JP5845364B2 - 集積回路構成部品、スイッチ、およびメモリ・セル - Google Patents
集積回路構成部品、スイッチ、およびメモリ・セル Download PDFInfo
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 203
- 239000000463 material Substances 0.000 claims description 117
- 230000005684 electric field Effects 0.000 claims description 69
- 229910021389 graphene Inorganic materials 0.000 claims description 45
- 239000000758 substrate Substances 0.000 claims description 10
- 239000003989 dielectric material Substances 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 5
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 239000000203 mixture Substances 0.000 description 14
- 230000007704 transition Effects 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 230000010287 polarization Effects 0.000 description 5
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
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- 239000012782 phase change material Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 229910002056 binary alloy Inorganic materials 0.000 description 1
- 239000005380 borophosphosilicate glass Substances 0.000 description 1
- 150000004770 chalcogenides Chemical class 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
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- 229910052732 germanium Inorganic materials 0.000 description 1
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- 239000011810 insulating material Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000005360 phosphosilicate glass Substances 0.000 description 1
- 239000003870 refractory metal Substances 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
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- 239000010937 tungsten Substances 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
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- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
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- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
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Description
いくつかの実施形態では、スイッチが、1対の電極間で縦方向に延び、その1対の電極の両方に導電可能に接続したグラフェン構造を備える。第1および第2の導電性構造は、グラフェン構造の横方向に外側に位置しており、互いから見てグラフェン構造の反対側になっている。グラフェン構造と、第1および第2の導電性構造のうちの少なくとも1つとに横方向に挟まれた位置に、強誘電材料が存在する。第1および第2の導電性構造は、グラフェン構造‐強誘電材料間への電界の印加により、スイッチを「オン」状態および「オフ」状態にするように構成される。
Claims (19)
- お互いに対向する第1の電極と第2の電極との間に設けられ、前記第1の電極及び前記第2の電極のそれぞれに導電可能に接続したグラフェン構造と、
第1および第2の導電性構造であって、前記グラフェン構造をそれらの間に挟むように設けられた第1および第2の導電性構造と、
前記グラフェン構造と前記第1および第2の導電性構造の少なくとも一方との間に介在し、かつ前記第1および第2の導電性構造の前記少なくとも一方から離間して配置された強誘電材料と、
を備えるスイッチ。 - 前記第1の導電性構造が、前記第1の電極に導電可能に結合し、前記第2の導電性構造が、前記第2の電に導電可能に結合する、請求項1に記載のスイッチ。
- 前記第1の電極及び前記第2の電極は、ベース基板の一主表面に対し縦方向に配置され、前記第1の導電性構造および前記第2の導電性構造は、前記ベース基板の前記一主表面に対し横方向に配置されている、請求項1に記載のスイッチ。
- 前記グラフェン構造はベース基板の一主表面に対し縦方向に延在する、請求項1に記載のスイッチ。
- 前記強誘電材料は、誘電材料により、前記第1および第2の導電性構造の前記少なくとも一方から離間して配置されている、請求項1に記載のスイッチ。
- 前記第1および第2の導電性構造が、前記グラフェン構造と前記強誘電材料への電界の印加により、前記グラフェン構造を少なくとも2つの異なる電気抵抗値の状態のうちの一つの状態に変更可能に構成される、請求項1に記載のスイッチ。
- 前記強誘電材料が、前記グラフェン構造のグラフェンに直接触れる、請求項1に記載のスイッチ。
- 前記強誘電材料が、前記グラフェン構造のグラフェンから離間した任意の位置にある、請求項1に記載のスイッチ。
- 前記グラフェン構造と前記第1および第2の導電性構造の他方との間には、強誘電材料が配置されていない、請求項1に記載のスイッチ。
- 前記グラフェン構造と前記第1および第2の導電性構造の他方との間には、別の強誘電材料が配置されると共に、前記別の強誘電材料は、前記第1および第2の導電性構造の前記他方から離間している、請求項1に記載のスイッチ。
- 前記強誘電材料が、前記第1の電極と前記第2の電極との間で途切れなく延びる、請求項1に記載のスイッチ。
- 前記強誘電材料が、前記第1の電極と前記第2の電極との間で途切れを有する、請求項1に記載のスイッチ。
- スペースにより互いから分離した第1の電極および第2の電極と、
前記第1および第2の電極の両方に導電可能に接続し、前記スペースの端から端まで延びたグラフェン構造と、
前記第1の電極から前記スペース内に延び、前記スペースの一部分に渡り延びた第1の導電性突出部と、
前記第2の電極から前記スペース内に延び、前記スペースの一部分に渡り延びた第2の導電性突出部であって、前記グラフェン構造をそれらの間に挟むように前記第1の導電性突出部と重なる第2の導電性突出部と、
前記第1および第2の導電性突出部が重なる領域内で、前記グラフェン構造と前記第1および第2の導電性突出部の少なくとも一方とに挟まれた強誘電材料と、
を備える集積回路の構成部品。 - 前記構成部品は、
前記第1および第2の導電性突出部が、前記グラフェン構造‐前記強誘電材料間への電界の印加により、前記グラフェン構造を少なくとも2つの異なる電気抵抗値の状態のうち、一つの状態に変更可能に構成される、請求項13に記載の構成部品。 - 前記グラフェン構造は、第1の方向に延在形成されると共に、前記第1の電極及び前記第2の電極は、前記第1の方向と交差する第2の方向に延在形成されている、請求項13に記載の構成部品。
- お互いに対向する第1の電極と第2の電極との間に設けられると共に、前記第1の電極と前記第2の電極のそれぞれに導電可能に接続したグラフェン構造と、
第1および第2の導電性構造であって、前記グラフェン構造をそれらの間に挟むように設けられた第1および第2の導電性構造と、
前記グラフェン構造と前記第1および第2の導電性構造の少なくとも一方との間に介在して配置された強誘電材料と、
を備えるメモリ・セルであって、
前記第1の導電性構造が、前記第1の電極に導電可能に結合し、
前記第2の導電性構造が、前記第2の電極に導電可能に結合する、
メモリ・セル。 - 前記グラフェン構造は、第1の方向に延在形成されると共に、前記第1の電極及び前記第2の電極は、前記第1の方向と交差する第2の方向に延在形成されている、請求項16に記載のメモリ・セル。
- 前記強誘電材料は、前記第1および第2の導電性構造の前記少なくとも一方から離間して配置される、請求項16に記載のメモリ・セル。
- 前記第1および第2の導電性構造が、前記グラフェン構造と前記強誘電材料への電界の印加により、前記グラフェン構造を少なくとも2つの異なる電気抵抗値の状態のうち、一つの状態に変更可能に構成される、請求項16に記載のメモリ・セル。
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US13/400,518 US9368581B2 (en) | 2012-02-20 | 2012-02-20 | Integrated circuitry components, switches, and memory cells |
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PCT/US2013/022738 WO2013126171A1 (en) | 2012-02-20 | 2013-01-23 | Integrated circuitry components, switches, and memory cells |
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EP (2) | EP3971977A1 (ja) |
JP (1) | JP5845364B2 (ja) |
KR (1) | KR101679490B1 (ja) |
CN (1) | CN104126227B (ja) |
SG (2) | SG10201703651XA (ja) |
TW (1) | TWI512965B (ja) |
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US9368581B2 (en) | 2012-02-20 | 2016-06-14 | Micron Technology, Inc. | Integrated circuitry components, switches, and memory cells |
US9337210B2 (en) | 2013-08-12 | 2016-05-10 | Micron Technology, Inc. | Vertical ferroelectric field effect transistor constructions, constructions comprising a pair of vertical ferroelectric field effect transistors, vertical strings of ferroelectric field effect transistors, and vertical strings of laterally opposing pairs of vertical ferroelectric field effect transistors |
US9263577B2 (en) | 2014-04-24 | 2016-02-16 | Micron Technology, Inc. | Ferroelectric field effect transistors, pluralities of ferroelectric field effect transistors arrayed in row lines and column lines, and methods of forming a plurality of ferroelectric field effect transistors |
US9472560B2 (en) * | 2014-06-16 | 2016-10-18 | Micron Technology, Inc. | Memory cell and an array of memory cells |
US9159829B1 (en) | 2014-10-07 | 2015-10-13 | Micron Technology, Inc. | Recessed transistors containing ferroelectric material |
US9305929B1 (en) | 2015-02-17 | 2016-04-05 | Micron Technology, Inc. | Memory cells |
US10134982B2 (en) | 2015-07-24 | 2018-11-20 | Micron Technology, Inc. | Array of cross point memory cells |
US9853211B2 (en) | 2015-07-24 | 2017-12-26 | Micron Technology, Inc. | Array of cross point memory cells individually comprising a select device and a programmable device |
KR101924687B1 (ko) | 2016-06-30 | 2018-12-04 | 연세대학교 산학협력단 | 반도체 소자 및 이의 제조 방법 |
US9858975B1 (en) | 2016-08-24 | 2018-01-02 | Samsung Electronics Co., Ltd. | Zero transistor transverse current bi-directional bitcell |
US10396145B2 (en) | 2017-01-12 | 2019-08-27 | Micron Technology, Inc. | Memory cells comprising ferroelectric material and including current leakage paths having different total resistances |
US10790002B2 (en) | 2018-06-21 | 2020-09-29 | Samsung Electronics Co., Ltd. | Giant spin hall-based compact neuromorphic cell optimized for differential read inference |
US11908901B1 (en) * | 2019-03-14 | 2024-02-20 | Regents Of The University Of Minnesota | Graphene varactor including ferroelectric material |
US11170834B2 (en) | 2019-07-10 | 2021-11-09 | Micron Technology, Inc. | Memory cells and methods of forming a capacitor including current leakage paths having different total resistances |
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JP2015507376A (ja) | 2015-03-05 |
KR20140132723A (ko) | 2014-11-18 |
EP2817825A1 (en) | 2014-12-31 |
SG11201404679VA (en) | 2014-10-30 |
US9704879B2 (en) | 2017-07-11 |
CN104126227B (zh) | 2016-09-28 |
US20130214242A1 (en) | 2013-08-22 |
EP2817825A4 (en) | 2015-11-25 |
KR101679490B1 (ko) | 2016-11-24 |
CN104126227A (zh) | 2014-10-29 |
WO2013126171A9 (en) | 2014-12-04 |
TWI512965B (zh) | 2015-12-11 |
WO2013126171A1 (en) | 2013-08-29 |
US9368581B2 (en) | 2016-06-14 |
US20160260723A1 (en) | 2016-09-08 |
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EP2817825B1 (en) | 2021-11-10 |
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