JP5231922B2 - X線検査装置 - Google Patents
X線検査装置 Download PDFInfo
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- JP5231922B2 JP5231922B2 JP2008253974A JP2008253974A JP5231922B2 JP 5231922 B2 JP5231922 B2 JP 5231922B2 JP 2008253974 A JP2008253974 A JP 2008253974A JP 2008253974 A JP2008253974 A JP 2008253974A JP 5231922 B2 JP5231922 B2 JP 5231922B2
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- 238000007689 inspection Methods 0.000 title claims description 130
- 230000002159 abnormal effect Effects 0.000 claims description 36
- 230000001678 irradiating effect Effects 0.000 claims description 6
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 claims description 3
- 239000011347 resin Substances 0.000 claims description 3
- 229920005989 resin Polymers 0.000 claims description 3
- 230000032258 transport Effects 0.000 description 11
- 238000005259 measurement Methods 0.000 description 5
- 238000005286 illumination Methods 0.000 description 4
- 241001474374 Blennius Species 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
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- 238000000034 method Methods 0.000 description 2
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- 239000003814 drug Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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Description
2 搬送部
2a ベルト面
3 検出部
4 筐体
5 表示器
6 駆動モータ
7 搬入口
8 搬出口
9 X線発生器
10 X線検出器
11 箱体
12 X線管
13 照度センサ(照度測定手段)
14 照射中ランプ(警告ランプ)
16 遮蔽カーテン(遮蔽手段)
17 判定部(判定手段)
18 設定部
19 報知部
21 搬送路
21a 天井部
22 検査空間
W 被検査物
Claims (5)
- 検査空間(22)内の被検査物(W)にX線を照射するX線発生器(9)と、
前記被検査物を透過するX線を検出して透過量に応じた濃度データを出力するX線検出器(10)と、
前記X線発生器が照射するX線が前記検査空間の外部に漏えいすることを防止する遮蔽手段(16)と、を備え、
前記X線検出器から出力される濃度データに基づいて前記被検査物の検査を行うX線検査装置(1)において、
前記遮蔽手段を通して前記検査空間内に侵入した光の照度を測定する照度測定手段(13)と、
前記照度測定手段が、予め定めた値以上の照度を予め定めた時間以上連続して測定したとき、前記遮蔽手段が異常状態であると判定する判定手段(17)とを備えたことを特徴とするX線検査装置。 - 前記X線発生器がX線を照射していることを光により報知する警告ランプ(14)を、前記検査空間の外部であって、前記遮蔽手段に隙間が生じたときに前記検査空間内に前記警告ランプの光が到達し得る位置に備えたことを特徴とする請求項1に記載のX線検査装置。
- 前記照度測定手段が、前記検査空間内の外縁部の底部に複数配置されたことを特徴とする請求項1または請求項2に記載のX線検査装置。
- 前記照度測定手段が、前記検査空間内の中央部の底部に1つ配置されたことを特徴とする請求項1または請求項2に記載のX線検査装置。
- 前記遮蔽手段が、金属を含有する樹脂からなることを特徴とする請求項1ないし請求項4のいずれかに記載のX線検査装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2008253974A JP5231922B2 (ja) | 2008-09-30 | 2008-09-30 | X線検査装置 |
Applications Claiming Priority (1)
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JP2008253974A JP5231922B2 (ja) | 2008-09-30 | 2008-09-30 | X線検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010085224A JP2010085224A (ja) | 2010-04-15 |
JP5231922B2 true JP5231922B2 (ja) | 2013-07-10 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2008253974A Active JP5231922B2 (ja) | 2008-09-30 | 2008-09-30 | X線検査装置 |
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JP (1) | JP5231922B2 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012078303A (ja) * | 2010-10-06 | 2012-04-19 | Yamato Scale Co Ltd | X線検査装置 |
CN103345953B (zh) * | 2013-06-25 | 2016-05-18 | 上海高晶影像科技有限公司 | 安检机行李通过过程中减少辐射泄漏量的装置 |
JP6285674B2 (ja) * | 2013-09-18 | 2018-02-28 | 株式会社イシダ | X線検査装置 |
JP6204892B2 (ja) * | 2014-09-09 | 2017-09-27 | 株式会社日立ビルシステム | 乗客コンベア用移動手摺劣化診断装置 |
US10032532B2 (en) * | 2015-12-22 | 2018-07-24 | Globe Composite Solutions, Ltd. | Shielding curtain assembly for an electromagnetic radiation scanning system |
JP6859278B2 (ja) * | 2018-01-10 | 2021-04-14 | アンリツインフィビス株式会社 | X線検査装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002148211A (ja) * | 2000-11-07 | 2002-05-22 | Ishida Co Ltd | X線検査装置 |
JP3917038B2 (ja) * | 2002-08-02 | 2007-05-23 | アンリツ産機システム株式会社 | X線検査装置 |
JP2004138488A (ja) * | 2002-10-17 | 2004-05-13 | Anritsu Sanki System Co Ltd | X線異物検出装置 |
JP3915912B2 (ja) * | 2002-10-25 | 2007-05-16 | 株式会社島津製作所 | X線異物検査装置 |
JP4247015B2 (ja) * | 2003-03-10 | 2009-04-02 | 株式会社イシダ | X線検査装置 |
JP3116336U (ja) * | 2005-09-02 | 2005-12-02 | 株式会社島津製作所 | X線異物検査装置 |
JP5114636B2 (ja) * | 2008-01-31 | 2013-01-09 | 株式会社 システムスクエア | 異物検査装置 |
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- 2008-09-30 JP JP2008253974A patent/JP5231922B2/ja active Active
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