JP2010517017A5 - - Google Patents

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JP2010517017A5
JP2010517017A5 JP2009546534A JP2009546534A JP2010517017A5 JP 2010517017 A5 JP2010517017 A5 JP 2010517017A5 JP 2009546534 A JP2009546534 A JP 2009546534A JP 2009546534 A JP2009546534 A JP 2009546534A JP 2010517017 A5 JP2010517017 A5 JP 2010517017A5
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electromagnetic radiation
reference path
frequency
radiation
interference
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JP2009546534A
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JP2010517017A (ja
JP5507258B2 (ja
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Priority claimed from PCT/US2008/051432 external-priority patent/WO2008089406A2/en
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JP2009546534A 2007-01-19 2008-01-18 光周波数領域イメージングにおける測定深度を制御するための装置及び方法 Expired - Fee Related JP5507258B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US88565207P 2007-01-19 2007-01-19
US60/885,652 2007-01-19
PCT/US2008/051432 WO2008089406A2 (en) 2007-01-19 2008-01-18 Apparatus and method for simultaneous inspection at different depths based on the principle of frequency domain optical coherence tomography

Publications (3)

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JP2010517017A JP2010517017A (ja) 2010-05-20
JP2010517017A5 true JP2010517017A5 (cg-RX-API-DMAC7.html) 2011-03-03
JP5507258B2 JP5507258B2 (ja) 2014-05-28

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JP2009546534A Expired - Fee Related JP5507258B2 (ja) 2007-01-19 2008-01-18 光周波数領域イメージングにおける測定深度を制御するための装置及び方法

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US (1) US7911621B2 (cg-RX-API-DMAC7.html)
EP (1) EP2102583A2 (cg-RX-API-DMAC7.html)
JP (1) JP5507258B2 (cg-RX-API-DMAC7.html)
WO (1) WO2008089406A2 (cg-RX-API-DMAC7.html)

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