JP5363559B2 - Ｘ線検査装置及びｘ線検査方法 - Google Patents

Ｘ線検査装置及びｘ線検査方法 Download PDF

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JP5363559B2
JP5363559B2 JP2011503839A JP2011503839A JP5363559B2 JP 5363559 B2 JP5363559 B2 JP 5363559B2 JP 2011503839 A JP2011503839 A JP 2011503839A JP 2011503839 A JP2011503839 A JP 2011503839A JP 5363559 B2 JP5363559 B2 JP 5363559B2
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inspection
ray
inspected
imaging
rotation
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JPWO2010104107A1 (ja
Inventor
香 太田
勝作 中田
松田　　淳
健 岡村
公太 鈴木
快治 藤井
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CHUBU MEDICAL CO.,LTD.
Pony Industry Co Ltd
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CHUBU MEDICAL CO.,LTD.
Pony Industry Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
JP2011503839A 2009-03-13 2010-03-10 Ｘ線検査装置及びｘ線検査方法 Active JP5363559B2 (ja)

Priority Applications (1)

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JP2011503839A JP5363559B2 (ja) 2009-03-13 2010-03-10 Ｘ線検査装置及びｘ線検査方法

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2009062113 2009-03-13
JP2009062113 2009-03-13
JP2011503839A JP5363559B2 (ja) 2009-03-13 2010-03-10 Ｘ線検査装置及びｘ線検査方法
PCT/JP2010/053985 WO2010104107A1 (ja) 2009-03-13 2010-03-10 Ｘ線検査装置及びｘ線検査方法

Publications (2)

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JPWO2010104107A1 JPWO2010104107A1 (ja) 2012-09-13
JP5363559B2 true JP5363559B2 (ja) 2013-12-11

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JP (1) JP5363559B2 (ko)
KR (1) KR101278920B1 (ko)
CN (1) CN102348970B (ko)
WO (1) WO2010104107A1 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2012382556B2 (en) * 2012-06-13 2017-04-13 Wilco Ag X-ray detection of flaws in containers and/or in their contents
JP2014055835A (ja) * 2012-09-12 2014-03-27 Shibuya Kogyo Co Ltd 物品分類装置
CN105829882B (zh) * 2013-10-02 2019-06-21 雅马哈精密科技株式会社 密封包装制品的检查装置和检查方法
DE102014006835A1 (de) * 2014-05-13 2015-11-19 Kocher-Plastik Maschinenbau Gmbh Prüfvorrichtung zum Überprüfen von Behältererzeugnissen
JP6266574B2 (ja) * 2015-09-10 2018-01-24 株式会社日立ハイテクサイエンス Ｘ線検査方法及びｘ線検査装置
CN106353345B (zh) * 2016-08-12 2019-03-05 上海蓝十字脑科医院有限公司 放射科用放射反应观察装置
JP7382773B2 (ja) * 2019-09-24 2023-11-17 東芝Ｉｔコントロールシステム株式会社 放射線検査装置
JP7401232B2 (ja) * 2019-09-25 2023-12-19 東芝Ｉｔコントロールシステム株式会社 非破壊検査装置

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JP2000329704A (ja) * 1999-05-20 2000-11-30 Sukiyan Technol:Kk 沈殿異物検出方法
JP2002214153A (ja) * 2001-01-19 2002-07-31 Hitachi Eng Co Ltd 液体充填容器内の異物検査装置及びその方法
JP2003114278A (ja) * 2001-10-05 2003-04-18 Hamamatsu Photonics Kk Ｘ線像増強装置及びｘ線透過像撮像システム
JP2003247961A (ja) * 2002-02-25 2003-09-05 Shunichi Inoue 高分子構造体およびそのｘ線検査方法
JP2004020297A (ja) * 2002-06-14 2004-01-22 Chubu Medical:Kk Ｘ線異物検査装置
JP2004317184A (ja) * 2003-04-14 2004-11-11 Shimadzu Corp Ｘ線異物検査装置
JP2005099033A (ja) * 2004-10-29 2005-04-14 Shimadzu Corp Ｘ線異物検査装置およびｘ線異物検査装置のための判定用パラメータ設定装置
JP2007149601A (ja) * 2005-11-30 2007-06-14 Hitachi Medical Corp Ｘ線管及びそれを用いたｘ線検査装置

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Publication number Priority date Publication date Assignee Title
JPS4951974A (ko) * 1972-09-16 1974-05-20
JP2806415B2 (ja) * 1993-09-22 1998-09-30 澁谷工業株式会社 異物検査装置
IT1285008B1 (it) * 1996-03-15 1998-06-03 Dylog Italia S R L Macchina di ispezione non distruttiva a raggi x per l'industria alimentare
JP2000090958A (ja) * 1998-09-14 2000-03-31 Fuji Photo Film Co Ltd 電池の検査装置及び検査方法
JP2000214104A (ja) * 1999-01-26 2000-08-04 Precision:Kk ガラス壜口部の欠陥検査装置
JP3446651B2 (ja) * 1999-03-16 2003-09-16 株式会社島津製作所 ゆで卵検査装置
JP4516201B2 (ja) 2000-11-01 2010-08-04 リッカーマン（日本）株式会社 連続検査装置
JP3715524B2 (ja) 2000-11-30 2005-11-09 アンリツ産機システム株式会社 Ｘ線異物検出装置
JP3785342B2 (ja) * 2001-09-28 2006-06-14 日立エンジニアリング株式会社 被検体検査装置及び透明容器の充填液体中の異物検査装置
JP2004177299A (ja) * 2002-11-28 2004-06-24 Hitachi Medical Corp Ｘ線異物検査装置
JP2005270201A (ja) 2004-03-23 2005-10-06 Fuji Photo Film Co Ltd Ｘ線撮影装置
JP2007071895A (ja) * 2006-12-21 2007-03-22 Sukiyan Technol:Kk 異物検査装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000329704A (ja) * 1999-05-20 2000-11-30 Sukiyan Technol:Kk 沈殿異物検出方法
JP2002214153A (ja) * 2001-01-19 2002-07-31 Hitachi Eng Co Ltd 液体充填容器内の異物検査装置及びその方法
JP2003114278A (ja) * 2001-10-05 2003-04-18 Hamamatsu Photonics Kk Ｘ線像増強装置及びｘ線透過像撮像システム
JP2003247961A (ja) * 2002-02-25 2003-09-05 Shunichi Inoue 高分子構造体およびそのｘ線検査方法
JP2004020297A (ja) * 2002-06-14 2004-01-22 Chubu Medical:Kk Ｘ線異物検査装置
JP2004317184A (ja) * 2003-04-14 2004-11-11 Shimadzu Corp Ｘ線異物検査装置
JP2005099033A (ja) * 2004-10-29 2005-04-14 Shimadzu Corp Ｘ線異物検査装置およびｘ線異物検査装置のための判定用パラメータ設定装置
JP2007149601A (ja) * 2005-11-30 2007-06-14 Hitachi Medical Corp Ｘ線管及びそれを用いたｘ線検査装置

Also Published As

Publication number Publication date
KR20110111525A (ko) 2011-10-11
JPWO2010104107A1 (ja) 2012-09-13
CN102348970A (zh) 2012-02-08
WO2010104107A1 (ja) 2010-09-16
CN102348970B (zh) 2014-05-07
KR101278920B1 (ko) 2013-06-26

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