JP5936882B2 - 回路接続材料、及びそれを用いた実装体の製造方法 - Google Patents
回路接続材料、及びそれを用いた実装体の製造方法 Download PDFInfo
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- JP5936882B2 JP5936882B2 JP2012046982A JP2012046982A JP5936882B2 JP 5936882 B2 JP5936882 B2 JP 5936882B2 JP 2012046982 A JP2012046982 A JP 2012046982A JP 2012046982 A JP2012046982 A JP 2012046982A JP 5936882 B2 JP5936882 B2 JP 5936882B2
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Description
1.回路接続材料及びその製造方法
2.実装体及びその製造方法
3.実施例
本発明の具体例として示す回路接続材料は、接着剤組成物に高い圧縮回復率を有する弾性体粒子と導電性粒子とを分散させて構成される。この回路接続材料は、ペースト又はフィルム形状であり、目的に応じて適宜選択することができる。
次に、上述した回路接続材料を用いた電子部品の実装方法について説明する。本実施の形態における電子部品の実装方法は、第1の電子部品の電極上に、膜形成樹脂と、重合性樹脂と、重合開始剤とを含有する接着剤組成物に圧縮回復率が50%以上である弾性体粒子と導電性粒子とが分散された異方性導電フィルム、第2の電子部品を順に配置する工程と、第2の電子部品の上面から圧着ヘッドにて押圧する工程とを有する。これにより、第1の電子部品の電極と第2の電子部品の電極とを導電性粒子を介して接続するとともに、異方性導電フィルムを硬化させることができる。
以下、本発明の実施例について説明する。ここでは、弾性体粒子として圧縮回復率が異なるポリウレタン粒子を作製した。そして、ポリウレタン粒子を含有する異方性導電フィルムのリールサンプルを作製した。また、異方性導電フィルムを用いて実装体を作製した。評価項目としてリールサンプルのブロッキング試験、及び実装体の接続抵抗の測定を行った。なお、本発明はこれらの実施例に限定されるものではない。
測定機器としてフィッシャースコープH100C(フィッシャーインスツルメント製)を用いた。室温の試料台上でポリウレタン粒子の中心方向に対し圧縮速度0.33mN/秒で荷重を50%の変位まで負荷し、5秒間保持した後、0.33mN/秒で除荷した。そして、変位負荷前のポリウレタン粒子の直径を2amm、50%変位負荷時のポリウレタン粒子の厚さをamm、除荷後30分間放置したときの厚さをbmmとし、(b−a)/a×100(%)として算出した。
リールサンプル先端に75gの重りをぶら下げ、35℃のオーブンに3時間放置し、その後異方性導電フィルムを引き出し、最後まで引き出せるか否かの試験を行った。5巻試験を行い、5巻全てが良好に最後まで引き出せた場合を○とし、1巻でも引き出し不良が発生した場合を×とした。
実装体について、デジタルマルチメータ(デジタルマルチメータ7555、横河電機社製)を用いて4端子法にて電流1mAを流したときの初期の接続抵抗を測定した。
[実施例1]
(ポリウレタン粒子の作製)
先ず、ポリウレタン粒子を作製した。イオン交換水1000gに懸濁安定剤としてトリカルシウムホスフェート30gを溶解させて分散媒とした。これに、3つの水酸基を有する分子量700のカプロラクタムトリオールを70g、及び3つのイソシアネート基を有する無黄変タイプのポリイソシアネートを100g添加し、600rpmで30分間撹拌して懸濁液を製造した。この懸濁液を3Lのフラスコに入れて70℃に昇温した後、250rpmで6時間反応させて冷却した後、遠心分離して固液分離した。これを水で十分に洗浄して乾燥し、平均粒子径5μmのポリウレタン粒子(PU−1)を得た。このポリウレタン粒子(PU−1)の圧縮回復率を測定したところ、90%であった。なお、平均粒子径は、示差走査電子顕微鏡で観察した10個のポリウレタン粒子の粒子径の平均値とした。
次に、ポリウレタン粒子を含有する異方性導電フィルムのリールサンプルを作製した。フェノキシ樹脂(品名:YP−50、東都化成社製)を固形分換算で60質量部、ラジカル重合性樹脂(品名:EB−600、ダイセル・サイテック社製)を15質量部、及び反応開始剤(品名:パーヘキサC、日本油脂社製)を2質量部として構成された接着剤組成物中に平均粒子径5μmの導電性粒子(品名:AUL704、積水化学工業社製)を平均粒子密度が10000個/mm2になるように分散させた。また、平均粒子径5μmのポリウレタン粒子(PU−1)を上記接着剤組成物に対して10wt%充填させた。この異方性導電接続材料をPETフィルム上にバーコーターを用いて塗布し、オーブンで乾燥させ、厚さ20μmの異方性導電フィルムを作製した。
異方性導電フィルムを1.5mm幅にスリットし、プラスチックリールへ100Mに巻き取ったリールサンプルを作製した。
評価用ガラス基板(IZO(Indium Zinc Oxide)250nmコーティングガラス)に1.5mm幅にスリットされた異方性導電フィルムを、150μm厚の緩衝材(ポリテトラフルオロエチレン)を用い、1.5mm幅のツールの仮圧着機にて70℃−1MPa−1secの条件で仮圧着した。次いで、評価用COF(50μmP、Cu8μmt−Snメッキ、38μmt)を同圧着機にて80℃−0.5MPa−0.5secの条件で仮固定し、最後に190℃−2MPa−10secの条件にて1.5mm幅のツールを用いた本圧着機で圧着し、実装体を作製した。
表1に、実施例1の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、1.02Ωであった。
2つのイソシアネート基を有する無黄変タイプのイソホロンジイソシアネートを100g添加した以外は、実施例1と同様にして、平均粒子径5μmのポリウレタン粒子(PU−2)を得た。このポリウレタン粒子(PU−2)の圧縮回復率を測定したところ、50%であった。
表1に、実施例2の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、1.12Ωであった。
2つの水酸基を有する分子量2000のカプロラクタムジオールを70g添加した以外は、実施例1と同様にして、平均粒子径5μmのポリウレタン粒子(PU−3)を得た。このポリウレタン粒子(PU−3)の圧縮回復率を測定したところ、40%であった。
表1に、比較例1の評価結果を示す。リールサンプルのブロッキング試験の結果は、×であった。また、接続抵抗値は、0.99Ωであった。
ポリウレタン粒子の代わりにSiフィラーを使用した。このSiフィラー(Si−1)の圧縮回復率は、フィラーが割れてしまうため測定できなかった。
表1に、比較例2の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、4.05Ωであった。
[実施例3]
イオン交換水1000gに懸濁安定剤としてトリカルシウムホスフェート70gを溶解させて分散媒とした以外は、実施例1と同様にして、平均粒子径1μmのポリウレタン粒子(PU−4)を得た。このポリウレタン粒子(PU−4)の圧縮回復率を測定したところ、88%であった。
表2に、実施例3の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、1.04Ωであった。
イオン交換水1000gに懸濁安定剤としてトリカルシウムホスフェート5gを溶解させて分散媒とした以外は、実施例1と同様にして、平均粒子径20μmのポリウレタン粒子(PU−5)を得た。このポリウレタン粒子(PU−5)の圧縮回復率を測定したところ、84%であった。
表2に、実施例4の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、1.06Ωであった。
イオン交換水1000gに懸濁安定剤としてトリカルシウムホスフェート80gを溶解させて分散媒とした以外は、実施例1と同様にして、平均粒子径0.5μmのポリウレタン粒子(PU−6)を得た。このポリウレタン粒子(PU−6)の圧縮回復率を測定したところ、86%であった。
表2に、比較例3の評価結果を示す。リールサンプルのブロッキング試験の結果は、×であった。また、接続抵抗値は、1.00Ωであった。
イオン交換水1000gに懸濁安定剤としてトリカルシウムホスフェート2gを溶解させて分散媒とした以外は、実施例1と同様にして、平均粒子径27μmのポリウレタン粒子(PU−7)を得た。このポリウレタン粒子(PU−7)の圧縮回復率を測定したところ、88%であった。
表2に、比較例3の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、2.04Ωであった。
[実施例5]
ポリウレタン粒子(PU−1)を上記接着剤組成物に対して1wt%充填させて異方性導電フィルムを作製した以外は、実施例1と同様に、リールサンプルを作製した。さらに、実施例1と同様に、異方性導電フィルムを用いて評価用ガラス基板と評価用COFとを圧着し、実装体を作製した。
表3に、実施例5の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、1.02Ωであった。
ポリウレタン粒子(PU−1)を上記接着剤組成物に対して30wt%充填させて異方性導電フィルムを作製した以外は、実施例1と同様に、リールサンプルを作製した。さらに、実施例1と同様に、異方性導電フィルムを用いて評価用ガラス基板と評価用COFとを圧着し、実装体を作製した。
表3に、実施例6の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、1.03Ωであった。
ポリウレタン粒子(PU−1)を上記接着剤組成物に対して0.5wt%充填させて異方性導電フィルムを作製した以外は、実施例1と同様に、リールサンプルを作製した。さらに、実施例1と同様に、異方性導電フィルムを用いて評価用ガラス基板と評価用COFとを圧着し、実装体を作製した。
表3に、比較例5の評価結果を示す。リールサンプルのブロッキング試験の結果は、×であった。また、接続抵抗値は、0.98Ωであった。
ポリウレタン粒子(PU−1)を上記接着剤組成物に対して35wt%充填させて異方性導電フィルムを作製した以外は、実施例1と同様に、リールサンプルを作製した。さらに、実施例1と同様に、異方性導電フィルムを用いて評価用ガラス基板と評価用COFとを圧着し、実装体を作製した。
表3に、比較例6の評価結果を示す。リールサンプルのブロッキング試験の結果は、○であった。また、接続抵抗値は、3.05Ωであった。
Claims (3)
- 接着剤組成物に圧縮回復率が50%以上である弾性体粒子と導電性粒子とがそれぞれ独立して分散され、
前記弾性体粒子の平均粒子径が、前記導電性粒子の平均粒子径の0.2倍以上5.0倍以下であり、
前記弾性体粒子の含有量が、前記接着剤組成物に対して1wt%以上30wt%以下であり、
前記圧縮回復率が、フィッシャースコープH100Cを用いて、室温の試料台上で前記弾性体粒子の中心方向に対し圧縮速度0.33mN/秒で荷重を50%の変位まで負荷し、5秒間保持した後、0.33mN/秒で除荷し、変位負荷前の弾性体粒子の直径を2amm、50%変位負荷時の弾性体粒子の厚さをamm、除荷後30分間放置したときの厚さをbmmとし、(b−a)/a×100(%)として算出される回路接続材料。 - 前記接着剤組成物は、膜形成樹脂と、ラジカル重合性樹脂と、ラジカル重合開始剤とを含有し、
前記弾性体粒子は、ポリウレタン粒子である請求項1に記載の回路接続材料。 - 第1の電子部品の電極上に、膜形成樹脂と、重合性樹脂と、重合開始剤とを含有する接
着剤組成物に圧縮回復率が50%以上である弾性体粒子と導電性粒子とがそれぞれ独立して分散された異方性導電フィルム、第2の電子部品を順に配置する工程と、
前記第2の電子部品の上面から圧着ヘッドにて押圧する工程と
を有し、
前記弾性体粒子の平均粒子径が、前記導電性粒子の平均粒子径の0.2倍以上5.0倍以下であり、
前記弾性体粒子の含有量が、前記接着剤組成物に対して1wt%以上30wt%以下であり、
前記圧縮回復率が、フィッシャースコープH100Cを用いて、室温の試料台上で前記弾性体粒子の中心方向に対し圧縮速度0.33mN/秒で荷重を50%の変位まで負荷し、5秒間保持した後、0.33mN/秒で除荷し、変位負荷前の該弾性体粒子の直径を2amm、50%変位負荷時の該弾性体粒子の厚さをamm、除荷後30分間放置したときの厚さをbmmとし、(b−a)/a×100(%)として算出される実装体の製造方法。
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CN201380012143.8A CN104145000A (zh) | 2012-03-02 | 2013-02-27 | 电路连接材料及使用其的安装体的制造方法 |
PCT/JP2013/055045 WO2013129438A1 (ja) | 2012-03-02 | 2013-02-27 | 回路接続材料、及びそれを用いた実装体の製造方法 |
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TW102107224A TWI580752B (zh) | 2012-03-02 | 2013-03-01 | A circuit-connecting material, and a method of manufacturing the same |
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