ATE358278T1 - Breitbandige testsondeneinheit - Google Patents

Breitbandige testsondeneinheit

Info

Publication number
ATE358278T1
ATE358278T1 AT01953443T AT01953443T ATE358278T1 AT E358278 T1 ATE358278 T1 AT E358278T1 AT 01953443 T AT01953443 T AT 01953443T AT 01953443 T AT01953443 T AT 01953443T AT E358278 T1 ATE358278 T1 AT E358278T1
Authority
AT
Austria
Prior art keywords
probe
spring
housing
ground
grounding portion
Prior art date
Application number
AT01953443T
Other languages
English (en)
Inventor
Steven Feldman
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Application granted granted Critical
Publication of ATE358278T1 publication Critical patent/ATE358278T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Vehicle Body Suspensions (AREA)
  • Eye Examination Apparatus (AREA)
  • Connecting Device With Holders (AREA)
AT01953443T 2001-03-13 2001-07-10 Breitbandige testsondeneinheit ATE358278T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/804,762 US6551126B1 (en) 2001-03-13 2001-03-13 High bandwidth probe assembly

Publications (1)

Publication Number Publication Date
ATE358278T1 true ATE358278T1 (de) 2007-04-15

Family

ID=25189761

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01953443T ATE358278T1 (de) 2001-03-13 2001-07-10 Breitbandige testsondeneinheit

Country Status (6)

Country Link
US (1) US6551126B1 (de)
EP (2) EP1722241A3 (de)
JP (2) JP5188000B2 (de)
AT (1) ATE358278T1 (de)
DE (1) DE60127589T2 (de)
WO (1) WO2002073219A2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6911811B2 (en) * 2002-03-18 2005-06-28 Agilent Technologies, Inc. Contact spring and socket combination for high bandwidth probe tips
US6902416B2 (en) * 2002-08-29 2005-06-07 3M Innovative Properties Company High density probe device
US6824427B1 (en) * 2003-05-13 2004-11-30 3M Innovative Properties Company Coaxial probe interconnection system
US6798227B1 (en) * 2003-06-24 2004-09-28 Agilent Technologies, Inc. Two axis self-centering probe block assembly with two axis float and self-alignment
KR100600482B1 (ko) * 2004-06-22 2006-07-13 삼성전자주식회사 반도체 패키지 측정용 프로브
US7180321B2 (en) * 2004-10-01 2007-02-20 Teradyne, Inc. Tester interface module
US20070063714A1 (en) * 2005-09-21 2007-03-22 Mctigue Michael T High bandwidth probe
US7651355B2 (en) * 2006-06-30 2010-01-26 3M Innovative Properties Company Floating panel mount connection system
US7977583B2 (en) * 2007-12-13 2011-07-12 Teradyne, Inc. Shielded cable interface module and method of fabrication
US7651374B2 (en) * 2008-06-10 2010-01-26 3M Innovative Properties Company System and method of surface mount electrical connection
US7744414B2 (en) * 2008-07-08 2010-06-29 3M Innovative Properties Company Carrier assembly and system configured to commonly ground a header
US7740508B2 (en) * 2008-09-08 2010-06-22 3M Innovative Properties Company Probe block assembly
US20100194419A1 (en) * 2009-02-05 2010-08-05 Chan Edward K Multi-contact probe assembly
US7997933B2 (en) * 2009-08-10 2011-08-16 3M Innovative Properties Company Electrical connector system
US7927144B2 (en) * 2009-08-10 2011-04-19 3M Innovative Properties Company Electrical connector with interlocking plates
US7850489B1 (en) 2009-08-10 2010-12-14 3M Innovative Properties Company Electrical connector system
US7909646B2 (en) * 2009-08-10 2011-03-22 3M Innovative Properties Company Electrical carrier assembly and system of electrical carrier assemblies
JP2011138655A (ja) * 2009-12-28 2011-07-14 Shonan Engineering Corp 多点接触装置および当該装置を備えた電池検査装置
US8187035B2 (en) * 2010-05-28 2012-05-29 Tyco Electronics Corporation Connector assembly
US10663486B2 (en) * 2017-02-06 2020-05-26 International Business Machines Corporation Portable electrical noise probe structure
KR101921291B1 (ko) 2018-05-11 2019-02-13 (주) 마이크로프랜드 반도체소자 테스트소켓
CN112005448B (zh) * 2018-05-22 2022-09-23 欧姆龙株式会社 探针销
US10938139B2 (en) * 2018-08-21 2021-03-02 Te Connectivity Corporation Electrical connector with retractable contacts

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3852700A (en) * 1969-04-18 1974-12-03 Breston M Grounding base for connector
JPS6180067A (ja) * 1984-09-21 1986-04-23 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション テスト・プロ−ブ装置
US4729752A (en) * 1985-07-26 1988-03-08 Amp Incorporated Transient suppression device
US4724180A (en) * 1985-08-05 1988-02-09 Teradyne, Inc. Electrically shielded connectors
JPH0521020Y2 (de) * 1985-12-05 1993-05-31
JPH0178029U (de) 1987-11-13 1989-05-25
JPH04115167A (ja) * 1990-09-06 1992-04-16 Nec Corp 布線検査機用ピンヘッド
JPH06216205A (ja) * 1993-01-13 1994-08-05 Tokyo Electron Yamanashi Kk プローブカードインターフェース装置
JPH09304431A (ja) * 1996-05-13 1997-11-28 I C T:Kk プローブ針
US6066957A (en) 1997-09-11 2000-05-23 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
US6184460B1 (en) * 1998-02-27 2001-02-06 Berg Technology, Inc. Modular box shield for forming a coaxial header
US6037787A (en) 1998-03-24 2000-03-14 Teradyne, Inc. High performance probe interface for automatic test equipment
US6409550B1 (en) * 1999-11-15 2002-06-25 Mce/Weinschel Corporation Planar blind-mate connectors
US6447328B1 (en) * 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe

Also Published As

Publication number Publication date
WO2002073219A2 (en) 2002-09-19
DE60127589D1 (de) 2007-05-10
EP1722241A3 (de) 2007-07-25
EP1368665A2 (de) 2003-12-10
EP1722241A2 (de) 2006-11-15
JP2004523757A (ja) 2004-08-05
EP1368665B1 (de) 2007-03-28
WO2002073219A3 (en) 2003-01-03
JP5188000B2 (ja) 2013-04-24
US6551126B1 (en) 2003-04-22
DE60127589T2 (de) 2007-12-13
JP2012013713A (ja) 2012-01-19

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Legal Events

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