JP5257955B2 - 可変利得をもつアナログ−デジタル変換器とその方法 - Google Patents

可変利得をもつアナログ−デジタル変換器とその方法 Download PDF

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Publication number
JP5257955B2
JP5257955B2 JP2010545045A JP2010545045A JP5257955B2 JP 5257955 B2 JP5257955 B2 JP 5257955B2 JP 2010545045 A JP2010545045 A JP 2010545045A JP 2010545045 A JP2010545045 A JP 2010545045A JP 5257955 B2 JP5257955 B2 JP 5257955B2
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Japan
Prior art keywords
terminal
capacitor
amplifier
input
analog signal
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Expired - Fee Related
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JP2010545045A
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Japanese (ja)
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JP2011511564A (ja
JP2011511564A5 (cg-RX-API-DMAC7.html
Inventor
レン、ジュシアン
アール． ガラード、マイク
サード ロバート エス． ジョーンズ、ザ
エイ． ギャリティ、ダグラス
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NXP USA Inc
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NXP USA Inc
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/18—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
    • H03M1/186—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging in feedforward mode, i.e. by determining the range to be selected directly from the input signal
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
    • H03M1/068—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS
    • H03M1/0682—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS using a differential network structure, i.e. symmetrical with respect to ground
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/40—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type
    • H03M1/403—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type using switched capacitors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
    • H03M1/442—Sequential comparisons in series-connected stages with change in value of analogue signal using switched capacitors

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Amplifiers (AREA)
  • Control Of Amplification And Gain Control (AREA)
JP2010545045A 2008-02-05 2009-01-09 可変利得をもつアナログ−デジタル変換器とその方法 Expired - Fee Related JP5257955B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/026,205 US7589658B2 (en) 2008-02-05 2008-02-05 Analog-to-digital converter with variable gain and method thereof
US12/026,205 2008-02-05
PCT/US2009/030517 WO2009099700A2 (en) 2008-02-05 2009-01-09 Analog-to-digital converter with variable gain and method thereof

Publications (3)

Publication Number Publication Date
JP2011511564A JP2011511564A (ja) 2011-04-07
JP2011511564A5 JP2011511564A5 (cg-RX-API-DMAC7.html) 2012-02-23
JP5257955B2 true JP5257955B2 (ja) 2013-08-07

Family

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Family Applications (1)

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JP2010545045A Expired - Fee Related JP5257955B2 (ja) 2008-02-05 2009-01-09 可変利得をもつアナログ−デジタル変換器とその方法

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Country Link
US (1) US7589658B2 (cg-RX-API-DMAC7.html)
JP (1) JP5257955B2 (cg-RX-API-DMAC7.html)
CN (1) CN101939918B (cg-RX-API-DMAC7.html)
WO (1) WO2009099700A2 (cg-RX-API-DMAC7.html)

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US20100060494A1 (en) * 2008-09-09 2010-03-11 Atmel Corporation Analog to Digital Converter
US7911370B2 (en) * 2009-06-25 2011-03-22 Mediatek Inc. Pipeline analog-to-digital converter with programmable gain function
US8339302B2 (en) 2010-07-29 2012-12-25 Freescale Semiconductor, Inc. Analog-to-digital converter having a comparator for a multi-stage sampling circuit and method therefor
US8531324B2 (en) 2011-07-19 2013-09-10 Freescale Semiconductor, Inc. Systems and methods for data conversion
US8384579B2 (en) * 2011-07-19 2013-02-26 Freescale Semiconductor, Inc. Systems and methods for data conversion
US8525721B2 (en) * 2011-09-20 2013-09-03 Freescale Semiconductor, Inc. Low power cycle data converter
JP5436508B2 (ja) * 2011-09-22 2014-03-05 独立行政法人科学技術振興機構 アナログ‐デジタル変換器及びアナログ信号をデジタル信号に変換する方法
US8823566B2 (en) 2012-06-29 2014-09-02 Freescale Semiconductor, Inc Analog to digital conversion architecture and method with input and reference voltage scaling
US8860596B1 (en) * 2013-08-20 2014-10-14 Freescale Semiconductor, Inc. Redundant signed digit (RSD) analog to digital converter
JP6849903B2 (ja) * 2016-10-06 2021-03-31 株式会社ソシオネクスト 受信回路及び半導体集積回路
KR102431230B1 (ko) * 2017-11-17 2022-08-10 에스케이하이닉스 주식회사 저잡음 싱글-슬롭 비교 장치 및 그에 따른 아날로그-디지털 변환 장치와 씨모스 이미지 센서
US10069507B1 (en) 2018-04-06 2018-09-04 Nxp Usa, Inc. Mismatch and reference common-mode offset insensitive single-ended switched capacitor gain stage
US10651811B2 (en) 2018-05-18 2020-05-12 Nxp Usa, Inc. Mismatch and reference common-mode offset insensitive single-ended switched capacitor gain stage with reduced capacitor mismatch sensitivity
US10979064B2 (en) 2018-10-31 2021-04-13 Taiwan Semiconductor Manufacturing Company, Ltd. Analog to digital converter with inverter based amplifier
JP7647165B2 (ja) * 2021-02-26 2025-03-18 セイコーエプソン株式会社 Ａ／ｄコンバーター、デジタル出力温度センサー、回路装置及び発振器

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US5625361A (en) 1994-11-14 1997-04-29 Motorola, Inc. Programmable capacitor array and method of programming
US5644313A (en) * 1995-06-05 1997-07-01 Motorola, Inc. Redundant signed digit A-to-D conversion circuit and method thereof
US5574457A (en) 1995-06-12 1996-11-12 Motorola, Inc. Switched capacitor gain stage
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Also Published As

Publication number Publication date
US7589658B2 (en) 2009-09-15
JP2011511564A (ja) 2011-04-07
CN101939918B (zh) 2013-10-23
US20090195428A1 (en) 2009-08-06
CN101939918A (zh) 2011-01-05
WO2009099700A3 (en) 2009-10-01
WO2009099700A2 (en) 2009-08-13

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