JP5237153B2 - 工作機械における工作物測定装置およびその方法 - Google Patents

工作機械における工作物測定装置およびその方法 Download PDF

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Publication number
JP5237153B2
JP5237153B2 JP2009041469A JP2009041469A JP5237153B2 JP 5237153 B2 JP5237153 B2 JP 5237153B2 JP 2009041469 A JP2009041469 A JP 2009041469A JP 2009041469 A JP2009041469 A JP 2009041469A JP 5237153 B2 JP5237153 B2 JP 5237153B2
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measurement
workpiece
head
position data
measuring
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Japanese (ja)
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JP2010194660A (ja
JP2010194660A5 (enExample
Inventor
静雄 西川
雅広 小松
圭蔵 樫原
尚義 森田
誠 藤嶋
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DMG Mori Co Ltd
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DMG Mori Co Ltd
Mori Seiki Co Ltd
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Priority to JP2009041469A priority Critical patent/JP5237153B2/ja
Priority to CN201020126978XU priority patent/CN201711817U/zh
Publication of JP2010194660A publication Critical patent/JP2010194660A/ja
Publication of JP2010194660A5 publication Critical patent/JP2010194660A5/ja
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JP2009041469A 2009-02-24 2009-02-24 工作機械における工作物測定装置およびその方法 Expired - Fee Related JP5237153B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009041469A JP5237153B2 (ja) 2009-02-24 2009-02-24 工作機械における工作物測定装置およびその方法
CN201020126978XU CN201711817U (zh) 2009-02-24 2010-02-23 机床中的工件测定装置

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JP2009041469A JP5237153B2 (ja) 2009-02-24 2009-02-24 工作機械における工作物測定装置およびその方法

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JP2010194660A JP2010194660A (ja) 2010-09-09
JP2010194660A5 JP2010194660A5 (enExample) 2011-10-13
JP5237153B2 true JP5237153B2 (ja) 2013-07-17

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Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102581702B (zh) * 2012-01-09 2014-01-29 天津大学 一种孔心定位法
CN106994626B (zh) * 2016-01-22 2019-06-28 香港理工大学 一种在位测量方法
WO2019130381A1 (ja) * 2017-12-25 2019-07-04 株式会社ニコン 加工システム、測定プローブ、形状測定装置、及びプログラム
CN111511501B (zh) * 2017-12-25 2022-05-27 株式会社尼康 加工系统、形状测定探针、形状算出装置及存储介质
JP2020001136A (ja) * 2018-06-29 2020-01-09 Dmg森精機株式会社 測定装置
CN112928594A (zh) * 2021-03-29 2021-06-08 武汉锐科光纤激光技术股份有限公司 一种反射镜自动耦合装置
JP7043660B1 (ja) 2021-05-24 2022-03-29 Dmg森精機株式会社 情報処理装置および工作機械
CN115256048B (zh) * 2022-08-10 2024-10-01 九江金铖科技有限公司 一种具有多位置检测功能的高安全性机械振动测量装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003254728A (ja) * 2002-03-04 2003-09-10 Toshiba Corp 表面形状測定装置
GB0400144D0 (en) * 2004-01-06 2004-02-11 Renishaw Plc Inspection system
JP2007086953A (ja) * 2005-09-21 2007-04-05 Jtekt Corp 加工面のｎｃ補正加工方法および補正加工用ｎｃデータの作成装置
GB0703423D0 (en) * 2007-02-22 2007-04-04 Renishaw Plc Calibration method and apparatus

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