JP5507258B2 - 光周波数領域イメージングにおける測定深度を制御するための装置及び方法 - Google Patents

光周波数領域イメージングにおける測定深度を制御するための装置及び方法 Download PDF

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JP5507258B2
JP5507258B2 JP2009546534A JP2009546534A JP5507258B2 JP 5507258 B2 JP5507258 B2 JP 5507258B2 JP 2009546534 A JP2009546534 A JP 2009546534A JP 2009546534 A JP2009546534 A JP 2009546534A JP 5507258 B2 JP5507258 B2 JP 5507258B2
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electromagnetic radiation
frequency
depth
sample
radiation
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JP2010517017A (ja
JP2010517017A5 (cg-RX-API-DMAC7.html
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バウマ，ブレット，ユージン
ネザム，レザ，モタグヒアン
ティアニー，ギレルモ，ジェイ．
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ザ ジェネラル ホスピタル コーポレイション
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G01B9/02028—Two or more reference or object arms in one interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Endoscopes (AREA)
JP2009546534A 2007-01-19 2008-01-18 光周波数領域イメージングにおける測定深度を制御するための装置及び方法 Expired - Fee Related JP5507258B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US88565207P 2007-01-19 2007-01-19
US60/885,652 2007-01-19
PCT/US2008/051432 WO2008089406A2 (en) 2007-01-19 2008-01-18 Apparatus and method for simultaneous inspection at different depths based on the principle of frequency domain optical coherence tomography

Publications (3)

Publication Number Publication Date
JP2010517017A JP2010517017A (ja) 2010-05-20
JP2010517017A5 JP2010517017A5 (cg-RX-API-DMAC7.html) 2011-03-03
JP5507258B2 true JP5507258B2 (ja) 2014-05-28

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US (1) US7911621B2 (cg-RX-API-DMAC7.html)
EP (1) EP2102583A2 (cg-RX-API-DMAC7.html)
JP (1) JP5507258B2 (cg-RX-API-DMAC7.html)
WO (1) WO2008089406A2 (cg-RX-API-DMAC7.html)

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