JP5188000B2 - 高帯域幅プローブアセンブリ - Google Patents
高帯域幅プローブアセンブリ Download PDFInfo
- Publication number
- JP5188000B2 JP5188000B2 JP2002572428A JP2002572428A JP5188000B2 JP 5188000 B2 JP5188000 B2 JP 5188000B2 JP 2002572428 A JP2002572428 A JP 2002572428A JP 2002572428 A JP2002572428 A JP 2002572428A JP 5188000 B2 JP5188000 B2 JP 5188000B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- ground
- spring
- housing
- spring probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 title claims abstract description 235
- 238000000034 method Methods 0.000 abstract description 8
- 238000012360 testing method Methods 0.000 description 13
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- 238000001746 injection moulding Methods 0.000 description 1
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- 239000011810 insulating material Substances 0.000 description 1
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- 239000007787 solid Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Vehicle Body Suspensions (AREA)
- Eye Examination Apparatus (AREA)
- Connecting Device With Holders (AREA)
Description
図7Aに、スプリングプローブブロックアセンブリ150の代替実施形態を示す。スプリングプローブブロックアセンブリ150は、絶縁性ハウジング152と、信号プローブ接点161および接地プローブ接点158と、プローブコネクタリテーナ156とを含む。最初に説明した実施形態と同様に、ハウジング152は成形誘電体材料であり、その誘電体材料は、接地要素と関連する信号線とを包囲して他のすべての信号線および接地対から隔離し、さらに、アセンブリにおけるすべての接地を、他の隣接するプローブブロックアセンブリと自動試験装置シャシ接地とから絶縁する。上述したように、ハウジング152の両端における有芯空洞は、接地要素の組立てられたセットの全体的な外面に適合し、空洞は、スプリングプローブが取付けられた場合の、組立てられたプローブコネクタおよび接地クランプの、軸方向かつ横方向の移動を制約するように、大きさが決められている。
Claims (3)
- ハウジングの前面に空洞を有する絶縁性ハウジングと、
絶縁性層と導電性シェルとによって包囲される信号プローブを有する、前記空洞内にあるプローブコネクタと、
前記空洞内の導電性接地プローブと、
前記絶縁性ハウジングの前記前面に隣接して前記空洞内に配置された導電性リテーナであって、前記プローブコネクタと前記導電性接地プローブとを収納する通路を有し、前記導電性接地プローブが前記導電性リテーナおよび前記プローブコネクタの前記導電性シェルと電気的に接触していて、前記導電性接地プローブが前記空洞内で偏向している導電性リテーナと、
を備えることを特徴とするスプリングプローブブロックアセンブリ。 - 前記絶縁性ハウジングは、複数の空洞を有し、該複数の空洞の各々が、導電性リテーナと、プローブコネクタと、接地プローブと、を備えることを特徴とする、請求項1に記載のスプリングローブブロックアセンブリ。
- 前記導電性リテーナは、前記プローブコネクタを収納する中心のループと、前記導電性接地プローブを収納する一対のハサミ状のスプリングアームと、を備えることを特徴とする、請求項1に記載のスプリングローブブロックアセンブリ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/804,762 US6551126B1 (en) | 2001-03-13 | 2001-03-13 | High bandwidth probe assembly |
US09/804,762 | 2001-03-13 | ||
PCT/US2001/021776 WO2002073219A2 (en) | 2001-03-13 | 2001-07-10 | High bandwidth probe assembly |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011221783A Division JP2012013713A (ja) | 2001-03-13 | 2011-10-06 | 高帯域幅プローブアセンブリ |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2004523757A JP2004523757A (ja) | 2004-08-05 |
JP2004523757A5 JP2004523757A5 (ja) | 2008-08-21 |
JP5188000B2 true JP5188000B2 (ja) | 2013-04-24 |
Family
ID=25189761
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002572428A Expired - Fee Related JP5188000B2 (ja) | 2001-03-13 | 2001-07-10 | 高帯域幅プローブアセンブリ |
JP2011221783A Pending JP2012013713A (ja) | 2001-03-13 | 2011-10-06 | 高帯域幅プローブアセンブリ |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011221783A Pending JP2012013713A (ja) | 2001-03-13 | 2011-10-06 | 高帯域幅プローブアセンブリ |
Country Status (6)
Country | Link |
---|---|
US (1) | US6551126B1 (ja) |
EP (2) | EP1368665B1 (ja) |
JP (2) | JP5188000B2 (ja) |
AT (1) | ATE358278T1 (ja) |
DE (1) | DE60127589T2 (ja) |
WO (1) | WO2002073219A2 (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6911811B2 (en) * | 2002-03-18 | 2005-06-28 | Agilent Technologies, Inc. | Contact spring and socket combination for high bandwidth probe tips |
US6902416B2 (en) * | 2002-08-29 | 2005-06-07 | 3M Innovative Properties Company | High density probe device |
US6824427B1 (en) * | 2003-05-13 | 2004-11-30 | 3M Innovative Properties Company | Coaxial probe interconnection system |
US6798227B1 (en) * | 2003-06-24 | 2004-09-28 | Agilent Technologies, Inc. | Two axis self-centering probe block assembly with two axis float and self-alignment |
KR100600482B1 (ko) * | 2004-06-22 | 2006-07-13 | 삼성전자주식회사 | 반도체 패키지 측정용 프로브 |
US7180321B2 (en) * | 2004-10-01 | 2007-02-20 | Teradyne, Inc. | Tester interface module |
US20070063714A1 (en) * | 2005-09-21 | 2007-03-22 | Mctigue Michael T | High bandwidth probe |
US7651355B2 (en) * | 2006-06-30 | 2010-01-26 | 3M Innovative Properties Company | Floating panel mount connection system |
US7977583B2 (en) * | 2007-12-13 | 2011-07-12 | Teradyne, Inc. | Shielded cable interface module and method of fabrication |
US7651374B2 (en) * | 2008-06-10 | 2010-01-26 | 3M Innovative Properties Company | System and method of surface mount electrical connection |
US7744414B2 (en) * | 2008-07-08 | 2010-06-29 | 3M Innovative Properties Company | Carrier assembly and system configured to commonly ground a header |
US7740508B2 (en) * | 2008-09-08 | 2010-06-22 | 3M Innovative Properties Company | Probe block assembly |
US20100194419A1 (en) * | 2009-02-05 | 2010-08-05 | Chan Edward K | Multi-contact probe assembly |
US7997933B2 (en) * | 2009-08-10 | 2011-08-16 | 3M Innovative Properties Company | Electrical connector system |
US7909646B2 (en) * | 2009-08-10 | 2011-03-22 | 3M Innovative Properties Company | Electrical carrier assembly and system of electrical carrier assemblies |
US7927144B2 (en) * | 2009-08-10 | 2011-04-19 | 3M Innovative Properties Company | Electrical connector with interlocking plates |
US7850489B1 (en) | 2009-08-10 | 2010-12-14 | 3M Innovative Properties Company | Electrical connector system |
JP2011138655A (ja) * | 2009-12-28 | 2011-07-14 | Shonan Engineering Corp | 多点接触装置および当該装置を備えた電池検査装置 |
US8187035B2 (en) * | 2010-05-28 | 2012-05-29 | Tyco Electronics Corporation | Connector assembly |
US10663486B2 (en) * | 2017-02-06 | 2020-05-26 | International Business Machines Corporation | Portable electrical noise probe structure |
KR101921291B1 (ko) * | 2018-05-11 | 2019-02-13 | (주) 마이크로프랜드 | 반도체소자 테스트소켓 |
CN112005448B (zh) * | 2018-05-22 | 2022-09-23 | 欧姆龙株式会社 | 探针销 |
US10938139B2 (en) * | 2018-08-21 | 2021-03-02 | Te Connectivity Corporation | Electrical connector with retractable contacts |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3852700A (en) * | 1969-04-18 | 1974-12-03 | Breston M | Grounding base for connector |
JPS6180067A (ja) * | 1984-09-21 | 1986-04-23 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | テスト・プロ−ブ装置 |
US4729752A (en) * | 1985-07-26 | 1988-03-08 | Amp Incorporated | Transient suppression device |
US4724180A (en) * | 1985-08-05 | 1988-02-09 | Teradyne, Inc. | Electrically shielded connectors |
JPH0521020Y2 (ja) * | 1985-12-05 | 1993-05-31 | ||
JPH0178029U (ja) | 1987-11-13 | 1989-05-25 | ||
JPH04115167A (ja) * | 1990-09-06 | 1992-04-16 | Nec Corp | 布線検査機用ピンヘッド |
JPH06216205A (ja) * | 1993-01-13 | 1994-08-05 | Tokyo Electron Yamanashi Kk | プローブカードインターフェース装置 |
JPH09304431A (ja) * | 1996-05-13 | 1997-11-28 | I C T:Kk | プローブ針 |
US6066957A (en) | 1997-09-11 | 2000-05-23 | Delaware Capital Formation, Inc. | Floating spring probe wireless test fixture |
US6184460B1 (en) * | 1998-02-27 | 2001-02-06 | Berg Technology, Inc. | Modular box shield for forming a coaxial header |
US6037787A (en) | 1998-03-24 | 2000-03-14 | Teradyne, Inc. | High performance probe interface for automatic test equipment |
US6409550B1 (en) * | 1999-11-15 | 2002-06-25 | Mce/Weinschel Corporation | Planar blind-mate connectors |
US6447328B1 (en) * | 2001-03-13 | 2002-09-10 | 3M Innovative Properties Company | Method and apparatus for retaining a spring probe |
-
2001
- 2001-03-13 US US09/804,762 patent/US6551126B1/en not_active Expired - Fee Related
- 2001-07-10 AT AT01953443T patent/ATE358278T1/de not_active IP Right Cessation
- 2001-07-10 EP EP01953443A patent/EP1368665B1/en not_active Expired - Lifetime
- 2001-07-10 EP EP06119367A patent/EP1722241A3/en not_active Withdrawn
- 2001-07-10 WO PCT/US2001/021776 patent/WO2002073219A2/en active IP Right Grant
- 2001-07-10 DE DE60127589T patent/DE60127589T2/de not_active Expired - Lifetime
- 2001-07-10 JP JP2002572428A patent/JP5188000B2/ja not_active Expired - Fee Related
-
2011
- 2011-10-06 JP JP2011221783A patent/JP2012013713A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
ATE358278T1 (de) | 2007-04-15 |
US6551126B1 (en) | 2003-04-22 |
EP1368665B1 (en) | 2007-03-28 |
WO2002073219A2 (en) | 2002-09-19 |
JP2012013713A (ja) | 2012-01-19 |
EP1722241A3 (en) | 2007-07-25 |
EP1368665A2 (en) | 2003-12-10 |
DE60127589D1 (de) | 2007-05-10 |
JP2004523757A (ja) | 2004-08-05 |
DE60127589T2 (de) | 2007-12-13 |
EP1722241A2 (en) | 2006-11-15 |
WO2002073219A3 (en) | 2003-01-03 |
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