JP5284004B2 - 基板の処理装置 - Google Patents

基板の処理装置 Download PDF

Info

Publication number
JP5284004B2
JP5284004B2 JP2008212054A JP2008212054A JP5284004B2 JP 5284004 B2 JP5284004 B2 JP 5284004B2 JP 2008212054 A JP2008212054 A JP 2008212054A JP 2008212054 A JP2008212054 A JP 2008212054A JP 5284004 B2 JP5284004 B2 JP 5284004B2
Authority
JP
Japan
Prior art keywords
substrate
processing liquid
processing
liquid
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2008212054A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010050226A5 (enrdf_load_stackoverflow
JP2010050226A (ja
Inventor
勉 菊池
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Mechatronics Corp
Original Assignee
Shibaura Mechatronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shibaura Mechatronics Corp filed Critical Shibaura Mechatronics Corp
Priority to JP2008212054A priority Critical patent/JP5284004B2/ja
Publication of JP2010050226A publication Critical patent/JP2010050226A/ja
Publication of JP2010050226A5 publication Critical patent/JP2010050226A5/ja
Application granted granted Critical
Publication of JP5284004B2 publication Critical patent/JP5284004B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
JP2008212054A 2008-08-20 2008-08-20 基板の処理装置 Active JP5284004B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008212054A JP5284004B2 (ja) 2008-08-20 2008-08-20 基板の処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008212054A JP5284004B2 (ja) 2008-08-20 2008-08-20 基板の処理装置

Publications (3)

Publication Number Publication Date
JP2010050226A JP2010050226A (ja) 2010-03-04
JP2010050226A5 JP2010050226A5 (enrdf_load_stackoverflow) 2011-10-06
JP5284004B2 true JP5284004B2 (ja) 2013-09-11

Family

ID=42067085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008212054A Active JP5284004B2 (ja) 2008-08-20 2008-08-20 基板の処理装置

Country Status (1)

Country Link
JP (1) JP5284004B2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11322346B2 (en) 2020-09-18 2022-05-03 Samsung Electronics Co., Ltd. Cleaning substrate method and method of processing substrate using the same

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5829082B2 (ja) * 2011-09-09 2015-12-09 オリンパス株式会社 洗浄装置
KR101355917B1 (ko) * 2011-10-11 2014-01-29 세메스 주식회사 분사유닛, 이를 가지는 기판처리장치
KR101330319B1 (ko) * 2011-10-11 2013-11-14 세메스 주식회사 분사유닛 및 이를 가지는 기판처리장치
US8849453B2 (en) 2012-02-29 2014-09-30 GM Global Technology Operations LLC Human grasp assist device with exoskeleton
US9355835B2 (en) * 2012-06-29 2016-05-31 Semes Co., Ltd. Method and apparatus for processing substrate
JP5936535B2 (ja) * 2012-12-28 2016-06-22 東京エレクトロン株式会社 液処理装置及び液処理方法
KR102375437B1 (ko) * 2014-11-28 2022-03-18 세메스 주식회사 기판 처리 장치 및 방법
JP6478692B2 (ja) * 2015-02-18 2019-03-06 株式会社Screenホールディングス 基板処理装置
US10332761B2 (en) 2015-02-18 2019-06-25 SCREEN Holdings Co., Ltd. Substrate processing apparatus
JP6404189B2 (ja) * 2015-08-07 2018-10-10 東京エレクトロン株式会社 基板液処理装置、基板液処理方法及び記憶媒体
JP6784546B2 (ja) * 2016-09-08 2020-11-11 株式会社Screenホールディングス 基板処理装置
JP6831134B2 (ja) * 2016-10-25 2021-02-17 エーシーエム リサーチ (シャンハイ) インコーポレーテッド 半導体基板に対する湿式工程の装置および方法
TWI774756B (zh) * 2018-04-24 2022-08-21 大陸商盛美半導體設備(上海)股份有限公司 對半導體基板進行濕處理的裝置和方法
CN110896041B (zh) * 2018-09-13 2022-05-10 辛耘企业股份有限公司 基板处理设备及其流体供应装置
JP7504573B2 (ja) * 2019-09-30 2024-06-24 芝浦メカトロニクス株式会社 基板処理装置及び基板処理方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3834542B2 (ja) * 2001-11-01 2006-10-18 東京エレクトロン株式会社 基板洗浄装置及び基板洗浄方法
JP2006086415A (ja) * 2004-09-17 2006-03-30 Dainippon Screen Mfg Co Ltd 基板洗浄装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11322346B2 (en) 2020-09-18 2022-05-03 Samsung Electronics Co., Ltd. Cleaning substrate method and method of processing substrate using the same

Also Published As

Publication number Publication date
JP2010050226A (ja) 2010-03-04

Similar Documents

Publication Publication Date Title
JP5284004B2 (ja) 基板の処理装置
JP5123122B2 (ja) 基板の処理装置及び処理方法
JP4005326B2 (ja) 基板処理装置および基板処理方法
TWI415207B (zh) A substrate processing apparatus and a substrate processing method
CN100449702C (zh) 基板清洁装置和基板清洁方法
KR101562139B1 (ko) 기판처리장치 및 기판처리방법
TWI557792B (zh) 基板處理裝置、基板處理方法及記憶媒體
JP4937678B2 (ja) 基板処理方法および基板処理装置
TWI517225B (zh) 液體處理裝置及液體處理方法
TWI443722B (zh) 基板處理裝置及基板處理方法
JP2003275696A (ja) 基板処理装置および基板洗浄方法
KR102652667B1 (ko) 기판 처리 장치 및 기판 처리 방법
TW201448018A (zh) 基板液體處理方法、基板液體處理裝置及記憶媒體
JP2009231628A (ja) 基板処理装置
WO2019163651A1 (ja) 基板洗浄装置および基板洗浄方法
JP2006093497A (ja) 基板洗浄装置
JP4730787B2 (ja) 基板処理方法および基板処理装置
JP2002151455A (ja) 半導体ウエハ用洗浄装置
JP4357225B2 (ja) 基板処理装置
JP2005166958A (ja) 基板処理法及び基板処理装置
JP2007157930A (ja) ウェーハ洗浄装置
JP2008016781A (ja) 基板処理方法および基板処理装置
KR20170093366A (ko) 웨이퍼 세정 장치
JP5031654B2 (ja) 基板処理装置および基板処理方法
JP2001156032A (ja) 洗浄装置および洗浄方法

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110822

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110822

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20121112

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130108

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130311

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130521

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130529

R150 Certificate of patent or registration of utility model

Ref document number: 5284004

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150