 一种晶圆载具的检测工装
KR102342264B1 (ko) * 2021-06-03 2021-12-22 정병철 반도체 웨이퍼의 티칭을 위한 측정기
KR102342270B1 (ko) * 2021-06-03 2021-12-22 정병철 측정기를 이용한 반도체 웨이퍼의 티칭을 위한 측정방법

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07169820A (ja) * 1993-12-13 1995-07-04 Kokusai Electric Co Ltd 密閉容器の覗き窓
JPH1012700A (ja) * 1996-06-19 1998-01-16 Sony Corp インデクサ調整用キャリア
KR19990006023U (ko) * 1997-07-23 1999-02-18 문정환 반도체 웨이퍼 증착장치용 보트
KR19990068968A (ko) * 1998-02-03 1999-09-06 윤종용 반도체 웨이퍼 카셋트
KR20010027008A (ko) * 1999-09-10 2001-04-06 윤종용 웨이퍼 카세트의 라벨링
JP2001264002A (ja) * 2000-03-16 2001-09-26 Nomura Kensetsu Kk 多機能折畳直角定規
JP2003297902A (ja) * 2002-03-29 2003-10-17 Disco Abrasive Syst Ltd カセットアダプタ
CN100472743C (zh) * 2002-11-21 2009-03-25 奥林巴斯株式会社 晶片检验设备
KR20070069782A (ko) * 2005-12-28 2007-07-03 엘지.필립스 엘시디 주식회사 로봇 티칭용 기구
JP2008084938A (ja) * 2006-09-26 2008-04-10 Nec Electronics Corp 基板処理装置に対する各種設定値の教示方法、教示用装置及びその校正治具
CN101728292B (zh) * 2008-10-31 2011-06-01 沈阳芯源微电子设备有限公司 晶片检测装置
CN102005403A (zh) * 2009-08-28 2011-04-06 中芯国际集成电路制造(上海)有限公司 晶片承载装置
KR101842115B1 (ko) * 2011-10-06 2018-03-26 세메스 주식회사 기판 처리 장치의 로봇 정렬을 위한 티칭 지그

Also Published As

Publication number Publication date
TWI546237B (zh) 2016-08-21
KR101467551B1 (ko) 2014-12-02
TW201607860A (zh) 2016-03-01
CN105374258B (zh) 2017-11-14
JP2016046518A (ja) 2016-04-04
CN105374258A (zh) 2016-03-02

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