JP5698947B2 - 電子機器用放熱板およびその製造方法 - Google Patents
電子機器用放熱板およびその製造方法 Download PDFInfo
- Publication number
- JP5698947B2 JP5698947B2 JP2010224217A JP2010224217A JP5698947B2 JP 5698947 B2 JP5698947 B2 JP 5698947B2 JP 2010224217 A JP2010224217 A JP 2010224217A JP 2010224217 A JP2010224217 A JP 2010224217A JP 5698947 B2 JP5698947 B2 JP 5698947B2
- Authority
- JP
- Japan
- Prior art keywords
- alloy
- layer
- mass
- less
- heat sink
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- 238000000034 method Methods 0.000 title description 32
- 238000009792 diffusion process Methods 0.000 claims description 31
- 230000017525 heat dissipation Effects 0.000 claims description 31
- 229910052782 aluminium Inorganic materials 0.000 claims description 19
- 239000011159 matrix material Substances 0.000 claims description 14
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 10
- 229910052757 nitrogen Inorganic materials 0.000 claims description 10
- 229910052799 carbon Inorganic materials 0.000 claims description 9
- 239000012535 impurity Substances 0.000 claims description 9
- 229910052710 silicon Inorganic materials 0.000 claims description 8
- 229910052804 chromium Inorganic materials 0.000 claims description 5
- 229910052760 oxygen Inorganic materials 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 239000010949 copper Substances 0.000 description 157
- 239000000956 alloy Substances 0.000 description 114
- 229910045601 alloy Inorganic materials 0.000 description 89
- 239000000463 material Substances 0.000 description 63
- 238000005096 rolling process Methods 0.000 description 56
- 239000000758 substrate Substances 0.000 description 24
- 238000012360 testing method Methods 0.000 description 22
- 239000004065 semiconductor Substances 0.000 description 21
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 17
- 229910052802 copper Inorganic materials 0.000 description 16
- 238000005304 joining Methods 0.000 description 16
- 238000001816 cooling Methods 0.000 description 14
- 239000000843 powder Substances 0.000 description 14
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 12
- 238000005097 cold rolling Methods 0.000 description 10
- 239000002131 composite material Substances 0.000 description 10
- 238000002490 spark plasma sintering Methods 0.000 description 10
- 238000007747 plating Methods 0.000 description 9
- 239000000919 ceramic Substances 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 8
- 238000005219 brazing Methods 0.000 description 7
- 230000007423 decrease Effects 0.000 description 7
- 238000010438 heat treatment Methods 0.000 description 7
- 238000005476 soldering Methods 0.000 description 7
- 230000035882 stress Effects 0.000 description 7
- 229910000833 kovar Inorganic materials 0.000 description 6
- 229910017315 Mo—Cu Inorganic materials 0.000 description 5
- 239000002648 laminated material Substances 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- 238000005245 sintering Methods 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000008595 infiltration Effects 0.000 description 4
- 238000001764 infiltration Methods 0.000 description 4
- 238000003825 pressing Methods 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 238000011049 filling Methods 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000035939 shock Effects 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 238000003801 milling Methods 0.000 description 2
- 230000008646 thermal stress Effects 0.000 description 2
- 239000003832 thermite Substances 0.000 description 2
- 230000037303 wrinkles Effects 0.000 description 2
- 229910020598 Co Fe Inorganic materials 0.000 description 1
- 229910002519 Co-Fe Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000010299 mechanically pulverizing process Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 238000004663 powder metallurgy Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F3/00—Manufacture of workpieces or articles from metallic powder characterised by the manner of compacting or sintering; Apparatus specially adapted therefor ; Presses and furnaces
- B22F3/24—After-treatment of workpieces or articles
- B22F3/26—Impregnating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F7/00—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression
- B22F7/02—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers
- B22F7/04—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers with one or more layers not made from powder, e.g. made from solid metal
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/01—Layered products comprising a layer of metal all layers being exclusively metallic
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C1/00—Making non-ferrous alloys
- C22C1/04—Making non-ferrous alloys by powder metallurgy
- C22C1/0425—Copper-based alloys
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C1/00—Making non-ferrous alloys
- C22C1/04—Making non-ferrous alloys by powder metallurgy
- C22C1/045—Alloys based on refractory metals
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
- C22C27/06—Alloys based on chromium
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C30/00—Alloys containing less than 50% by weight of each constituent
- C22C30/02—Alloys containing less than 50% by weight of each constituent containing copper
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C9/00—Alloys based on copper
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/08—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/11—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of chromium or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
- C22F1/18—High-melting or refractory metals or alloys based thereon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3736—Metallic materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F7/00—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression
- B22F7/02—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers
- B22F7/04—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers with one or more layers not made from powder, e.g. made from solid metal
- B22F2007/042—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers with one or more layers not made from powder, e.g. made from solid metal characterised by the layer forming method
- B22F2007/045—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers with one or more layers not made from powder, e.g. made from solid metal characterised by the layer forming method accompanied by fusion or impregnation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Composite Materials (AREA)
- Ceramic Engineering (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Powder Metallurgy (AREA)
- Laminated Bodies (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Metal Rolling (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010224217A JP5698947B2 (ja) | 2009-10-01 | 2010-10-01 | 電子機器用放熱板およびその製造方法 |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009229270 | 2009-10-01 | ||
JP2009229270 | 2009-10-01 | ||
JP2010224217A JP5698947B2 (ja) | 2009-10-01 | 2010-10-01 | 電子機器用放熱板およびその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011129880A JP2011129880A (ja) | 2011-06-30 |
JP5698947B2 true JP5698947B2 (ja) | 2015-04-08 |
Family
ID=43825887
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010224217A Active JP5698947B2 (ja) | 2009-10-01 | 2010-10-01 | 電子機器用放熱板およびその製造方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9299636B2 (ko) |
EP (1) | EP2485257B1 (ko) |
JP (1) | JP5698947B2 (ko) |
KR (1) | KR101679104B1 (ko) |
CN (1) | CN102612745B (ko) |
WO (1) | WO2011040044A1 (ko) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012221971A (ja) * | 2011-04-04 | 2012-11-12 | Sumitomo Metal Electronics Devices Inc | 放熱板及びこれを用いる高放熱型半導体素子収納用パッケージ |
DE102014213490C5 (de) * | 2014-07-10 | 2020-06-18 | Continental Automotive Gmbh | Kühlvorrichtung, Verfahren zur Herstellung einer Kühlvorrichtung und Leistungsschaltung |
KR101691724B1 (ko) * | 2015-04-09 | 2016-12-30 | 주식회사 더굿시스템 | 고출력 소자용 방열판재 |
US9870995B2 (en) * | 2015-06-18 | 2018-01-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Formation of copper layer structure with self anneal strain improvement |
JP6233677B1 (ja) * | 2016-08-31 | 2017-11-22 | Jfe精密株式会社 | 放熱板及びその製造方法 |
WO2018047988A1 (ko) * | 2016-09-06 | 2018-03-15 | 주식회사 더굿시스템 | 고출력 소자용 방열판재 |
DE102016218522B3 (de) | 2016-09-27 | 2017-06-22 | Jenoptik Laser Gmbh | Optische oder optoelektronische Baugruppe und Verfahren zur Herstellung dafür |
JP6981846B2 (ja) * | 2017-10-26 | 2021-12-17 | Jfe精密株式会社 | 放熱板及びその製造方法 |
JP6455896B1 (ja) * | 2017-11-18 | 2019-01-23 | Jfe精密株式会社 | 放熱板及びその製造方法 |
JP6994644B2 (ja) * | 2017-12-01 | 2022-01-14 | パナソニックIpマネジメント株式会社 | 接合体と接合方法および接合材料 |
JP6462172B1 (ja) * | 2018-08-02 | 2019-01-30 | Jfe精密株式会社 | 放熱板及びその製造方法 |
JP7139862B2 (ja) | 2018-10-15 | 2022-09-21 | 株式会社デンソー | 半導体装置 |
CN112958625B (zh) * | 2021-01-28 | 2023-02-21 | 广西南南铝加工有限公司 | 一种铝合金超宽板的制备方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2860037B2 (ja) * | 1993-03-15 | 1999-02-24 | 東京タングステン株式会社 | 半導体装置用放熱基板の製造方法 |
US6271585B1 (en) * | 1997-07-08 | 2001-08-07 | Tokyo Tungsten Co., Ltd. | Heat sink substrate consisting essentially of copper and molybdenum and method of manufacturing the same |
JPH11284111A (ja) * | 1998-03-30 | 1999-10-15 | Sumitomo Special Metals Co Ltd | ヒートシンク部材及びその製造方法、並びにヒートシンク部材を用いた半導体パッケージ |
JP3267565B2 (ja) | 1998-08-27 | 2002-03-18 | 日本金属工業株式会社 | 複数材料の多層重ね熱間圧延接合により微細複合組織を有する金属板の製造方法 |
DE10010723B4 (de) | 2000-03-04 | 2005-04-07 | Metalor Technologies International Sa | Verfahren zum Herstellen eines Kontaktwerkstoff-Halbzeuges für Kontaktstücke für Vakuumschaltgeräte sowie Kontaktwerkstoff-Halbzeuge und Kontaktstücke für Vakuumschaltgeräte |
DE60113797T2 (de) | 2000-04-14 | 2006-06-08 | A.L.M.T. Corp. | Material für eine wärme-abführende platte auf der ein halbleiter montiert ist, herstellungsmethode und keramisches gehäuse,produziert unter verwendung derselben |
JP4615312B2 (ja) | 2002-10-28 | 2011-01-19 | 株式会社アライドマテリアル | 複合材料、その製造方法およびそれを用いた部材 |
JP2004249589A (ja) | 2003-02-20 | 2004-09-09 | Toshiba Corp | 銅−モリブデン複合材料およびそれを用いたヒートシンク |
JP4213134B2 (ja) | 2004-04-15 | 2009-01-21 | Jfe精密株式会社 | Cu−Cr合金及びCu−Cr合金の製造方法 |
JP4302579B2 (ja) * | 2004-06-03 | 2009-07-29 | 日鉱金属株式会社 | 高強度高導電性電子機器用銅合金 |
JP4799069B2 (ja) | 2005-07-28 | 2011-10-19 | Jfe精密株式会社 | 電子機器で用いる放熱板 |
JP2007142126A (ja) | 2005-11-18 | 2007-06-07 | Allied Material Corp | 複合材料及び半導体搭載用放熱基板、及びそれを用いたセラミックパッケージ |
CN101384739B (zh) | 2006-02-15 | 2011-01-19 | Jfe精密株式会社 | Cr-Cu合金、其制造方法、半导体用散热板和半导体用散热部件 |
JP4138844B2 (ja) | 2006-02-15 | 2008-08-27 | Jfe精密株式会社 | Cr−Cu合金およびその製造方法ならびに半導体用放熱板と半導体用放熱部品 |
JP5030633B2 (ja) | 2007-03-26 | 2012-09-19 | Jfeスチール株式会社 | Cr−Cu合金板、半導体用放熱板及び半導体用放熱部品 |
WO2009008457A1 (ja) | 2007-07-09 | 2009-01-15 | Jfe Precision Corporation | 電子部品用放熱部品、電子部品用ケース、電子部品用キャリアおよび電子部品用パッケージ |
-
2010
- 2010-10-01 US US13/499,308 patent/US9299636B2/en active Active
- 2010-10-01 JP JP2010224217A patent/JP5698947B2/ja active Active
- 2010-10-01 EP EP10820165.8A patent/EP2485257B1/en active Active
- 2010-10-01 WO PCT/JP2010/005923 patent/WO2011040044A1/ja active Application Filing
- 2010-10-01 KR KR1020127008355A patent/KR101679104B1/ko active IP Right Grant
- 2010-10-01 CN CN201080051690.3A patent/CN102612745B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
EP2485257B1 (en) | 2016-06-22 |
KR101679104B1 (ko) | 2016-11-23 |
EP2485257A1 (en) | 2012-08-08 |
CN102612745A (zh) | 2012-07-25 |
KR20120095355A (ko) | 2012-08-28 |
US9299636B2 (en) | 2016-03-29 |
EP2485257A4 (en) | 2014-03-12 |
US20120186800A1 (en) | 2012-07-26 |
CN102612745B (zh) | 2016-02-24 |
WO2011040044A1 (ja) | 2011-04-07 |
JP2011129880A (ja) | 2011-06-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5698947B2 (ja) | 電子機器用放熱板およびその製造方法 | |
KR102422607B1 (ko) | 접합체, 히트 싱크가 부착된 파워 모듈용 기판, 히트 싱크, 및 접합체의 제조 방법, 히트 싱크가 부착된 파워 모듈용 기판의 제조 방법, 히트 싱크의 제조 방법 | |
KR102324373B1 (ko) | 방열판 및 그 제조 방법 | |
WO2009139472A1 (ja) | パワーモジュール用基板、パワーモジュール、及びパワーモジュール用基板の製造方法 | |
TW201526171A (zh) | 接合體之製造方法及功率模組用基板之製造方法 | |
CN106489197B (zh) | 接合体、自带散热器的功率模块用基板、散热器、接合体的制造方法、自带散热器的功率模块用基板的制造方法及散热器的制造方法 | |
JP2011124585A (ja) | セラミックス配線基板、その製造方法及び半導体モジュール | |
TWI683403B (zh) | 附有散熱片之電源模組用基板的製造方法 | |
JP4104253B2 (ja) | 基板一体型構造体 | |
JP5030633B2 (ja) | Cr−Cu合金板、半導体用放熱板及び半導体用放熱部品 | |
JP6870767B2 (ja) | 銅/セラミックス接合体、及び、絶縁回路基板 | |
JP4138844B2 (ja) | Cr−Cu合金およびその製造方法ならびに半導体用放熱板と半導体用放熱部品 | |
TWI744474B (zh) | 陶瓷/鋁接合體、絕緣電路基板、led模組、陶瓷構件、陶瓷/鋁接合體之製造方法、絕緣電路基板之製造方法 | |
JP2011082502A (ja) | パワーモジュール用基板、ヒートシンク付パワーモジュール用基板、パワーモジュール及びパワーモジュール用基板の製造方法 | |
TW201617300A (zh) | 陶瓷/鋁接合體之製造方法、電源模組用基板之製造方法及陶瓷/鋁接合體、電源模組用基板 | |
WO2016167217A1 (ja) | 接合体、ヒートシンク付パワーモジュール用基板、ヒートシンク、及び、接合体の製造方法、ヒートシンク付パワーモジュール用基板の製造方法、ヒートシンクの製造方法 | |
TWI780113B (zh) | 陶瓷/鋁-碳化矽複合材料接合體之製造方法、及附散熱塊之功率模組用基板之製造方法 | |
JP5211314B2 (ja) | Cr−Cu合金板およびそれを用いた電子機器用放熱板と電子機器用放熱部品 | |
JP2011082350A (ja) | 電子機器用放熱基板部品 | |
WO2022224949A1 (ja) | 銅/セラミックス接合体、および、絶縁回路基板 | |
WO2023286858A1 (ja) | 銅/セラミックス接合体、絶縁回路基板、および、銅/セラミックス接合体の製造方法、絶縁回路基板の製造方法 | |
WO2022224946A1 (ja) | 銅/セラミックス接合体、および、絶縁回路基板 | |
WO2022224958A1 (ja) | 銅/セラミックス接合体、および、絶縁回路基板 | |
JP2016111328A (ja) | 放熱基板と、それを使用した半導体パッケージと半導体モジュール | |
JP2023020266A (ja) | 銅/セラミックス接合体、および、絶縁回路基板 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110421 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20110421 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20130802 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20140620 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140708 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140902 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20150203 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20150216 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5698947 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |