JP5291848B2 - 接地部材完全性インジケータを備えたプラズマ処理チャンバとその使用方法 - Google Patents
接地部材完全性インジケータを備えたプラズマ処理チャンバとその使用方法 Download PDFInfo
- Publication number
- JP5291848B2 JP5291848B2 JP2007276381A JP2007276381A JP5291848B2 JP 5291848 B2 JP5291848 B2 JP 5291848B2 JP 2007276381 A JP2007276381 A JP 2007276381A JP 2007276381 A JP2007276381 A JP 2007276381A JP 5291848 B2 JP5291848 B2 JP 5291848B2
- Authority
- JP
- Japan
- Prior art keywords
- ground
- processing
- substrate support
- sensor
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/24—Manufacture or joining of vessels, leading-in conductors or bases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J11/00—Gas-filled discharge tubes with alternating current induction of the discharge, e.g. alternating current plasma display panels [AC-PDP]; Gas-filled discharge tubes without any main electrode inside the vessel; Gas-filled discharge tubes with at least one main electrode outside the vessel
- H01J11/20—Constructional details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Plasma & Fusion (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/561,463 US8004293B2 (en) | 2006-11-20 | 2006-11-20 | Plasma processing chamber with ground member integrity indicator and method for using the same |
| US11/561463 | 2006-11-20 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008156747A JP2008156747A (ja) | 2008-07-10 |
| JP2008156747A5 JP2008156747A5 (enExample) | 2010-12-09 |
| JP5291848B2 true JP5291848B2 (ja) | 2013-09-18 |
Family
ID=39416283
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007276381A Expired - Fee Related JP5291848B2 (ja) | 2006-11-20 | 2007-10-24 | 接地部材完全性インジケータを備えたプラズマ処理チャンバとその使用方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8004293B2 (enExample) |
| JP (1) | JP5291848B2 (enExample) |
| KR (1) | KR100923594B1 (enExample) |
| CN (1) | CN101187013B (enExample) |
| TW (1) | TWI389187B (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5655602A (en) | 1992-08-28 | 1997-08-12 | Marathon Oil Company | Apparatus and process for drilling and completing multiple wells |
| US7972470B2 (en) * | 2007-05-03 | 2011-07-05 | Applied Materials, Inc. | Asymmetric grounding of rectangular susceptor |
| TWI458850B (zh) * | 2008-07-07 | 2014-11-01 | Lam Res Corp | 用來鑑定電漿處理腔室中之薄膜之特性的射頻偏壓電容耦合靜電探針裝置 |
| US20100136261A1 (en) * | 2008-12-03 | 2010-06-03 | Applied Materials, Inc. | Modulation of rf returning straps for uniformity control |
| US8466697B2 (en) * | 2009-04-28 | 2013-06-18 | Lam Research Corporation | Arrangements for detecting discontinuity of flexible connections for current flow and methods thereof |
| KR101711912B1 (ko) * | 2009-09-16 | 2017-03-06 | 삼성전자주식회사 | 이동단말기의 효율적인 무선 충전을 위한 장치 및 방법 |
| KR101127757B1 (ko) * | 2009-12-02 | 2012-03-23 | 주식회사 테스 | 서셉터 접지유닛, 이를 이용하여 서셉터 접지의 가변방법 및 이를 갖는 공정챔버 |
| JP5852378B2 (ja) * | 2011-09-13 | 2016-02-03 | キヤノン株式会社 | 堆積膜形成方法および電子写真感光体の製造方法 |
| US8911588B2 (en) * | 2012-03-19 | 2014-12-16 | Lam Research Corporation | Methods and apparatus for selectively modifying RF current paths in a plasma processing system |
| US9245720B2 (en) * | 2012-06-12 | 2016-01-26 | Lam Research Corporation | Methods and apparatus for detecting azimuthal non-uniformity in a plasma processing system |
| KR20150022163A (ko) * | 2013-08-22 | 2015-03-04 | 삼성디스플레이 주식회사 | 플라즈마 처리 장치용 스트랩 및 이를 포함하는 플라즈마 처리 장치 |
| US9595464B2 (en) * | 2014-07-19 | 2017-03-14 | Applied Materials, Inc. | Apparatus and method for reducing substrate sliding in process chambers |
| US20160348233A1 (en) * | 2015-05-29 | 2016-12-01 | Applied Materials, Inc. | Grounding of conductive mask for deposition processes |
| JP6512954B2 (ja) * | 2015-06-11 | 2019-05-15 | 東京エレクトロン株式会社 | フォーカスリングを検査するためのシステム、及びフォーカスリングを検査する方法 |
| US9903739B2 (en) * | 2015-06-11 | 2018-02-27 | Tokyo Electron Limited | Sensor chip for electrostatic capacitance measurement and measuring device having the same |
| KR102099660B1 (ko) * | 2015-10-02 | 2020-04-14 | 주식회사 원익아이피에스 | 기판처리장치 |
| US10074549B2 (en) * | 2016-03-28 | 2018-09-11 | Tokyo Electron Limited | Method for acquiring data indicating electrostatic capacitance |
| US10921251B2 (en) | 2016-08-22 | 2021-02-16 | Applied Materials, Inc. | Chamber component part wear indicator and a system for detecting part wear |
| KR102399343B1 (ko) * | 2017-05-29 | 2022-05-19 | 삼성디스플레이 주식회사 | 화학기상 증착장치 |
| CN119663247A (zh) * | 2017-06-01 | 2025-03-21 | 应用材料公司 | 延长在pecvd工艺腔室中接地带使用寿命 |
| JP7186393B2 (ja) * | 2018-12-06 | 2022-12-09 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP7446335B2 (ja) * | 2019-04-29 | 2024-03-08 | アプライド マテリアルズ インコーポレイテッド | 接地用ストラップアセンブリ |
| US11443921B2 (en) * | 2020-06-11 | 2022-09-13 | Applied Materials, Inc. | Radio frequency ground system and method |
| US20240093380A1 (en) * | 2022-09-21 | 2024-03-21 | Applied Materials, Inc. | Grounding devices for substrate processing chambers |
| KR102788403B1 (ko) | 2022-11-23 | 2025-03-28 | 심경식 | 기판처리설비의 단선 방지 장치 |
Family Cites Families (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4771230A (en) * | 1986-10-02 | 1988-09-13 | Testamatic Corporation | Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out |
| KR940010649A (ko) * | 1992-10-14 | 1994-05-26 | 오오가 노리오 | 인쇄장치와 감광지 |
| KR100276093B1 (ko) | 1992-10-19 | 2000-12-15 | 히가시 데쓰로 | 플라스마 에칭방법 |
| JPH0721964A (ja) * | 1993-07-02 | 1995-01-24 | Casio Comput Co Ltd | 電子線分析装置 |
| KR100264445B1 (ko) | 1993-10-04 | 2000-11-01 | 히가시 데쓰로 | 플라즈마처리장치 |
| US5558717A (en) | 1994-11-30 | 1996-09-24 | Applied Materials | CVD Processing chamber |
| US6042686A (en) | 1995-06-30 | 2000-03-28 | Lam Research Corporation | Power segmented electrode |
| US5900062A (en) * | 1995-12-28 | 1999-05-04 | Applied Materials, Inc. | Lift pin for dechucking substrates |
| US6012600A (en) | 1996-02-02 | 2000-01-11 | Applied Materials, Inc. | Pressure responsive clamp for a processing chamber |
| US6345589B1 (en) * | 1996-03-29 | 2002-02-12 | Applied Materials, Inc. | Method and apparatus for forming a borophosphosilicate film |
| US6254746B1 (en) * | 1996-05-09 | 2001-07-03 | Applied Materials, Inc. | Recessed coil for generating a plasma |
| US5900064A (en) * | 1997-05-01 | 1999-05-04 | Applied Materials, Inc. | Plasma process chamber |
| US6057235A (en) * | 1997-09-15 | 2000-05-02 | Micron Technology, Inc. | Method for reducing surface charge on semiconducter wafers to prevent arcing during plasma deposition |
| US6024044A (en) * | 1997-10-09 | 2000-02-15 | Applied Komatsu Technology, Inc. | Dual frequency excitation of plasma for film deposition |
| US6827373B2 (en) * | 1997-12-08 | 2004-12-07 | Capture Business Cards Llc | Business card stock with peel off labels, and method |
| GB9800405D0 (en) * | 1998-01-10 | 1998-03-04 | Reed Edward John | Welding method and apparatus |
| US6129808A (en) * | 1998-03-31 | 2000-10-10 | Lam Research Corporation | Low contamination high density plasma etch chambers and methods for making the same |
| EP1073779A4 (en) * | 1998-04-13 | 2007-05-30 | Tokyo Electron Ltd | IMPEDANCE CHAMBER REDUCED |
| JP3241332B2 (ja) * | 1998-10-27 | 2001-12-25 | 日本電気株式会社 | 無線携帯端末のノイズ低減方法 |
| US6221221B1 (en) * | 1998-11-16 | 2001-04-24 | Applied Materials, Inc. | Apparatus for providing RF return current path control in a semiconductor wafer processing system |
| US6349670B1 (en) | 1998-11-30 | 2002-02-26 | Alps Electric Co., Ltd. | Plasma treatment equipment |
| JP3645768B2 (ja) * | 1999-12-07 | 2005-05-11 | シャープ株式会社 | プラズマプロセス装置 |
| US6531030B1 (en) * | 2000-03-31 | 2003-03-11 | Lam Research Corp. | Inductively coupled plasma etching apparatus |
| US6779481B2 (en) * | 2000-04-27 | 2004-08-24 | Tokyo Electron Limited | Electrical coupling between chamber parts in electronic device processing equipment |
| US6857387B1 (en) * | 2000-05-03 | 2005-02-22 | Applied Materials, Inc. | Multiple frequency plasma chamber with grounding capacitor at cathode |
| US6364958B1 (en) | 2000-05-24 | 2002-04-02 | Applied Materials, Inc. | Plasma assisted semiconductor substrate processing chamber having a plurality of ground path bridges |
| JP2001338914A (ja) * | 2000-05-30 | 2001-12-07 | Tokyo Electron Ltd | ガス導入機構およびガス導入方法、ガスリーク検出方法、ならびに真空処理装置 |
| US6384958B1 (en) * | 2000-06-26 | 2002-05-07 | Jds Uniphase Corporation | Free-space thermo-optical devices |
| EP1174910A3 (en) | 2000-07-20 | 2010-01-06 | Applied Materials, Inc. | Method and apparatus for dechucking a substrate |
| JP4666740B2 (ja) * | 2000-10-06 | 2011-04-06 | 川崎マイクロエレクトロニクス株式会社 | 半導体製造装置、被処理基板表面の処理方法およびプラズマ生成物の付着状態の観察方法 |
| US6558717B1 (en) * | 2000-12-04 | 2003-05-06 | Campina B.V. | Method for the sequential precipitation of casein and calcium phosphate from a milk source |
| US7202690B2 (en) * | 2001-02-19 | 2007-04-10 | Nidec-Read Corporation | Substrate inspection device and substrate inspecting method |
| KR100877243B1 (ko) * | 2001-02-19 | 2009-01-07 | 니혼 덴산 리드 가부시끼가이샤 | 회로 기판 검사 장치 및 회로 기판을 검사하기 위한 방법 |
| WO2002084698A1 (en) * | 2001-04-13 | 2002-10-24 | Applied Materials, Inc. | Inductively coupled plasma source with controllable power distribution |
| US6915885B2 (en) * | 2001-08-09 | 2005-07-12 | Zf Sachs Ag | Oscillation damper with adjustable damping force |
| US6652713B2 (en) * | 2001-08-09 | 2003-11-25 | Applied Materials, Inc. | Pedestal with integral shield |
| US7083702B2 (en) * | 2003-06-12 | 2006-08-01 | Applied Materials, Inc. | RF current return path for a large area substrate plasma reactor |
| US20050263070A1 (en) * | 2004-05-25 | 2005-12-01 | Tokyo Electron Limited | Pressure control and plasma confinement in a plasma processing chamber |
| US7988816B2 (en) * | 2004-06-21 | 2011-08-02 | Tokyo Electron Limited | Plasma processing apparatus and method |
| US7375946B2 (en) * | 2004-08-16 | 2008-05-20 | Applied Materials, Inc. | Method and apparatus for dechucking a substrate |
| US7534301B2 (en) * | 2004-09-21 | 2009-05-19 | Applied Materials, Inc. | RF grounding of cathode in process chamber |
| US20060171848A1 (en) * | 2005-01-31 | 2006-08-03 | Advanced Energy Industries, Inc. | Diagnostic plasma sensors for endpoint and end-of-life detection |
| JP4705378B2 (ja) * | 2005-01-31 | 2011-06-22 | 東京エレクトロン株式会社 | 処理装置及び処理方法 |
| JP2007048986A (ja) * | 2005-08-10 | 2007-02-22 | Hitachi High-Technologies Corp | プラズマ処理装置およびプラズマ処理方法 |
-
2006
- 2006-11-20 US US11/561,463 patent/US8004293B2/en not_active Expired - Fee Related
-
2007
- 2007-10-23 KR KR1020070106554A patent/KR100923594B1/ko not_active Expired - Fee Related
- 2007-10-24 JP JP2007276381A patent/JP5291848B2/ja not_active Expired - Fee Related
- 2007-10-25 TW TW096140121A patent/TWI389187B/zh not_active IP Right Cessation
- 2007-10-26 CN CN2007101653378A patent/CN101187013B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080045610A (ko) | 2008-05-23 |
| CN101187013A (zh) | 2008-05-28 |
| US8004293B2 (en) | 2011-08-23 |
| US20080116876A1 (en) | 2008-05-22 |
| JP2008156747A (ja) | 2008-07-10 |
| TW200832530A (en) | 2008-08-01 |
| KR100923594B1 (ko) | 2009-10-23 |
| CN101187013B (zh) | 2010-12-15 |
| TWI389187B (zh) | 2013-03-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5291848B2 (ja) | 接地部材完全性インジケータを備えたプラズマ処理チャンバとその使用方法 | |
| KR102756757B1 (ko) | 통합된 온도 측정 전기 디바이스들을 가진 기판 홀더 | |
| US11265971B2 (en) | Sensor system for multi-zone electrostatic chuck | |
| US10475623B2 (en) | Ceramic layer for electrostatic chuck including embedded faraday cage for RF delivery and associated methods | |
| JP6452449B2 (ja) | 載置台及び基板処理装置 | |
| US20100013626A1 (en) | Substrate lift pin sensor | |
| US10741368B2 (en) | Plasma processing apparatus | |
| US20050095732A1 (en) | Plasma processing apparatus and method and apparatus for measuring DC potential | |
| US20140231389A1 (en) | Plasma processing apparatus and plasma processing method | |
| KR100929448B1 (ko) | 기판 유지 기구 및 플라즈마 처리 장치 | |
| US20100163188A1 (en) | Mounting table structure and processing apparatus | |
| US10192767B2 (en) | Ceramic electrostatic chuck including embedded faraday cage for RF delivery and associated methods for operation, monitoring, and control | |
| US20200111648A1 (en) | Plasma processing apparatus and method for measuring thickness of ring member | |
| KR102263417B1 (ko) | 기판 처리 장치 및 기판 처리 방법 | |
| JP2002305237A (ja) | 半導体製造方法および製造装置 | |
| US20090056627A1 (en) | Method and apparatus for monitoring plasma-induced damage using dc floating potential of substrate | |
| JP5227638B2 (ja) | 真空処理装置 | |
| JP2008134204A (ja) | 温度検出シート、温度測定システム、および、熱処理装置 | |
| KR20250077230A (ko) | 척킹힘 측정 모듈 및 이를 이용한 측정 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20101023 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20101023 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20111221 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20121018 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20121030 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20130129 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20130201 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20130227 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20130304 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20130329 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20130403 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130426 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130604 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130608 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5291848 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |