JP5371315B2 - 光干渉断層撮像方法および光干渉断層撮像装置 - Google Patents

光干渉断層撮像方法および光干渉断層撮像装置 Download PDF

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JP5371315B2
JP5371315B2 JP2008196619A JP2008196619A JP5371315B2 JP 5371315 B2 JP5371315 B2 JP 5371315B2 JP 2008196619 A JP2008196619 A JP 2008196619A JP 2008196619 A JP2008196619 A JP 2008196619A JP 5371315 B2 JP5371315 B2 JP 5371315B2
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spectrum
wavelength spectrum
elements
optical coherence
wavelength
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JP2008196619A
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JP2010032426A (ja
JP2010032426A5 (https=
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信人 末平
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Canon Inc
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Canon Inc
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Priority to JP2008196619A priority Critical patent/JP5371315B2/ja
Priority to US12/500,254 priority patent/US8233152B2/en
Priority to EP20090165421 priority patent/EP2149776B1/en
Priority to CN 200910160202 priority patent/CN101639339B/zh
Publication of JP2010032426A publication Critical patent/JP2010032426A/ja
Publication of JP2010032426A5 publication Critical patent/JP2010032426A5/ja
Priority to US13/526,865 priority patent/US8836952B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2008196619A 2008-07-30 2008-07-30 光干渉断層撮像方法および光干渉断層撮像装置 Expired - Fee Related JP5371315B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2008196619A JP5371315B2 (ja) 2008-07-30 2008-07-30 光干渉断層撮像方法および光干渉断層撮像装置
US12/500,254 US8233152B2 (en) 2008-07-30 2009-07-09 Optical coherence tomographic imaging method and optical coherence tomographic imaging apparatus
EP20090165421 EP2149776B1 (en) 2008-07-30 2009-07-14 Optical coherence tomographic imaging method and optical coherence tomographic imaging apparatus
CN 200910160202 CN101639339B (zh) 2008-07-30 2009-07-30 光学相干断层成像方法和光学相干断层成像装置
US13/526,865 US8836952B2 (en) 2008-07-30 2012-06-19 Optical coherence tomographic imaging method and optical coherence tomographic imaging apparatus

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JP2008196619A JP5371315B2 (ja) 2008-07-30 2008-07-30 光干渉断層撮像方法および光干渉断層撮像装置

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JP2010032426A JP2010032426A (ja) 2010-02-12
JP2010032426A5 JP2010032426A5 (https=) 2011-07-21
JP5371315B2 true JP5371315B2 (ja) 2013-12-18

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US (2) US8233152B2 (https=)
EP (1) EP2149776B1 (https=)
JP (1) JP5371315B2 (https=)
CN (1) CN101639339B (https=)

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Publication number Publication date
US20120257165A1 (en) 2012-10-11
US8836952B2 (en) 2014-09-16
CN101639339B (zh) 2011-09-07
JP2010032426A (ja) 2010-02-12
US8233152B2 (en) 2012-07-31
US20100027019A1 (en) 2010-02-04
EP2149776A1 (en) 2010-02-03
EP2149776B1 (en) 2012-12-19
CN101639339A (zh) 2010-02-03

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