JP5892109B2 - 超音波洗浄装置及び洗浄方法 - Google Patents
超音波洗浄装置及び洗浄方法 Download PDFInfo
- Publication number
- JP5892109B2 JP5892109B2 JP2013102431A JP2013102431A JP5892109B2 JP 5892109 B2 JP5892109 B2 JP 5892109B2 JP 2013102431 A JP2013102431 A JP 2013102431A JP 2013102431 A JP2013102431 A JP 2013102431A JP 5892109 B2 JP5892109 B2 JP 5892109B2
- Authority
- JP
- Japan
- Prior art keywords
- cleaning
- tank
- ultrasonic
- wafer
- cleaned
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H10P70/15—
-
- H10P72/0416—
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013102431A JP5892109B2 (ja) | 2013-05-14 | 2013-05-14 | 超音波洗浄装置及び洗浄方法 |
| KR1020157031754A KR102081378B1 (ko) | 2013-05-14 | 2014-04-09 | 초음파 세정장치 및 세정방법 |
| DE112014002047.8T DE112014002047T5 (de) | 2013-05-14 | 2014-04-09 | Ultraschallreinigungsgerät und Reinigungsverfahren |
| US14/783,356 US20160067749A1 (en) | 2013-05-14 | 2014-04-09 | Ultrasonic cleaning apparatus and method for cleaning |
| PCT/JP2014/002032 WO2014184999A1 (ja) | 2013-05-14 | 2014-04-09 | 超音波洗浄装置及び洗浄方法 |
| SG11201508731RA SG11201508731RA (en) | 2013-05-14 | 2014-04-09 | Ultrasonic cleaning apparatus and method for cleaning |
| CN201480023016.2A CN105164792B (zh) | 2013-05-14 | 2014-04-09 | 超声波清洗装置及清洗方法 |
| TW103113720A TWI555586B (zh) | 2013-05-14 | 2014-04-15 | Ultrasonic cleaning device and cleaning method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013102431A JP5892109B2 (ja) | 2013-05-14 | 2013-05-14 | 超音波洗浄装置及び洗浄方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014222738A JP2014222738A (ja) | 2014-11-27 |
| JP2014222738A5 JP2014222738A5 (enExample) | 2015-12-10 |
| JP5892109B2 true JP5892109B2 (ja) | 2016-03-23 |
Family
ID=51897993
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013102431A Active JP5892109B2 (ja) | 2013-05-14 | 2013-05-14 | 超音波洗浄装置及び洗浄方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20160067749A1 (enExample) |
| JP (1) | JP5892109B2 (enExample) |
| KR (1) | KR102081378B1 (enExample) |
| CN (1) | CN105164792B (enExample) |
| DE (1) | DE112014002047T5 (enExample) |
| SG (1) | SG11201508731RA (enExample) |
| TW (1) | TWI555586B (enExample) |
| WO (1) | WO2014184999A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9687885B2 (en) * | 2015-07-17 | 2017-06-27 | Taiwan Semiconductor Manufacturing Co., Ltd. | Multi-cycle wafer cleaning method |
| CN109631365B (zh) * | 2018-12-17 | 2020-04-17 | 沧州天瑞星光热技术有限公司 | 一种太阳能真空集热管玻璃外管的清洗方法 |
| CN110756513A (zh) * | 2019-09-19 | 2020-02-07 | 上海提牛机电设备有限公司 | 一种以声波作为动能的晶圆清洗装置 |
| JP7308182B2 (ja) * | 2020-12-21 | 2023-07-13 | 株式会社Screenホールディングス | ノズル洗浄装置および塗布装置 |
| CN112974396B (zh) * | 2021-01-22 | 2022-07-22 | 北京北方华创微电子装备有限公司 | 半导体清洗设备及晶片清洗方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6418229A (en) * | 1987-07-14 | 1989-01-23 | Oki Electric Ind Co Ltd | Super-ultrasonic cleaning device |
| JPH079900B2 (ja) * | 1990-01-29 | 1995-02-01 | 株式会社国際電気エルテック | 超音波洗浄装置 |
| JP2002093765A (ja) * | 2000-09-20 | 2002-03-29 | Kaijo Corp | 基板洗浄方法および基板洗浄装置 |
| JP4752117B2 (ja) * | 2001-02-08 | 2011-08-17 | 日本テキサス・インスツルメンツ株式会社 | 半導体ウェハ上の粒子を除去する方法 |
| JP2007044662A (ja) * | 2005-08-12 | 2007-02-22 | Kaijo Corp | 超音波洗浄装置 |
| JP4493675B2 (ja) * | 2007-03-14 | 2010-06-30 | 株式会社カイジョー | 超音波洗浄装置 |
-
2013
- 2013-05-14 JP JP2013102431A patent/JP5892109B2/ja active Active
-
2014
- 2014-04-09 US US14/783,356 patent/US20160067749A1/en not_active Abandoned
- 2014-04-09 SG SG11201508731RA patent/SG11201508731RA/en unknown
- 2014-04-09 WO PCT/JP2014/002032 patent/WO2014184999A1/ja not_active Ceased
- 2014-04-09 KR KR1020157031754A patent/KR102081378B1/ko active Active
- 2014-04-09 DE DE112014002047.8T patent/DE112014002047T5/de not_active Withdrawn
- 2014-04-09 CN CN201480023016.2A patent/CN105164792B/zh active Active
- 2014-04-15 TW TW103113720A patent/TWI555586B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| US20160067749A1 (en) | 2016-03-10 |
| WO2014184999A1 (ja) | 2014-11-20 |
| SG11201508731RA (en) | 2015-11-27 |
| TWI555586B (zh) | 2016-11-01 |
| CN105164792B (zh) | 2017-08-04 |
| CN105164792A (zh) | 2015-12-16 |
| KR20160008535A (ko) | 2016-01-22 |
| KR102081378B1 (ko) | 2020-02-25 |
| DE112014002047T5 (de) | 2016-01-14 |
| JP2014222738A (ja) | 2014-11-27 |
| TW201501824A (zh) | 2015-01-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4934079B2 (ja) | 超音波洗浄装置及び超音波洗浄方法 | |
| JP5892109B2 (ja) | 超音波洗浄装置及び洗浄方法 | |
| JP3948960B2 (ja) | 超音波洗浄装置 | |
| JP2009055024A (ja) | 基板洗浄装置及び基板洗浄方法 | |
| JP2000330262A (ja) | フォトマスクの洗浄方法、洗浄装置およびフォトマスクの洗浄液 | |
| CN101605615B (zh) | 超声波洗涤方法 | |
| KR102598146B1 (ko) | 웨이퍼 세정 장치 | |
| JP2000070885A (ja) | 基板洗浄装置及び基板洗浄方法 | |
| JP4248257B2 (ja) | 超音波洗浄装置 | |
| WO2011089673A1 (ja) | 超音波洗浄方法 | |
| KR20130142662A (ko) | 초음파 세정 장치 | |
| CN119213540A (zh) | 用于清洗衬底的设备和方法 | |
| JP6592351B2 (ja) | 基板処理装置 | |
| JP2009208005A (ja) | 超音波洗浄装置 | |
| JP2009231668A (ja) | 基板処理装置および基板処理方法 | |
| JP5353730B2 (ja) | 超音波洗浄方法と超音波洗浄装置、および超音波洗浄に用いる伝播水の製造方法 | |
| KR101079324B1 (ko) | 초음파 세정 장치 | |
| JP4767769B2 (ja) | 超音波洗浄装置 | |
| KR20200131507A (ko) | 반도체 기판의 세정 장치 및 그를 이용한 반도체 기판의 세정 방법 | |
| JP3729476B2 (ja) | 基板洗浄装置 | |
| KR20030062144A (ko) | 반도체 기판의 세정 장치 | |
| JP2000058493A (ja) | シリコンウエハの洗浄装置 | |
| KR20090041805A (ko) | 초음파 세정장치 | |
| JP2005235897A (ja) | 基板洗浄装置及び基板洗浄方法 | |
| JP2004319783A (ja) | 半導体基板洗浄装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150420 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20151021 |
|
| A871 | Explanation of circumstances concerning accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20151021 |
|
| A975 | Report on accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20151125 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20151201 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20160108 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20160126 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20160208 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5892109 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |