JP5451150B2 - Ｘ線用線源格子、ｘ線位相コントラスト像の撮像装置 - Google Patents

Ｘ線用線源格子、ｘ線位相コントラスト像の撮像装置 Download PDF

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Publication number
JP5451150B2
JP5451150B2 JP2009094998A JP2009094998A JP5451150B2 JP 5451150 B2 JP5451150 B2 JP 5451150B2 JP 2009094998 A JP2009094998 A JP 2009094998A JP 2009094998 A JP2009094998 A JP 2009094998A JP 5451150 B2 JP5451150 B2 JP 5451150B2
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ray
grating
partial
phase
ray source
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Japanese (ja)
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JP2009276342A (ja
JP2009276342A5 (cg-RX-API-DMAC7.html
Inventor
英之助 伊藤
好克 市村
高士 中村
彩 今田
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2009094998A 2008-04-15 2009-04-09 Ｘ線用線源格子、ｘ線位相コントラスト像の撮像装置 Expired - Fee Related JP5451150B2 (ja)

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JP2009094998A JP5451150B2 (ja) 2008-04-15 2009-04-09 Ｘ線用線源格子、ｘ線位相コントラスト像の撮像装置

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JP2008105355 2008-04-15
JP2008105355 2008-04-15
JP2009094998A JP5451150B2 (ja) 2008-04-15 2009-04-09 Ｘ線用線源格子、ｘ線位相コントラスト像の撮像装置

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JP2009276342A JP2009276342A (ja) 2009-11-26
JP2009276342A5 JP2009276342A5 (cg-RX-API-DMAC7.html) 2012-06-07
JP5451150B2 true JP5451150B2 (ja) 2014-03-26

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US (1) US8243879B2 (cg-RX-API-DMAC7.html)
EP (1) EP2248135A1 (cg-RX-API-DMAC7.html)
JP (1) JP5451150B2 (cg-RX-API-DMAC7.html)
CN (1) CN102047344B (cg-RX-API-DMAC7.html)
WO (1) WO2009128550A1 (cg-RX-API-DMAC7.html)

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Also Published As

Publication number Publication date
CN102047344B (zh) 2013-11-06
CN102047344A (zh) 2011-05-04
WO2009128550A9 (en) 2011-01-27
EP2248135A1 (en) 2010-11-10
US8243879B2 (en) 2012-08-14
WO2009128550A1 (en) 2009-10-22
US20100246764A1 (en) 2010-09-30
JP2009276342A (ja) 2009-11-26

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