JP5556309B2 - 電子部品実装装置及び電子部品並びに基板 - Google Patents
電子部品実装装置及び電子部品並びに基板 Download PDFInfo
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- JP5556309B2 JP5556309B2 JP2010081311A JP2010081311A JP5556309B2 JP 5556309 B2 JP5556309 B2 JP 5556309B2 JP 2010081311 A JP2010081311 A JP 2010081311A JP 2010081311 A JP2010081311 A JP 2010081311A JP 5556309 B2 JP5556309 B2 JP 5556309B2
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- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H01L24/92—Specific sequence of method steps
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/114—Manufacturing methods by blanket deposition of the material of the bump connector
- H01L2224/1146—Plating
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16227—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/811—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector the bump connector being supplied to the parts to be connected in the bonding apparatus
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- H—ELECTRICITY
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- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8112—Aligning
- H01L2224/81136—Aligning involving guiding structures, e.g. spacers or supporting members
- H01L2224/81138—Aligning involving guiding structures, e.g. spacers or supporting members the guiding structures being at least partially left in the finished device
- H01L2224/81141—Guiding structures both on and outside the body
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8312—Aligning
- H01L2224/83136—Aligning involving guiding structures, e.g. spacers or supporting members
- H01L2224/83138—Aligning involving guiding structures, e.g. spacers or supporting members the guiding structures being at least partially left in the finished device
- H01L2224/83141—Guiding structures both on and outside the body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83193—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed on both the semiconductor or solid-state body and another item or body to be connected to the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
- H01L2224/921—Connecting a surface with connectors of different types
- H01L2224/9212—Sequential connecting processes
- H01L2224/92142—Sequential connecting processes the first connecting process involving a layer connector
- H01L2224/92143—Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a bump connector
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
Description
以下、図1から図3を参照し、本発明の一実施形態に係る電子部品実装装置及び電子部品並びに基板について説明する。
ここで、本実施形態の電子部品実装装置A及び電子部品実装装置Aの製造方法のより具体的な実施例を説明する。
ここで、弾性絶縁樹脂(第1の弾性絶縁樹脂、第2の弾性絶縁樹脂)とは、第1の絶縁樹脂層8や第2の絶縁樹脂層11の他の部分を形成する絶縁樹脂よりも高弾性の絶縁樹脂であることを意味する。
そして、このように第1の弾性絶縁樹脂及び第2の弾性絶縁樹脂を用いて第1の突部9や第2の突部12を形成すると、さらに、第1の弾性絶縁樹脂及び第2の弾性絶縁樹脂を用いて第1の突部9や第2の突部12を多段構造で形成すると、第1の弾性絶縁樹脂及び第2の弾性絶縁樹脂の持つ弾性作用によって隙間量を低減させることが可能になる。また、第1の突部9や第2の突部12(嵌合溝13)の形成精度を粗くしても、要求される実装高さを実現することが可能になる。
2 LGA部品(電子部品)
3 第2の平面電極端子(電極パッド)
4 基板
5 ハンダ
6 ハンダ接続部(ハンダ実装部)
7 パッケージ部(パッケージ層)
8 第1の絶縁樹脂層
9 第1の突部(他方の突部)
9a 先端側(第1の弾性絶縁樹脂)
10 配線層
11 第2の絶縁樹脂層
12 第2の突部(一方の突部)
12a 先端側(第2の弾性絶縁樹脂)
13 嵌合溝
15 非導電性接着材料
16 金属めっき
A 電子部品実装装置
H 空間
Claims (8)
- 下面に露出した第1の平面電極端子を備える電子部品と、上面に露出した第2の平面電極端子を備え、前記電子部品が搭載される基板と、前記第1の平面電極端子と前記第2の平面電極端子を電気的に接続するハンダ接続部とを備えており、
前記電子部品は、パッケージ部の下面に第1の絶縁樹脂層を一体に積層して形成されるとともに、前記第1の絶縁樹脂層が、下面から下方に突出し、下面に露出した前記第1の平面電極端子を囲繞するように配設された第1の突部を備えて形成され、
前記基板は、配線層の上面に第2の絶縁樹脂層を一体に積層して形成されるとともに、前記第2の絶縁樹脂層が、上面から上方に突出し、上面に露出した前記第2の平面電極端子を囲繞するように配設された第2の突部を備えて形成され、
前記第1の突部と前記第2の突部を嵌合させ、前記第1の絶縁樹脂層の前記第1突部及び/又は前記第2の絶縁樹脂層の前記第2の突部と、前記第1の絶縁樹脂層と前記第2の絶縁樹脂層の他の部分とで囲まれた空間内に前記第1の平面電極端子と前記第2の平面電極端子と前記ハンダ接続部を内包して、前記基板に前記電子部品が搭載されていることを特徴とする電子部品実装装置。 - 請求項1記載の電子部品実装装置において、
前記第1の突部と前記第2の突部のいずれか一方の突部が、突出方向先端から基端に向けて凹む嵌合溝を備えて形成され、該嵌合溝に他方の突部を嵌合させて、前記基板に前記電子部品が搭載されていることを特徴とする電子部品実装装置。 - 請求項2記載の電子部品実装装置において、
前記他方の突部が、突出方向基端から先端に向かうに従い漸次その幅が小となるテーパー状に形成されるとともに、該他方の突部が嵌合する前記一方の突部の嵌合溝が先端から基端に向かうに従い漸次その幅が小となるテーパー状に形成されていることを特徴とする電子部品実装装置。 - 請求項1から請求項3のいずれかに記載の電子部品実装装置において、
前記第1の絶縁樹脂層と前記第2の絶縁樹脂層の互いの接続面が非導電性接着材料を用いて接着されていることを特徴とする電子部品実装装置。 - 請求項1から請求項4のいずれかに記載の電子部品実装装置において、
前記第1の突部と前記第2の突部が嵌合して前記基板に前記電子部品を搭載するとともに形成されて前記第1の平面電極端子と前記第2の平面電極端子と前記ハンダ接続部を内包する空間の内面部分に、金属めっきが施されていることを特徴とする電子部品実装装置。 - 請求項1から請求項5のいずれかに記載の電子部品実装装置において、
前記第1の突部及び/又は前記第2の突部の突出方向基端側に対して先端側の幅が小さくなるように、前記第1の突部及び/又は前記第2の突部が多段構造で形成されるとともに、少なくとも前記第1の突部及び/又は前記第2の突部の先端側が、前記第1の絶縁樹脂層と前記第2の絶縁樹脂層の他の部分を形成する絶縁樹脂よりも高弾性の弾性絶縁樹脂を用いて形成されていることを特徴とする電子部品実装装置。 - 請求項1から請求項6のいずれかに記載の電子部品実装装置が具備する電子部品であることを特徴とする電子部品。
- 請求項1から請求項6のいずれかに記載の電子部品実装装置が具備する基板であることを特徴とする基板。
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JP2002246512A (ja) * | 2001-02-16 | 2002-08-30 | Nec Corp | Bgaパッケージの構造及び実装基板の構造 |
JP2003273160A (ja) * | 2002-03-15 | 2003-09-26 | Matsushita Electric Ind Co Ltd | 半導体実装モジュール |
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