JP5909276B2 - 最初のチャージだけをドーピングすることによる、均一にドーピングされたシリコンインゴットの成長 - Google Patents
最初のチャージだけをドーピングすることによる、均一にドーピングされたシリコンインゴットの成長 Download PDFInfo
- Publication number
- JP5909276B2 JP5909276B2 JP2014509471A JP2014509471A JP5909276B2 JP 5909276 B2 JP5909276 B2 JP 5909276B2 JP 2014509471 A JP2014509471 A JP 2014509471A JP 2014509471 A JP2014509471 A JP 2014509471A JP 5909276 B2 JP5909276 B2 JP 5909276B2
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- zone
- crucible
- ingot
- melt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
- C30B15/12—Double crucible methods
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- H10P95/00—
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
- C30B15/04—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt adding doping materials, e.g. for n-p-junction
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Silicon Compounds (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161483140P | 2011-05-06 | 2011-05-06 | |
| US61/483,140 | 2011-05-06 | ||
| PCT/US2012/036497 WO2012154551A2 (en) | 2011-05-06 | 2012-05-04 | Growth of a uniformly doped silicon ingot by doping only the initial charge |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014513034A JP2014513034A (ja) | 2014-05-29 |
| JP2014513034A5 JP2014513034A5 (OSRAM) | 2015-05-21 |
| JP5909276B2 true JP5909276B2 (ja) | 2016-04-26 |
Family
ID=47089362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014509471A Active JP5909276B2 (ja) | 2011-05-06 | 2012-05-04 | 最初のチャージだけをドーピングすることによる、均一にドーピングされたシリコンインゴットの成長 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US10544517B2 (OSRAM) |
| EP (1) | EP2705178B1 (OSRAM) |
| JP (1) | JP5909276B2 (OSRAM) |
| KR (1) | KR101939594B1 (OSRAM) |
| CN (1) | CN103635613B (OSRAM) |
| MY (1) | MY169752A (OSRAM) |
| PH (1) | PH12013502255A1 (OSRAM) |
| TW (1) | TWI588303B (OSRAM) |
| WO (1) | WO2012154551A2 (OSRAM) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102013203740B4 (de) * | 2013-03-05 | 2020-06-18 | Solarworld Industries Gmbh | Vorrichtung und Vefahren zur Herstellung von Silizium-Blöcken |
| FR3010721B1 (fr) * | 2013-09-17 | 2017-02-24 | Commissariat Energie Atomique | Procede de fabrication d'un lingot de silicium presentant une concentration homogene en phosphore |
| JP6056772B2 (ja) | 2014-01-07 | 2017-01-11 | 株式会社Sumco | エピタキシャルウェーハの製造方法およびエピタキシャルウェーハ |
| KR20150106204A (ko) | 2014-03-11 | 2015-09-21 | (주)기술과가치 | 잉곳 제조 장치 |
| KR20150107540A (ko) | 2014-03-14 | 2015-09-23 | (주)기술과가치 | 잉곳 제조 장치 |
| JP6471492B2 (ja) * | 2014-12-24 | 2019-02-20 | 株式会社Sumco | 単結晶の製造方法 |
| WO2016179022A1 (en) * | 2015-05-01 | 2016-11-10 | Sunedison, Inc. | Methods for producing single crystal ingots doped with volatile dopants |
| US20180291524A1 (en) * | 2015-05-01 | 2018-10-11 | Corner Star Limited | Methods for producing single crystal ingots doped with volatile dopants |
| CN105755532A (zh) * | 2016-04-13 | 2016-07-13 | 江西赛维Ldk太阳能高科技有限公司 | 一种晶体硅的制备方法及晶体硅 |
| CN105951173A (zh) * | 2016-05-30 | 2016-09-21 | 上海超硅半导体有限公司 | N型单晶硅晶锭及其制造方法 |
| US20180087179A1 (en) * | 2016-09-28 | 2018-03-29 | Corner Star Limited | Single crystal silicon ingots having doped axial regions with different resistivity and methods for producing such ingots |
| DE112018002156B4 (de) | 2017-04-25 | 2025-01-02 | Sumco Corporation | Verfahren zur Herstellung eines Silicium-Einkristalls vom n-Typ, Silicium-Einkristall-Ingot vom n-Typ, Siliciumwafer und epitaktischer Siliciumwafer |
| JP7080017B2 (ja) | 2017-04-25 | 2022-06-03 | 株式会社Sumco | n型シリコン単結晶のインゴット、シリコンウェーハ、およびエピタキシャルシリコンウェーハ |
| CN110158148A (zh) * | 2019-04-29 | 2019-08-23 | 江苏协鑫软控设备科技发展有限公司 | 晶硅及其晶体生长工艺 |
| US11585010B2 (en) | 2019-06-28 | 2023-02-21 | Globalwafers Co., Ltd. | Methods for producing a single crystal silicon ingot using boric acid as a dopant and ingot puller apparatus that use a solid-phase dopant |
| CN116615580A (zh) * | 2020-11-11 | 2023-08-18 | 环球晶圆股份有限公司 | 具有减量坩埚腐蚀的单晶硅锭的形成方法 |
| US11742451B2 (en) * | 2020-11-24 | 2023-08-29 | Cisco Technology, Inc. | Integrate stressor with Ge photodiode using a substrate removal process |
| CN113862778A (zh) * | 2021-09-30 | 2021-12-31 | 西安奕斯伟材料科技有限公司 | 坩埚组件、拉晶炉及拉制单晶硅棒的方法 |
| KR102516630B1 (ko) * | 2021-10-18 | 2023-03-30 | 한화솔루션 주식회사 | 잉곳 성장 장치 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6379790A (ja) | 1986-09-22 | 1988-04-09 | Toshiba Corp | 結晶引上げ装置 |
| JPS6395195A (ja) * | 1986-10-08 | 1988-04-26 | Toshiba Corp | 結晶引上げ方法及び装置 |
| JP2755588B2 (ja) * | 1988-02-22 | 1998-05-20 | 株式会社東芝 | 結晶引上げ方法 |
| JPH085740B2 (ja) * | 1988-02-25 | 1996-01-24 | 株式会社東芝 | 半導体の結晶引上げ方法 |
| JPH0392774U (OSRAM) * | 1989-12-28 | 1991-09-20 | ||
| US5427056A (en) | 1990-10-17 | 1995-06-27 | Komatsu Electronic Metals Co., Ltd. | Apparatus and method for producing single crystal |
| JP3484870B2 (ja) | 1996-03-27 | 2004-01-06 | 信越半導体株式会社 | 連続チャージ法によるシリコン単結晶の製造方法およびドーパント供給装置 |
| JP2006315869A (ja) | 2005-05-10 | 2006-11-24 | Sumco Corp | 窒素ドープシリコン単結晶の製造方法 |
-
2012
- 2012-05-04 CN CN201280030859.6A patent/CN103635613B/zh active Active
- 2012-05-04 MY MYPI2013004019A patent/MY169752A/en unknown
- 2012-05-04 PH PH1/2013/502255A patent/PH12013502255A1/en unknown
- 2012-05-04 KR KR1020137032404A patent/KR101939594B1/ko active Active
- 2012-05-04 US US13/464,203 patent/US10544517B2/en active Active
- 2012-05-04 WO PCT/US2012/036497 patent/WO2012154551A2/en not_active Ceased
- 2012-05-04 EP EP12781614.8A patent/EP2705178B1/en active Active
- 2012-05-04 JP JP2014509471A patent/JP5909276B2/ja active Active
- 2012-05-07 TW TW101116159A patent/TWI588303B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2014513034A (ja) | 2014-05-29 |
| WO2012154551A3 (en) | 2013-03-21 |
| MY169752A (en) | 2019-05-15 |
| US10544517B2 (en) | 2020-01-28 |
| CN103635613B (zh) | 2017-02-15 |
| US20120279437A1 (en) | 2012-11-08 |
| EP2705178B1 (en) | 2016-07-06 |
| KR20140096993A (ko) | 2014-08-06 |
| TW201303092A (zh) | 2013-01-16 |
| TWI588303B (zh) | 2017-06-21 |
| WO2012154551A2 (en) | 2012-11-15 |
| KR101939594B1 (ko) | 2019-01-17 |
| EP2705178A4 (en) | 2015-04-15 |
| PH12013502255A1 (en) | 2014-01-13 |
| CN103635613A (zh) | 2014-03-12 |
| EP2705178A2 (en) | 2014-03-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5909276B2 (ja) | 最初のチャージだけをドーピングすることによる、均一にドーピングされたシリコンインゴットの成長 | |
| US8123855B2 (en) | Device and process for growing Ga-doped single silicon crystals suitable for making solar cells | |
| EP0170856B1 (en) | Process for growing monocrystals of semiconductor materials from shallow crucibles by czochralski technique | |
| TWI618678B (zh) | 具有均勻多重摻雜物的矽錠及其製造方法和裝置 | |
| CN102260900A (zh) | 提高单晶硅纵向电阻率一致性的装置及其处理工艺 | |
| US8840721B2 (en) | Method of manufacturing silicon single crystal | |
| US10494734B2 (en) | Method for producing silicon single crystals | |
| CN202144523U (zh) | 一种提高单晶硅纵向电阻率一致性的装置 | |
| KR102576552B1 (ko) | 연속 쵸크랄스키 방법을 사용하여 단결정 실리콘 잉곳을 성장시키기 위한 방법들 | |
| CN102168302B (zh) | 一种用于生产直拉硅单晶的双石英坩埚装置及方法 | |
| CN202099408U (zh) | 用于生产直拉硅单晶的双石英坩埚装置 | |
| JP5724226B2 (ja) | シリコン単結晶の育成方法 | |
| JP5262346B2 (ja) | シリコン単結晶の製造方法 | |
| JP7359241B2 (ja) | シリコン単結晶の製造方法 | |
| KR100967519B1 (ko) | 실리콘 리본 제조 방법 및 이를 이용하여 제조된 실리콘리본 | |
| CN112996954B (zh) | 单晶的制造方法 | |
| JPH0259494A (ja) | シリコン単結晶の製造方法及び装置 | |
| JPH0316989A (ja) | シリコン単結晶の製造装置 | |
| TW202248470A (zh) | 石英板於單晶矽錠生長期間之用途 | |
| CN116783333A (zh) | 在单晶硅锭生长期间使用缓冲剂 | |
| JP2021098622A (ja) | 単結晶シリコンインゴットの製造方法 | |
| JPH01301578A (ja) | シリコン単結晶の製造方法及び装置 | |
| KR20030044559A (ko) | 실리콘 잉곳 성장을 위한 실리콘 융액 형성방법 | |
| JP2016153352A (ja) | 結晶育成方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140410 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20150401 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150401 |
|
| A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20150624 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20150625 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20150813 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20150821 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20151119 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20160304 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20160325 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5909276 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |