JP5276434B2 - 経路計画方法 - Google Patents

経路計画方法 Download PDF

Info

Publication number
JP5276434B2
JP5276434B2 JP2008508276A JP2008508276A JP5276434B2 JP 5276434 B2 JP5276434 B2 JP 5276434B2 JP 2008508276 A JP2008508276 A JP 2008508276A JP 2008508276 A JP2008508276 A JP 2008508276A JP 5276434 B2 JP5276434 B2 JP 5276434B2
Authority
JP
Japan
Prior art keywords
probe
axis
hole
around
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008508276A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008538845A5 (enExample
JP2008538845A (ja
Inventor
ウィリアム マクレーン イアン
マクファーランド ジェフリー
スベン ウォレス デビッド
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=34639993&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP5276434(B2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Renishaw PLC filed Critical Renishaw PLC
Publication of JP2008538845A publication Critical patent/JP2008538845A/ja
Publication of JP2008538845A5 publication Critical patent/JP2008538845A5/ja
Application granted granted Critical
Publication of JP5276434B2 publication Critical patent/JP5276434B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/42—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine
    • G05B19/4202—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine preparation of the programme medium using a drawing, a model
    • G05B19/4207—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine preparation of the programme medium using a drawing, a model in which a model is traced or scanned and corresponding data recorded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Numerical Control (AREA)
JP2008508276A 2005-04-25 2006-04-12 経路計画方法 Expired - Fee Related JP5276434B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0508217.7A GB0508217D0 (en) 2005-04-25 2005-04-25 Method for scanning the surface of a workpiece
GB0508217.7 2005-04-25
PCT/GB2006/001335 WO2006114570A1 (en) 2005-04-25 2006-04-12 Method of path planning

Publications (3)

Publication Number Publication Date
JP2008538845A JP2008538845A (ja) 2008-11-06
JP2008538845A5 JP2008538845A5 (enExample) 2009-05-28
JP5276434B2 true JP5276434B2 (ja) 2013-08-28

Family

ID=34639993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008508276A Expired - Fee Related JP5276434B2 (ja) 2005-04-25 2006-04-12 経路計画方法

Country Status (6)

Country Link
US (1) US7783445B2 (enExample)
EP (1) EP1877728B1 (enExample)
JP (1) JP5276434B2 (enExample)
CN (2) CN102914281B (enExample)
GB (1) GB0508217D0 (enExample)
WO (1) WO2006114570A1 (enExample)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE508612C2 (sv) † 1994-04-12 1998-10-19 Sca Hygiene Prod Ab Förfarande för att tillverka en byxblöja eller byxbinda samt en sådan artikel
GB0508217D0 (en) 2005-04-25 2005-06-01 Renishaw Plc Method for scanning the surface of a workpiece
GB0605796D0 (en) * 2006-03-23 2006-05-03 Renishaw Plc Apparatus and method of measuring workpieces
EP1975546B1 (en) 2007-03-26 2010-09-15 Hexagon Metrology AB Method of using multi-axis positioning and measuring system
EP1983297B1 (en) * 2007-04-18 2010-04-07 Hexagon Metrology AB Scanning probe with constant scanning speed
GB0707720D0 (en) * 2007-04-23 2007-05-30 Renishaw Plc Apparatus and method for controlling or programming a measurement routine
GB0713639D0 (en) * 2007-07-13 2007-08-22 Renishaw Plc Error correction
JP2009028871A (ja) * 2007-07-30 2009-02-12 Denso Wave Inc ロボット制御装置
GB0716218D0 (en) 2007-08-20 2007-09-26 Renishaw Plc Measurement path generation
GB0901040D0 (en) 2009-01-22 2009-03-11 Renishaw Plc Optical measuring method and system
EP2755095B1 (de) * 2010-02-15 2016-04-20 Carl Zeiss Industrielle Messtechnik GmbH Verfahren zum Regeln eines Messvorgangs mittels virtueller Oberflächen
DE102010015780A1 (de) 2010-04-20 2011-10-20 Carl Zeiss Industrielle Messtechnik Gmbh Betrieb einer Koordinatenmessmaschine oder einer Werkzeugmaschine
DE102011116339A1 (de) * 2011-10-19 2013-04-25 Spieth-Maschinenelemente Gmbh & Co. Kg Verfahren zur Vermessung eines dreidimensionalen Objekts
JP6113963B2 (ja) * 2012-04-26 2017-04-12 株式会社ミツトヨ 形状測定方法、及び形状測定装置
EP2698599A1 (de) * 2012-08-17 2014-02-19 Hexagon Technology Center GmbH Koordinatenmessverfahren und Koordinatenmessmaschine zum Vermessen von Oberflächen mit einem optischen Sensor
US10132622B2 (en) 2013-02-05 2018-11-20 Renishaw Plc Method and apparatus for measuring a part
DE102013101931B4 (de) 2013-02-27 2022-02-03 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zum Vermessen eines Werkstücks
JP6175738B2 (ja) * 2013-10-10 2017-08-09 株式会社東京精密 三次元測定機を用いた円測定方法
US9639083B2 (en) 2013-12-18 2017-05-02 Mitutoyo Corporation System and method for programming workpiece feature inspection operations for a coordinate measuring machine
CN104049111A (zh) * 2014-07-01 2014-09-17 哈尔滨工业大学 基于双探针原子力显微镜的纳米卡尺及采用该纳米卡尺测量微纳米结构关键尺寸的方法
US9646425B2 (en) 2015-04-09 2017-05-09 Mitutoyo Corporation Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portions
US9952586B2 (en) 2015-04-09 2018-04-24 Mitutoyo Corporation Inspection program editing environment with simulation status and control continually responsive to selection operations
US9933256B2 (en) 2015-04-09 2018-04-03 Mitutoyo Corporation Inspection program editing environment including real-time feedback related to throughput
CN108139210B (zh) 2015-05-04 2021-07-06 株式会社三丰 提供用户定义的碰撞避免体积的检查程序编辑环境
US11520472B2 (en) 2015-09-24 2022-12-06 Mitutoyo Corporation Inspection program editing environment including integrated alignment program planning and editing features
CN107710084B (zh) * 2015-12-30 2020-04-17 深圳配天智能技术研究院有限公司 一种加工路径规划方法、加工路径规划装置及数控机床
JP6487385B2 (ja) * 2016-07-20 2019-03-20 ファナック株式会社 ロボットの原点位置較正装置および方法
US10990075B2 (en) 2016-09-27 2021-04-27 Mitutoyo Corporation Context sensitive relational feature/measurement command menu display in coordinate measurement machine (CMM) user interface
JP6909574B2 (ja) * 2016-11-29 2021-07-28 株式会社ミツトヨ 形状測定装置の制御方法
CN106643616A (zh) * 2016-12-27 2017-05-10 广东长盈精密技术有限公司 接触式分中测量方法
JP6344630B2 (ja) * 2017-07-12 2018-06-20 株式会社東京精密 三次元測定機を用いた円測定方法
CN107664478B (zh) * 2017-10-26 2023-11-03 成都众鑫聚合科技有限公司 一种立式非接触回转体高精度测量装置及其测量方法
US11860602B2 (en) 2017-12-29 2024-01-02 Mitutoyo Corporation Inspection program editing environment with automatic transparency operations for occluded workpiece features
CN108549328B (zh) * 2018-03-22 2020-05-26 汇川技术（东莞）有限公司 自适应速度规划方法及系统
CN109059821B (zh) * 2018-08-27 2020-04-07 合肥工业大学 坐标测量机测量路径规划方法
CN109238084B (zh) * 2018-08-28 2020-04-14 合肥工业大学 一种微型圆孔测量的自动导引方法
CN110030963B (zh) * 2019-04-23 2020-10-13 太原理工大学 一种revo测头探针长度标定方法
CN111813100B (zh) * 2019-07-04 2022-07-15 中国科学技术大学 一种局部路径规划算法及装置
DE102019217515A1 (de) * 2019-11-13 2020-09-03 Carl Zeiss Industrielle Messtechnik Gmbh Sensorabhängige Festlegung von Winkelgeschwindigkeiten und -beschleunigungen bei Koordinatenmessgeräten
CN117537736A (zh) * 2023-10-26 2024-02-09 中国航发沈阳黎明航空发动机有限责任公司 一种高压双层整体叶盘叶型测量方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8908854D0 (en) 1989-04-19 1989-06-07 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
US5189806A (en) * 1988-12-19 1993-03-02 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
US5222034A (en) * 1990-10-10 1993-06-22 Shelton Russell S Measuring method and apparatus
JP3213989B2 (ja) 1991-09-02 2001-10-02 ダイキン工業株式会社 産業用ロボットにおける手先部の姿勢制御方法およびその装置
JPH06312392A (ja) 1993-04-28 1994-11-08 Yaskawa Electric Corp 多関節ロボットの制御装置
US5517190A (en) * 1994-02-03 1996-05-14 Gunn; Colin N. Physical measurement from changes in reactance
GB9413194D0 (en) * 1994-06-30 1994-08-24 Renishaw Plc Probe head
DE19529547A1 (de) * 1995-08-11 1997-02-13 Zeiss Carl Fa Verfahren zur Steuerung von Koordinatenmeßgeräten
GB9612383D0 (en) * 1995-12-07 1996-08-14 Rank Taylor Hobson Ltd Surface form measurement
DE19712029A1 (de) * 1997-03-21 1998-09-24 Zeiss Carl Fa Verfahren zur Steuerung von Koordinatenmeßgeräten nach Solldaten
JPH11226886A (ja) 1998-02-13 1999-08-24 Hitachi Zosen Corp ロボット軌道の修正方法
JPH11239988A (ja) 1998-02-24 1999-09-07 Sumitomo Heavy Ind Ltd 多関節ロボットのダイレクトティーチングにおける特異点回避方法
DE19809690A1 (de) * 1998-03-06 1999-09-09 Zeiss Carl Fa Koordinatenmeßgerät mit Benutzerführung
JP2000199710A (ja) * 1999-01-06 2000-07-18 Mitsutoyo Corp タッチ信号プロ―ブの接触部位検出構造
US7420588B2 (en) * 1999-06-09 2008-09-02 Mitutoyo Corporation Measuring method, measuring system and storage medium
US6460261B1 (en) * 1999-11-18 2002-10-08 Mitutoyo Corporation V-groove shape measuring method and apparatus by using rotary table
DE10050795C2 (de) 1999-12-23 2002-11-07 Klingelnberg Gmbh Verfahren und Vorrichtung zum Scannen auf einem Koordinatenmessgerät
GB0016533D0 (en) * 2000-07-06 2000-08-23 Renishaw Plc Method of and apparatus for correction of coordinate measurement errors due to vibrations in coordinate measuring machines (cmms)
JP2003001576A (ja) * 2001-06-25 2003-01-08 Matsushita Electric Ind Co Ltd ロボット制御装置およびその制御方法
GB0130021D0 (en) * 2001-12-15 2002-02-06 Renishaw Plc Reaction balanced rotary drive mechanism
JP3896024B2 (ja) * 2002-04-09 2007-03-22 新日本製鐵株式会社 垂直多関節型マニピュレータの制御装置
CA2522097C (en) * 2003-04-28 2012-09-25 Stephen James Crampton Cmm arm with exoskeleton
JP2005009917A (ja) * 2003-06-17 2005-01-13 Mitsutoyo Corp 表面倣い測定装置、表面倣い測定方法、表面倣い測定プログラムおよび記録媒体
GB0326532D0 (en) * 2003-11-13 2003-12-17 Renishaw Plc Method of error compensation
GB0508217D0 (en) 2005-04-25 2005-06-01 Renishaw Plc Method for scanning the surface of a workpiece

Also Published As

Publication number Publication date
CN102914281A (zh) 2013-02-06
CN101166949A (zh) 2008-04-23
US7783445B2 (en) 2010-08-24
GB0508217D0 (en) 2005-06-01
CN101166949B (zh) 2012-11-07
EP1877728A1 (en) 2008-01-16
CN102914281B (zh) 2016-02-24
EP1877728B1 (en) 2015-04-01
WO2006114570A1 (en) 2006-11-02
US20090055118A1 (en) 2009-02-26
JP2008538845A (ja) 2008-11-06

Similar Documents

Publication Publication Date Title
JP5276434B2 (ja) 経路計画方法
EP1975546B1 (en) Method of using multi-axis positioning and measuring system
CN105277152B (zh) 用于测量系统的探头支架
JP5350216B2 (ja) 加工品の測定装置および測定方法
US5822877A (en) Multi-probe system for dimensional metrology
JP5665270B2 (ja) 工作物の表面を走査する方法
CN100453970C (zh) 对具有铰接探头的坐标测量仪进行误差补偿的方法
JP2873404B2 (ja) ワークピースの表面をスキャンする方法とその装置
EP3184960B1 (en) Motorized orientable head for measuring system
US10794678B2 (en) Apparatus for measuring the roughness of a workpiece surface
US20080021672A1 (en) Scanning an Object
CN110291360A (zh) 校准表面感测装置的方法、用于控制计算机的相应校准程序以及相应校准套件
WO2023005122A1 (zh) 正交轴系统的正交性的测量方法
JP6800421B1 (ja) 測定装置及び測定方法
JP2831610B2 (ja) 測定装置
US5243872A (en) Robotic hand for controlling movement in multiple axes
JP2019045312A (ja) スタイラス及び表面形状測定装置
WO2022162927A1 (ja) 位置関係測定方法、接触検出方法および加工装置
CN1934409B (zh) 物体扫描
CN112147144A (zh) 移动式深孔检测设备
JP3939805B2 (ja) Ｎｃ工作機械用ワーク測定方法
JPH08229776A (ja) 工具の刃先位置変位測定機能を備えたｎｃ工作機械
JP7668808B2 (ja) 測定方法
CN120685035A (zh) 测量系统
JPH03113304A (ja) 形状測定装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090413

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090413

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110902

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20111130

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20111207

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20120202

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20120209

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120229

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120713

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20121015

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20121022

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20121113

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20121120

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121212

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130419

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130517

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 5276434

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees