JP5301996B2 - 受動コンポーネントを集積したパワー半導体デバイス - Google Patents
受動コンポーネントを集積したパワー半導体デバイス Download PDFInfo
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- JP5301996B2 JP5301996B2 JP2008532447A JP2008532447A JP5301996B2 JP 5301996 B2 JP5301996 B2 JP 5301996B2 JP 2008532447 A JP2008532447 A JP 2008532447A JP 2008532447 A JP2008532447 A JP 2008532447A JP 5301996 B2 JP5301996 B2 JP 5301996B2
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- power
- conductive plate
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- 239000004065 semiconductor Substances 0.000 title claims description 36
- 239000003990 capacitor Substances 0.000 claims description 28
- 125000006850 spacer group Chemical group 0.000 claims description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 11
- 229910052802 copper Inorganic materials 0.000 description 11
- 239000010949 copper Substances 0.000 description 11
- 238000000034 method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66674—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/66712—Vertical DMOS transistors, i.e. VDMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0629—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with diodes, or resistors, or capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
- H01L29/7803—Vertical DMOS transistors, i.e. VDMOS transistors structurally associated with at least one other device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
- Thin Film Transistor (AREA)
Description
10':キャパシタ
12:プレドライバ回路
12':パワー回路
14;パワーMOSFET
14':パワーMOSFET
16:パワーMOSFET
18:ソース電極
19:ゲート電極
20:ドレイン電極
22:誘電スペーサ
24:キャパシタ
26:第1導電プレート
28:ビア
30:誘電体
32:導電プレート
40:パワーMOSFET
42:ソース電極
44:キャパシタ
46:第1導電プレート
48:誘電体
50:第2導電プレート
Claims (8)
- 1つの表面上に第1パワー電極を有するディスクリートパワー半導体スイッチと、
パワー電極の代わりに、もう1つの表面上にキャパシタと
を備え、
このキャパシタは、
前記パワー半導体スイッチの半導体に機械的及び電気的に直接接続された第1導電プレートと、
前記パワー半導体スイッチに電気的に接続されていない第2導電プレートと
を有し、
前記第1パワー電極と前記第2導電プレートとが、外部端子として使用できる、パワー半導体デバイス。 - ディスクリートパワー半導体スイッチと、
このパワー半導体スイッチの大部分に、機械的に接続され、第1導電プレートと、前記第1導電プレートに平行な第2導電プレートと、前記第1導電プレートと前記第2導電プレートの間に配置された誘電体とを有し、前記パワー半導体スイッチは、第1パワー電極及び第2パワー電極を有し、前記第1導電プレートは、前記第1パワー電極に電気接続され、前記第2導電プレートは、前記パワー半導体スイッチに電気的に接続されていないキャパシタとを備え、
前記第2パワー電極と前記第2導電プレートとが、外部端子として使用できる、パワー半導体デバイス。 - さらに、前記第1パワー電極と前記第1導電プレートの間に配置され、前記第1導電プレートを、前記第1パワー電極に機械的に接続する役割をする誘電スペーサを備える、請求項2記載のパワー半導体デバイス。
- 前記第1導電プレーは、前記誘電スペーサの中の導電性ビアを介して、前記第1パワー電極に電気接続されている、請求項3記載のパワー半導体デバイス。
- 前記第1導電プレートは、前記誘電スペーサの中の複数の導電性ビアを介して、前記第1パワー電極に電気接続されている、請求項3記載のパワー半導体デバイス。
- 前記第1パワー電極は、パワーMOSFETのソース電極、若しくはドレイン電極である、請求項2記載のパワー半導体デバイス。
- 前記第1導電プレートは、パワーMOSFETのドレイン領域に、機械的及び電気的に直接接続されている、請求項1記載のパワー半導体デバイス。
- 前記ディスクリートパワー半導体デバイスは、ドライバ回路、プレドライバ回路、若しくはパワー回路のうちの1つのアプリケーション用に組み込まれている、請求項1記載のパワー半導体デバイス。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US71939005P | 2005-09-22 | 2005-09-22 | |
US60/719,390 | 2005-09-22 | ||
US11/524,694 US7348656B2 (en) | 2005-09-22 | 2006-09-21 | Power semiconductor device with integrated passive component |
US11/524,694 | 2006-09-21 | ||
PCT/US2006/037105 WO2007038343A2 (en) | 2005-09-22 | 2006-09-22 | Power semiconductor device with integrated passive component |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009510725A JP2009510725A (ja) | 2009-03-12 |
JP5301996B2 true JP5301996B2 (ja) | 2013-09-25 |
Family
ID=37883195
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008532447A Active JP5301996B2 (ja) | 2005-09-22 | 2006-09-22 | 受動コンポーネントを集積したパワー半導体デバイス |
Country Status (5)
Country | Link |
---|---|
US (1) | US7348656B2 (ja) |
JP (1) | JP5301996B2 (ja) |
DE (1) | DE112006002489B4 (ja) |
TW (1) | TWI315102B (ja) |
WO (1) | WO2007038343A2 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006034679A1 (de) | 2006-07-24 | 2008-01-31 | Infineon Technologies Ag | Halbleitermodul mit Leistungshalbleiterchip und passiven Bauelement sowie Verfahren zur Herstellung desselben |
US7675365B2 (en) * | 2007-01-10 | 2010-03-09 | Samsung Electro-Mechanics | Systems and methods for power amplifiers with voltage boosting multi-primary transformers |
US7576607B2 (en) * | 2008-01-03 | 2009-08-18 | Samsung Electro-Mechanics | Multi-segment primary and multi-turn secondary transformer for power amplifier systems |
US8044759B2 (en) * | 2008-01-08 | 2011-10-25 | Samsung Electro-Mechanics | Overlapping compact multiple transformers |
US7812701B2 (en) | 2008-01-08 | 2010-10-12 | Samsung Electro-Mechanics | Compact multiple transformers |
US7746174B2 (en) * | 2008-06-12 | 2010-06-29 | Samsung Electro-Mechanics Company, Ltd. | Systems and methods for power amplifier with integrated passive device |
US8125276B2 (en) * | 2010-03-12 | 2012-02-28 | Samsung Electro-Mechanics | Sharing of inductor interstage matching in parallel amplification system for wireless communication systems |
JP6783708B2 (ja) * | 2017-06-15 | 2020-11-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61168253A (ja) * | 1985-01-19 | 1986-07-29 | Sharp Corp | 高耐圧mos電界効果半導体装置 |
JP3139783B2 (ja) * | 1991-08-22 | 2001-03-05 | 株式会社東芝 | 半導体集積回路装置 |
JPH07326743A (ja) * | 1994-05-31 | 1995-12-12 | Fuji Electric Co Ltd | プレーナ型半導体素子 |
KR0175277B1 (ko) * | 1996-02-29 | 1999-02-01 | 김광호 | 중첩된 필드플레이트구조를 갖는 전력반도체장치 및 그의 제조방법 |
CA2306384A1 (en) * | 1997-10-14 | 1999-04-22 | Patterning Technologies Limited | Method of forming an electronic device |
JP3767296B2 (ja) * | 2000-01-17 | 2006-04-19 | 富士電機デバイステクノロジー株式会社 | 電力変換装置 |
JP2002134746A (ja) * | 2000-10-30 | 2002-05-10 | Toshiba Corp | 半導体装置及びその製造方法 |
TWI304234B (en) * | 2005-03-04 | 2008-12-11 | Int Rectifier Corp | Semiconductor package fabrication |
-
2006
- 2006-09-21 US US11/524,694 patent/US7348656B2/en active Active
- 2006-09-22 DE DE112006002489T patent/DE112006002489B4/de not_active Expired - Fee Related
- 2006-09-22 JP JP2008532447A patent/JP5301996B2/ja active Active
- 2006-09-22 WO PCT/US2006/037105 patent/WO2007038343A2/en active Application Filing
- 2006-09-22 TW TW095135140A patent/TWI315102B/zh active
Also Published As
Publication number | Publication date |
---|---|
US20070063231A1 (en) | 2007-03-22 |
TW200721493A (en) | 2007-06-01 |
WO2007038343A2 (en) | 2007-04-05 |
TWI315102B (en) | 2009-09-21 |
WO2007038343B1 (en) | 2008-02-21 |
US7348656B2 (en) | 2008-03-25 |
WO2007038343A3 (en) | 2007-12-13 |
DE112006002489B4 (de) | 2011-01-20 |
WO2007038343A9 (en) | 2007-05-24 |
JP2009510725A (ja) | 2009-03-12 |
DE112006002489T5 (de) | 2008-07-10 |
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