JP5833109B2 - 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用したマイクロスコープ - Google Patents

順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用したマイクロスコープ Download PDF

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Publication number
JP5833109B2
JP5833109B2 JP2013511720A JP2013511720A JP5833109B2 JP 5833109 B2 JP5833109 B2 JP 5833109B2 JP 2013511720 A JP2013511720 A JP 2013511720A JP 2013511720 A JP2013511720 A JP 2013511720A JP 5833109 B2 JP5833109 B2 JP 5833109B2
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Japan
Prior art keywords
optical
detection system
radiation
cathodoluminescence detection
optical fiber
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JP2013511720A
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English (en)
Japanese (ja)
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JP2013534692A5 (enExample
JP2013534692A (ja
Inventor
コチアック，マシュー
ザゴネル，ルイス，フェルナンド
テンス，マーセル
マズッコ，ステファノ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite Paris Sud
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite Paris Sud
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Publication of JP2013534692A5 publication Critical patent/JP2013534692A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/023—Means for mechanically adjusting components not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical, image processing or photographic arrangements associated with the tube
    • H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
    • H01J37/228—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object whereby illumination or light collection take place in the same area of the discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02—Details
    • H01J2237/024—Moving components not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/248—Components associated with the control of the tube
    • H01J2237/2482—Optical means

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2013511720A 2010-05-27 2011-04-29 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用したマイクロスコープ Active JP5833109B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1054109 2010-05-27
FR1054109A FR2960699B1 (fr) 2010-05-27 2010-05-27 Systeme de detection de cathodoluminescence souple et microscope mettant en oeuvre un tel systeme.
PCT/FR2011/050986 WO2011148072A1 (fr) 2010-05-27 2011-04-29 Systeme de detection de cathodoluminescence souple et microscope mettant en oeuvre un tel systeme

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP2015015903A Division JP5947928B2 (ja) 2010-05-27 2015-01-29 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用したマイクロスコープ
JP2015211726A Division JP6208198B2 (ja) 2010-05-27 2015-10-28 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用した顕微鏡

Publications (3)

Publication Number Publication Date
JP2013534692A JP2013534692A (ja) 2013-09-05
JP2013534692A5 JP2013534692A5 (enExample) 2015-07-02
JP5833109B2 true JP5833109B2 (ja) 2015-12-16

Family

ID=43127317

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2013511720A Active JP5833109B2 (ja) 2010-05-27 2011-04-29 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用したマイクロスコープ
JP2015015903A Active JP5947928B2 (ja) 2010-05-27 2015-01-29 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用したマイクロスコープ
JP2015211726A Active JP6208198B2 (ja) 2010-05-27 2015-10-28 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用した顕微鏡

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2015015903A Active JP5947928B2 (ja) 2010-05-27 2015-01-29 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用したマイクロスコープ
JP2015211726A Active JP6208198B2 (ja) 2010-05-27 2015-10-28 順応性のあるカソードルミネッセンス検出システム及びそのようなシステムを採用した顕微鏡

Country Status (5)

Country Link
US (1) US10157726B2 (enExample)
EP (1) EP2577706B1 (enExample)
JP (3) JP5833109B2 (enExample)
FR (1) FR2960699B1 (enExample)
WO (1) WO2011148072A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7141874B2 (ja) * 2017-09-29 2022-09-26 株式会社堀場製作所 ルミネッセンス採光装置
CN107703060B (zh) * 2017-10-09 2020-12-15 苏州市光生环境科技有限公司 一种用于大气红外检测装置的调节支架
CN108007488B (zh) * 2017-11-29 2020-04-28 赫立科技（成都）有限公司 一种用于真空腔室内的位置调节装置
JP7194202B2 (ja) * 2018-05-30 2022-12-21 ガタン インコーポレイテッド 波長分解され角度分解されたカソードルミネッセンスのための装置および方法
US11688581B2 (en) * 2020-04-07 2023-06-27 Gatan, Inc. Apparatus for transmission electron microscopy cathodoluminescence
EP4165675A1 (en) * 2020-06-10 2023-04-19 ASML Netherlands B.V. Replaceable module for a charged particle apparatus
EP3971938A1 (en) * 2020-09-22 2022-03-23 ASML Netherlands B.V. Replaceable module for a charged particle apparatus
BR102020015402A2 (pt) * 2020-07-28 2022-02-08 Universidade Estadual De Campinas - Unicamp Sistema de detecção de luz para microscópios de varredura de sonda
US11211223B1 (en) * 2020-08-25 2021-12-28 Fei Company System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy

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Publication number Priority date Publication date Assignee Title
JPS614348U (ja) * 1984-06-15 1986-01-11 株式会社日立製作所 カソ−ドルミネツセンス装置
DE3729846A1 (de) * 1987-09-05 1989-03-23 Zeiss Carl Fa Kathodolumineszenzdetektor
US5013915A (en) * 1988-05-20 1991-05-07 Hitachi, Ltd. Transmission type electron microscope
GB8920344D0 (en) * 1989-09-08 1989-10-25 Isis Innovation Method and apparatus for imaging dislocations in materials
US5517033A (en) * 1994-07-25 1996-05-14 Gatan, Inc. Apparatus for improved image resolution in electron microscopy
US5536941A (en) * 1995-02-22 1996-07-16 Gatan, Inc. Rotatable wide angle camera and prism assembly for electron microscopes
US5724131A (en) * 1995-06-14 1998-03-03 The National University Of Singapore Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping
JPH0945271A (ja) * 1995-08-03 1997-02-14 Hitachi Ltd 撮像装置付き電子顕微鏡
JP3718300B2 (ja) * 1996-09-17 2005-11-24 株式会社トプコン 試料分析装置
US6061085A (en) * 1997-02-07 2000-05-09 Soft Imaging System Gmbh Camera system for a transmission electron microscope
JP4392990B2 (ja) * 1998-05-09 2010-01-06 レニショウ パブリック リミテッド カンパニー 電子顕微鏡および分光システム
GB0118981D0 (en) * 2001-08-03 2001-09-26 Renishaw Plc Electron microscope and spectroscopy system
US6885445B2 (en) * 1998-05-09 2005-04-26 Renishaw Plc Electron microscope and spectroscopy system
EP1145066B1 (de) * 1998-12-21 2005-03-02 Evotec OAI AG Positionierung des messvolumens in einem scanning-mikroskopischen verfahren
JP3429282B2 (ja) * 2001-02-02 2003-07-22 リサーチ・インターナショナル・インコーポレーテッド 自動化されたシステム、及びサンプルの分析方法
JP4198325B2 (ja) * 2001-03-06 2008-12-17 株式会社フォトロン 多画面分光撮影装置
GB0106342D0 (en) * 2001-03-15 2001-05-02 Renishaw Plc Spectroscopy apparatus and method
GB0123053D0 (en) * 2001-09-25 2001-11-14 Oxford Instr Analytical Ltd Electron detection device
JP3718818B2 (ja) * 2001-10-31 2005-11-24 株式会社ユニソク カソードルミネッセンス用試料ホルダ、及びカソードルミネッセンス分光分析装置
JP2003157789A (ja) * 2001-11-20 2003-05-30 Hitachi High-Technologies Corp 走査電子顕微鏡等のカソードルミネッセンス検出装置
JP3888980B2 (ja) * 2003-03-18 2007-03-07 株式会社日立ハイテクノロジーズ 物質同定システム
JP4025836B2 (ja) * 2004-10-07 2007-12-26 コニカミノルタオプト株式会社 撮像装置及び携帯通信機器
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JP4988444B2 (ja) * 2007-06-19 2012-08-01 株式会社日立製作所 検査方法および装置
US7964846B2 (en) * 2008-08-01 2011-06-21 Gatan, Inc. Retractable lens-coupled electron microscope camera with image sensor in electron microscope vacuum chamber

Also Published As

Publication number Publication date
JP2015122324A (ja) 2015-07-02
EP2577706A1 (fr) 2013-04-10
US10157726B2 (en) 2018-12-18
EP2577706B1 (fr) 2014-07-23
JP2013534692A (ja) 2013-09-05
FR2960699A1 (fr) 2011-12-02
FR2960699B1 (fr) 2013-05-10
JP2016054152A (ja) 2016-04-14
JP5947928B2 (ja) 2016-07-06
US20130087706A1 (en) 2013-04-11
JP6208198B2 (ja) 2017-10-04
WO2011148072A1 (fr) 2011-12-01

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