JP5585860B2 - 垂直ホールセンサ - Google Patents
垂直ホールセンサ Download PDFInfo
- Publication number
- JP5585860B2 JP5585860B2 JP2009268631A JP2009268631A JP5585860B2 JP 5585860 B2 JP5585860 B2 JP 5585860B2 JP 2009268631 A JP2009268631 A JP 2009268631A JP 2009268631 A JP2009268631 A JP 2009268631A JP 5585860 B2 JP5585860 B2 JP 5585860B2
- Authority
- JP
- Japan
- Prior art keywords
- contacts
- hall sensor
- vertical hall
- distance
- sensor according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 16
- 238000000034 method Methods 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims 1
- 239000012535 impurity Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 4
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000005355 Hall effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/072—Constructional adaptation of the sensor to specific applications
- G01R33/075—Hall devices configured for spinning current measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/077—Vertical Hall-effect devices
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Hall/Mr Elements (AREA)
- Measuring Magnetic Variables (AREA)
Description
参照番号(接点9.n)=[(n−1)mod4]+1 (1)、
すなわち、接点9.nは参照番号[(n−1)mod4]+1と関連づけられ、その理由は0mod4=0、1mod4=1、2mod4=2、3mod4=3、4mod4=0、5mod4=1、6mod4=2、などだからである。
最外側の接点9.1および9.n間の中央から始まって、隣接する接点9間の距離が接点ごとに増大する。増大は、異なるルールに従って生じることができ、そのうちの3つが提示される。
ルール1
ルール2
ルール3
以下が、n=6に対して得られる:中央の2個の接点9.3と9.4との間の距離は、Aである。2個の接点9.2と9.3との間の距離および2個の接点9.4と9.5との間の距離は、L*A+Kである。2個の接点9.1と9.2との間の距離および2個の接点9.5と9.6との間の距離は、L*(L*A+K)+Kである。
6 半導体チップ
7 導電性ウェル
8 導電性領域
9、9.1ないし9.n 接点
10 直線
11 垂直ホールセンサ
12 電子回路
13 電流源
14 電圧計
15 マルチプレクサ
Claims (7)
- 半導体チップ(6)内に集積化される垂直ホールセンサであって、第2の導電型の導電性領域(8)内に埋め込まれる第1の導電型の導電性ウェル(7)と、前記導電性ウェル(7)の表面上の直線(10)に沿って配置される電気接点(9)と、を備え、前記接点(9)の数nが、少なくともn=6であり、および前記接点(9)が2個の最外側の接点のうち1個(9.1)から始まる参照番号1、2、3および4によって連続的にかつ繰り返し番号をつけられるときに、同じ参照番号が割り当てられる前記接点(9)が、金属配線により互いに電気的に接続される、ことを特徴とするセンサ。
- 請求項1に記載の垂直ホールセンサであって、さらに、回転電流法に従って前記垂直ホールセンサを動作させるように構成される電子回路(12)、を備えるセンサ。
- 請求項1または2に記載の垂直ホールセンサであって、前記2個の最外側の接点(9.1、9.n)間の中央から始まって、前記接点(9)間の距離が接点ごとに増大する、ことを特徴とするセンサ。
- 請求項3に記載の垂直ホールセンサであって、前記距離が、所定の係数だけ増大する、ことを特徴とするセンサ。
- 請求項3に記載の垂直ホールセンサであって、前記距離が、一定の値だけ増大する、ことを特徴とするセンサ。
- 請求項3に記載の垂直ホールセンサであって、前記距離が、所定の係数だけ増大され、かつ一定値がそれに対して加えられる、ことを特徴とするセンサ。
- 請求項1ないし6のいずれかに記載の垂直ホールセンサであって、前記2個の最外側の接点(9.1、9.n)間の中央から始まって、前記接点の長さが接点ごとに増大する、ことを特徴とするセンサ。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH01882/08 | 2008-11-28 | ||
CH01882/08A CH699933A1 (de) | 2008-11-28 | 2008-11-28 | Vertikaler Hallsensor. |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010127940A JP2010127940A (ja) | 2010-06-10 |
JP5585860B2 true JP5585860B2 (ja) | 2014-09-10 |
Family
ID=42110200
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009268631A Active JP5585860B2 (ja) | 2008-11-28 | 2009-11-26 | 垂直ホールセンサ |
Country Status (6)
Country | Link |
---|---|
US (1) | US8164149B2 (ja) |
EP (1) | EP2192417B1 (ja) |
JP (1) | JP5585860B2 (ja) |
CN (1) | CN101750591B (ja) |
AT (1) | ATE543103T1 (ja) |
CH (1) | CH699933A1 (ja) |
Families Citing this family (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2402779A1 (en) * | 2010-07-02 | 2012-01-04 | Liaisons Electroniques-Mecaniques Lem S.A. | Hall sensor system |
DE102011002580A1 (de) * | 2011-01-12 | 2012-07-12 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Hall-Sensor und Verfahren zu dessen Herstellung |
US8829900B2 (en) | 2011-02-08 | 2014-09-09 | Infineon Technologies Ag | Low offset spinning current hall plate and method to operate it |
US8786279B2 (en) | 2011-02-25 | 2014-07-22 | Allegro Microsystems, Llc | Circuit and method for processing signals generated by a plurality of sensors |
CH704689B1 (de) | 2011-03-24 | 2016-02-29 | X Fab Semiconductor Foundries | Vertikaler Hallsensor und Verfahren zur Herstellung eines vertikalen Hallsensors. |
US8860410B2 (en) * | 2011-05-23 | 2014-10-14 | Allegro Microsystems, Llc | Circuits and methods for processing a signal generated by a plurality of measuring devices |
DE102011107711A1 (de) * | 2011-07-14 | 2013-01-17 | Micronas Gmbh | Magnetfeldsensor und Verfahren zur Bestimmung der Offsetspannung eines Magnetfeldsensors |
DE102011107767A1 (de) * | 2011-07-15 | 2013-01-17 | Micronas Gmbh | Hallsensor |
US8988072B2 (en) * | 2011-07-21 | 2015-03-24 | Infineon Technologies Ag | Vertical hall sensor with high electrical symmetry |
US9007060B2 (en) | 2011-07-21 | 2015-04-14 | Infineon Technologies Ag | Electronic device with ring-connected hall effect regions |
US8922206B2 (en) * | 2011-09-07 | 2014-12-30 | Allegro Microsystems, Llc | Magnetic field sensing element combining a circular vertical hall magnetic field sensing element with a planar hall element |
US9103868B2 (en) | 2011-09-15 | 2015-08-11 | Infineon Technologies Ag | Vertical hall sensors |
DE102012216388A1 (de) | 2011-09-16 | 2013-03-21 | Infineon Technologies Ag | Hall-sensoren mit erfassungsknoten mit signaleinprägung |
US9285438B2 (en) | 2011-09-28 | 2016-03-15 | Allegro Microsystems, Llc | Circuits and methods for processing signals generated by a plurality of magnetic field sensing elements |
DE102011115566A1 (de) | 2011-10-10 | 2013-04-11 | Austriamicrosystems Ag | Hall-Sensor |
US8922207B2 (en) * | 2011-11-17 | 2014-12-30 | Infineon Technologies Ag | Electronic device comprising hall effect region with three contacts |
US9312472B2 (en) * | 2012-02-20 | 2016-04-12 | Infineon Technologies Ag | Vertical hall device with electrical 180 degree symmetry |
US9274183B2 (en) | 2012-06-22 | 2016-03-01 | Infineon Technologies Ag | Vertical hall device comprising first and second contact interconnections |
US8981504B2 (en) | 2012-06-22 | 2015-03-17 | Infineon Technologies Ag | Vertical hall sensor with series-connected hall effect regions |
US8723515B2 (en) | 2012-07-05 | 2014-05-13 | Infineon Technologies Ag | Vertical hall sensor circuit comprising stress compensation circuit |
US9018948B2 (en) | 2012-07-26 | 2015-04-28 | Infineon Technologies Ag | Hall sensors and sensing methods |
US9170307B2 (en) | 2012-09-26 | 2015-10-27 | Infineon Technologies Ag | Hall sensors and sensing methods |
US9362485B2 (en) * | 2013-03-14 | 2016-06-07 | Robert Bosch Gmbh | Vertical hall effect sensor with offset reduction using depletion regions |
US9322840B2 (en) * | 2013-07-01 | 2016-04-26 | Infineon Technologies Ag | Resistive element |
WO2015035169A1 (en) | 2013-09-06 | 2015-03-12 | Robert Bosch Gmbh | Low offset and high sensitivity vertical hall effect sensor |
US9581620B2 (en) * | 2014-02-06 | 2017-02-28 | Stmicroelectronics S.R.L. | Integrated semiconductor device comprising a hall effect current sensor |
US9753097B2 (en) * | 2014-05-05 | 2017-09-05 | Allegro Microsystems, Llc | Magnetic field sensors and associated methods with reduced offset and improved accuracy |
US9425385B2 (en) | 2014-05-09 | 2016-08-23 | Infineon Technologies Ag | Vertical hall effect device |
US9316705B2 (en) | 2014-05-09 | 2016-04-19 | Infineon Technologies Ag | Vertical hall effect-device |
GB2531536A (en) * | 2014-10-21 | 2016-04-27 | Melexis Technologies Nv | Vertical hall sensors with reduced offset error |
CN105137023B (zh) * | 2015-10-14 | 2018-08-03 | 浙江公正检验中心有限公司 | 一种在线检测水产品的系统与方法 |
JP6865579B2 (ja) * | 2016-12-28 | 2021-04-28 | エイブリック株式会社 | 半導体装置 |
JP6824070B2 (ja) * | 2017-03-02 | 2021-02-03 | エイブリック株式会社 | 半導体装置 |
CN107436416B (zh) * | 2017-08-28 | 2020-05-19 | 上海麦歌恩微电子股份有限公司 | 能处理垂直霍尔盘信号的磁开关系统及信号处理方法 |
JP7239308B2 (ja) * | 2018-03-14 | 2023-03-14 | エイブリック株式会社 | 半導体装置及びその調整方法 |
US11802922B2 (en) | 2021-01-13 | 2023-10-31 | Allegro Microsystems, Llc | Circuit for reducing an offset component of a plurality of vertical hall elements arranged in one or more circles |
CN113419198B (zh) * | 2021-06-24 | 2024-07-05 | 深圳市海纳微传感器技术有限公司 | 一种垂直霍尔传感器结构 |
CN113759295A (zh) * | 2021-08-06 | 2021-12-07 | 苏州矩阵光电有限公司 | 集成式霍尔磁传感器及其制造方法 |
CN117279481B (zh) * | 2023-11-23 | 2024-02-09 | 深圳市晶扬电子有限公司 | 一种高性能垂直型霍尔器件 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH662905A5 (de) * | 1983-12-19 | 1987-10-30 | Landis & Gyr Ag | Integrierbares hallelement. |
CH668147A5 (de) * | 1985-05-22 | 1988-11-30 | Landis & Gyr Ag | Einrichtung mit einem hallelement in integrierter halbleitertechnologie. |
CH669068A5 (de) * | 1986-04-29 | 1989-02-15 | Landis & Gyr Ag | Integrierbares hallelement. |
JPH02291901A (ja) * | 1989-05-02 | 1990-12-03 | Nippon Telegr & Teleph Corp <Ntt> | 触覚アレイセンサ |
EP0954085A1 (de) * | 1998-04-27 | 1999-11-03 | Roulements Miniatures S.A. | Senkrechter Hallsensor und bürstenloser Elektromotor mit einem senkrechten Hallsensor |
DE10150955C1 (de) * | 2001-10-16 | 2003-06-12 | Fraunhofer Ges Forschung | Vertikaler Hall-Sensor |
DE50215023D1 (de) * | 2002-09-10 | 2011-06-01 | Melexis Tessenderlo Nv | Magnetfeldsensor mit einem hallelement |
US6903429B2 (en) * | 2003-04-15 | 2005-06-07 | Honeywell International, Inc. | Magnetic sensor integrated with CMOS |
JP4696455B2 (ja) * | 2004-03-09 | 2011-06-08 | 株式会社デンソー | ホール素子および磁気センサおよび磁気検出方法 |
JP2005333103A (ja) * | 2004-03-30 | 2005-12-02 | Denso Corp | 縦型ホール素子およびその製造方法 |
DE102005051306A1 (de) | 2004-10-28 | 2006-06-08 | Denso Corp., Kariya | Vertikale Hallvorrichtung und Verfahren zur Einstellung der Offsetspannung einer vertikalen Hallvorrichtung |
JP4924308B2 (ja) * | 2004-11-12 | 2012-04-25 | 株式会社デンソー | 縦型ホール素子 |
JP2007003237A (ja) * | 2005-06-21 | 2007-01-11 | Denso Corp | 電流センサ |
JP4784186B2 (ja) * | 2005-07-19 | 2011-10-05 | 株式会社デンソー | 縦型ホール素子およびその磁気検出感度調整方法 |
-
2008
- 2008-11-28 CH CH01882/08A patent/CH699933A1/de not_active Application Discontinuation
-
2009
- 2009-11-18 EP EP09176293A patent/EP2192417B1/de active Active
- 2009-11-18 AT AT09176293T patent/ATE543103T1/de active
- 2009-11-23 US US12/623,571 patent/US8164149B2/en active Active
- 2009-11-26 JP JP2009268631A patent/JP5585860B2/ja active Active
- 2009-11-27 CN CN200910246368.5A patent/CN101750591B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
ATE543103T1 (de) | 2012-02-15 |
EP2192417A2 (de) | 2010-06-02 |
EP2192417B1 (de) | 2012-01-25 |
JP2010127940A (ja) | 2010-06-10 |
CH699933A1 (de) | 2010-05-31 |
EP2192417A3 (de) | 2010-11-17 |
CN101750591B (zh) | 2014-07-23 |
US8164149B2 (en) | 2012-04-24 |
US20100133632A1 (en) | 2010-06-03 |
CN101750591A (zh) | 2010-06-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5585860B2 (ja) | 垂直ホールセンサ | |
US9063187B2 (en) | Hall sensor element and method for measuring a magnetic field | |
JP5430038B2 (ja) | ホールセンサ | |
US9711712B2 (en) | Vertical hall device comprising a slot in the hall effect region | |
US11205748B2 (en) | 3-contact vertical hall sensor elements connected in a ring and related devices, systems, and methods | |
JP4624787B2 (ja) | ホール素子を備える磁界センサ | |
CN105093137B (zh) | 垂直霍尔效应器件 | |
CN105607017B (zh) | 三触点霍尔效应设备的系统和布置及相关方法 | |
JP6535185B2 (ja) | 湿度センサ | |
CN106164691B (zh) | 低偏移和高灵敏度垂直霍尔效应传感器 | |
CN105633274B (zh) | 纵型霍尔元件 | |
EP3578999A1 (en) | Balance-type electric current sensor | |
CN105098060A (zh) | 垂直霍尔效应器件 | |
CN108807366A (zh) | 具有集成电流传感器的功率mos器件及其制造方法 | |
JP6695116B2 (ja) | 縦型ホール素子 | |
CN108807659A (zh) | 半导体装置 | |
CN110197871B (zh) | 具有包括互连件及迹线的金属层的霍尔效应传感器 | |
CN108124379A (zh) | 可挠性电子装置 | |
JP2018147932A (ja) | 半導体装置 | |
JP2001519090A (ja) | バイポーラトランジスタ構造 | |
CN108258111A (zh) | 半导体装置 | |
EP3734312A1 (en) | Semiconductor device | |
JP2009010254A (ja) | 半導体装置 | |
JP2021047083A (ja) | 磁気センサ | |
SE464950B (sv) | Bistabil integrerad halvledarkrets |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20100817 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20100817 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20120911 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130704 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130716 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20131015 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20131021 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20131115 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20131120 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20131209 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20140624 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140710 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5585860 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |