JP5283693B2 - 波長又は偏光を感知する光学装置及びこの光学装置の使用 - Google Patents

波長又は偏光を感知する光学装置及びこの光学装置の使用 Download PDF

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JP5283693B2
JP5283693B2 JP2010509735A JP2010509735A JP5283693B2 JP 5283693 B2 JP5283693 B2 JP 5283693B2 JP 2010509735 A JP2010509735 A JP 2010509735A JP 2010509735 A JP2010509735 A JP 2010509735A JP 5283693 B2 JP5283693 B2 JP 5283693B2
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optical
component
light
light component
phase shift
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JP2010529486A5 (enExample
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カストルプ・ラース
ヴェストファル・フォルカー
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マックス プランク ゲゼルシャフト ツール フェルデルング デル ヴィッセンシャフテン エー．ヴェー．
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy

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  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2010509735A 2007-06-01 2008-05-30 波長又は偏光を感知する光学装置及びこの光学装置の使用 Expired - Fee Related JP5283693B2 (ja)

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DE102007025688A DE102007025688A1 (de) 2007-06-01 2007-06-01 Wellenlängen- oder polarisationssensitiver optischer Aufbau und dessen Verwendung
DE102007025688.6 2007-06-01
PCT/EP2008/004291 WO2008145371A2 (de) 2007-06-01 2008-05-30 Wellenlängen- oder polarisationssensitiver optischer aufbau und dessen verwendung

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JP2010529486A JP2010529486A (ja) 2010-08-26
JP2010529486A5 JP2010529486A5 (enExample) 2011-07-14
JP5283693B2 true JP5283693B2 (ja) 2013-09-04

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US (1) US8755116B2 (enExample)
EP (1) EP2158475B1 (enExample)
JP (1) JP5283693B2 (enExample)
DE (1) DE102007025688A1 (enExample)
WO (1) WO2008145371A2 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202009007250U1 (de) 2009-05-20 2009-11-26 Deutsches Krebsforschungszentrum Stiftung des öffentlichen Rechts Feldveränderungsmittel zur Erzeugung komplementärer Lichtintensitätsmuster
JP5766210B2 (ja) * 2010-01-15 2015-08-19 コーニンクレッカ フィリップス エヌ ヴェ 誘導放出抑制顕微鏡システム
DE102011108181B4 (de) * 2011-07-22 2015-02-26 Bundesrepublik Deutschland, vertreten durch das Bundesministerium für Wirtschaft und Technologie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zum ortsaufgelösten Messen einer Magnetisierung einer magnetischen Struktur und magnetooptischer Datenspeicher
DE102011113980A1 (de) * 2011-09-21 2013-03-21 Karlsruher Institut für Technologie Linsensystem mit veränderbarer Refraktionsstärke
DE102012200858A1 (de) * 2012-01-20 2013-07-25 Freie Universität Berlin Laserpulsformungsverfahren
JP6255389B2 (ja) * 2012-05-07 2017-12-27 アンセルム（アンスティチュ ナシオナル ドゥ ラ サンテ エ ドゥ ラ ルシェルシュ メディカル） 試料中の関心組織を高空間分解能で画像化するための顕微鏡
JP2014182239A (ja) * 2013-03-19 2014-09-29 Olympus Corp 超解像顕微鏡
DE102013227103B4 (de) * 2013-09-03 2018-05-30 Leica Microsystems Cms Gmbh Mikroskop mit einer akustooptischen Vorrichtung
DE102013227107A1 (de) * 2013-09-03 2015-03-05 Leica Microsystems Cms Gmbh Mikroskop mit einem Element zum Verändern der Form des Beleuchtungslichtfokus
GB2530034B (en) * 2014-09-09 2017-08-09 Max-Planck-Gesellschaft Zur Forderung Der Wss E V Particle detection apparatus
EP2995932B1 (en) * 2014-09-09 2019-02-27 Heraeus Quarzglas GmbH & Co. KG Optical fiber with a hollow channel along the center of the fiber core for receiving a sample
DE102014113716B4 (de) 2014-09-23 2021-11-11 Abberior Instruments Gmbh Vorrichtung zum getrennten Modulieren der Wellenfronten von zwei Komponenten eines Lichtstrahls und Rasterfluoreszenzlichtmikroskop
CN104568874B (zh) * 2014-12-22 2017-07-18 中国科学院苏州生物医学工程技术研究所 一种对荧光物质进行成像的超分辨显微镜
US9915524B2 (en) * 2015-05-11 2018-03-13 Kla-Tencor Corporation Optical metrology with small illumination spot size
JP2017075947A (ja) 2015-10-14 2017-04-20 アッベリオー インストラメンツ ゲーエムベーハーＡｂｂｅｒｉｏｒ Ｉｎｓｔｒｕｍｅｎｔｓ ＧｍｂＨ スキャナヘッド及びスキャナヘッド付き装置
WO2017067998A1 (en) 2015-10-19 2017-04-27 Deutsches Krebsforschungszentrum Chromatic phase plate
US9632297B1 (en) 2015-11-04 2017-04-25 Abberior Instruments Gmbh Device for separately modulating the wave fronts of two components of a light beam and microscope comprising the device
WO2017175258A1 (ja) * 2016-04-07 2017-10-12 オリンパス株式会社 超解像顕微鏡
DE202017100426U1 (de) * 2017-01-26 2017-02-07 Abberior Instruments Gmbh Vorrichtung zum Aufrüsten eines einen Kameraanschluss aufweisenden Lichtmikroskops zu einem STED- Mikroskop
JP6253830B2 (ja) * 2017-05-17 2017-12-27 オリンパス株式会社 超解像顕微鏡
DE102017122413A1 (de) 2017-09-27 2019-03-28 Abberior Instruments Gmbh Vorrichtung für das selektive Formen von Phasenfronten eines Lichtstrahls und deren Verwendung
WO2019075424A1 (en) * 2017-10-12 2019-04-18 Howard Hughes Medical Institute HIGH-RESOLUTION REAL-TIME IMAGING WITH ADAPTIVE OPTICAL ELEMENTS AND NETWORK LIGHT SHEETS
CN108957720B (zh) * 2018-09-26 2019-12-10 中国科学院化学研究所 受激辐射损耗光学显微镜及其照明系统
DE102018127891B3 (de) * 2018-11-08 2020-04-23 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zum Ausbilden einer Lichtintensitätsverteilung mit einem zentralen Intensitätsminimum und Scanning-Fluoreszenzlichtmikroskop mit einer solchen Vorrichtung
NL2022223B1 (en) * 2018-12-17 2020-07-03 Lumicks Tech B V Microscopy method and system
DE102019110157B4 (de) * 2019-04-17 2021-06-17 Leica Microsystems Cms Gmbh Fluoreszenz-Rastermikroskop und Verfahren zur Abbildung einer Probe
DE102020113998A1 (de) 2020-05-26 2021-12-02 Abberior Instruments Gmbh Verfahren, Computerprogramm und Vorrichtung zum Bestimmen von Positionen von Molekülen in einer Probe
DE102021128556A1 (de) * 2021-11-03 2023-05-04 Amphos GmbH STED-Mikroskop
DE102021005684A1 (de) 2021-11-16 2023-05-17 Jörn Volkher Wochnowski STED-Verfahren mit Hohllichtwellenleitern
CN116067935B (zh) * 2023-04-06 2023-07-11 北京攸维医疗科技有限公司 一种单光束光路的超分辨成像方法与装置

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2553108A (en) * 1946-08-10 1951-05-15 American Optical Corp Phase microscopy with reflected light
US2687670A (en) * 1950-04-26 1954-08-31 Vente Des Instr De Geodesie He Optical device with a variable and colored phase contrast
GB746480A (en) * 1953-02-06 1956-03-14 Arthur Warmisham Improvements in or relating to deep-field optical objectives
US3628848A (en) * 1969-12-23 1971-12-21 Anvar Variable phase contrast microscopy
US4896967A (en) * 1986-08-15 1990-01-30 Hamilton-Thorn Research Motility scanner and method
US5113285A (en) * 1990-09-28 1992-05-12 Honeywell Inc. Full color three-dimensional flat panel display
JPH052152A (ja) * 1990-12-19 1993-01-08 Hitachi Ltd 光ビーム作成方法、装置、それを用いた寸法測定方法、外観検査方法、高さ測定方法、露光方法および半導体集積回路装置の製造方法
JPH05232384A (ja) * 1992-02-18 1993-09-10 Olympus Optical Co Ltd 干渉顕微鏡
US5349592A (en) * 1992-02-27 1994-09-20 Kabushiki Kaisha Toshiba Super-resolution optical element for use in image forming apparatus
US5604591A (en) * 1994-04-11 1997-02-18 Olympus Optical Co., Ltd. Method of measuring phase difference and apparatus for carrying out the same
CN1250987C (zh) * 1994-04-14 2006-04-12 株式会社三协精机制作所 偏振光束分束器及使用偏振光束分束器的光探头
US6259104B1 (en) * 1994-07-15 2001-07-10 Stephen C. Baer Superresolution in optical microscopy and microlithography
JP2000329690A (ja) * 1999-05-20 2000-11-30 Olympus Optical Co Ltd 走査型共焦点光学装置
DE10012462B4 (de) * 2000-03-15 2004-07-08 Leica Microsystems Heidelberg Gmbh Beleuchtungsvorrichtung für die konfokale Fluoreszenz-Rastermikroskopie
DE10154699B4 (de) * 2001-11-09 2004-04-08 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zum räumlich eng begrenzten Anregen eines optischen Übergangs
US6646281B1 (en) * 2001-12-28 2003-11-11 Kla-Tencor Corporation Differential detector coupled with defocus for improved phase defect sensitivity
JP4334835B2 (ja) * 2002-08-28 2009-09-30 独立行政法人科学技術振興機構 顕微鏡
DE10313138B4 (de) * 2003-03-24 2007-11-29 Leica Microsystems Cms Gmbh Vorrichtung zur Beleuchtung eines Objekts
JP2005084266A (ja) * 2003-09-05 2005-03-31 Kawasaki Heavy Ind Ltd 光制御装置および光制御方法
DE102004032953B4 (de) * 2004-07-07 2008-02-07 Leica Microsystems Cms Gmbh Optische Vorrichtung und Rastermikroskop mit einer fokussierenden Optik
JP2006058477A (ja) * 2004-08-18 2006-03-02 Olympus Corp 超解像顕微鏡
US7816654B2 (en) * 2005-01-16 2010-10-19 Baer Stephen C Single wavelength stimulated emission depletion microscopy
DE102005013116B4 (de) * 2005-03-18 2022-05-25 Leica Microsystems Cms Gmbh Phasenfilter und ein Mikroskop
DE102005013969A1 (de) * 2005-03-26 2006-10-05 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren zur mikroskopischen Untersuchung einer räumlichen Feinstruktur
DE102005020003B4 (de) * 2005-04-27 2007-10-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Fluoreszenzmikroskop
DE102006011556B4 (de) * 2005-09-21 2020-03-26 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum hochaufgelösten optischen Abtasten einer Probe

Also Published As

Publication number Publication date
DE102007025688A1 (de) 2008-12-11
EP2158475A2 (de) 2010-03-03
US8755116B2 (en) 2014-06-17
WO2008145371A3 (de) 2009-03-26
EP2158475B1 (de) 2016-07-13
US20100142054A1 (en) 2010-06-10
JP2010529486A (ja) 2010-08-26
WO2008145371A2 (de) 2008-12-04

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