JPH0178029U - - Google Patents

Info

Publication number
JPH0178029U
JPH0178029U JP1987173633U JP17363387U JPH0178029U JP H0178029 U JPH0178029 U JP H0178029U JP 1987173633 U JP1987173633 U JP 1987173633U JP 17363387 U JP17363387 U JP 17363387U JP H0178029 U JPH0178029 U JP H0178029U
Authority
JP
Japan
Prior art keywords
contact probes
holes
holding member
connection device
terminal connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987173633U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987173633U priority Critical patent/JPH0178029U/ja
Priority to EP88310641A priority patent/EP0317191A3/en
Publication of JPH0178029U publication Critical patent/JPH0178029U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】
第１図及至第５図は本考案の第１の実施例に係
り、第１図は端子接続装置の斜視図、第２図は第
１図を補足説明する為の平面図、第３図は第２図
のＡ―Ａ′断面図、第４図は第１図を補足説明す
る為の部分詳細図、第５図は第１の実施例の金属
ハウジングの加工方法を説明する為の斜視図、第
６図は本考案の第２の実施例を示す斜視図、第７
図及び第８図は従来の実施例を示す図である。 ３０：金属ハウジング、３１，３２：コンタク
トプローブ、３３，３４：溝、３５：絶縁物、３
６：絶縁物の突起、３７，４１：プリント回路基
板、３８：位置決め用孔、３９：同軸ケーブル、
４２：ネジ孔、４３：固定用ネジ、５５，５６：
筒状貫通孔、５７，５８：ソケツト。

Claims (1)

  1. 【実用新案登録請求の範囲】 少なくとも一端が出入自在に突出するコンタク
    トプローブを複数個備え、前記各出入自在の先端
    はそれぞれ対応する端子に押圧されて信号を伝達
    する端子接続装置において、 前記複数のコンタクトプローブを保持する保持
    部材には、前記各コンタクトプローブと平行に沿
    う溝をそれぞれ前記保持部材の表面に有する複数
    の貫通孔が設けられ、前記各コンタクトプローブ
    は前記各貫通孔のほぼ中心に保持されていること
    を特徴とする端子接続装置。
JP1987173633U 1987-11-13 1987-11-13 Pending JPH0178029U (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1987173633U JPH0178029U (ja) 1987-11-13 1987-11-13
EP88310641A EP0317191A3 (en) 1987-11-13 1988-11-11 Terminal connection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987173633U JPH0178029U (ja) 1987-11-13 1987-11-13

Publications (1)

Publication Number Publication Date
JPH0178029U true JPH0178029U (ja) 1989-05-25

Family

ID=15964228

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987173633U Pending JPH0178029U (ja) 1987-11-13 1987-11-13

Country Status (2)

Country Link
EP (1) EP0317191A3 (ja)
JP (1) JPH0178029U (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02267831A (ja) * 1989-04-07 1990-11-01 Omron Corp 電気機器
JP2005537481A (ja) * 2002-08-29 2005-12-08 スリーエム イノベイティブ プロパティズ カンパニー 高密度プローブデバイス

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5625299A (en) * 1995-02-03 1997-04-29 Uhling; Thomas F. Multiple lead analog voltage probe with high signal integrity over a wide band width
CN1276260C (zh) * 1998-03-04 2006-09-20 泰拉丁公司 自动测试设备的同轴探头接口
US6037787A (en) * 1998-03-24 2000-03-14 Teradyne, Inc. High performance probe interface for automatic test equipment
US6551126B1 (en) * 2001-03-13 2003-04-22 3M Innovative Properties Company High bandwidth probe assembly
US6447328B1 (en) * 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe
US6964828B2 (en) 2001-04-27 2005-11-15 3M Innovative Properties Company Cathode compositions for lithium-ion batteries
US6824427B1 (en) 2003-05-13 2004-11-30 3M Innovative Properties Company Coaxial probe interconnection system

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU8336382A (en) * 1982-03-05 1983-10-18 Malloy, J.T. Bed-of-pins test fixture
JPS6177286A (ja) * 1984-09-21 1986-04-19 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 同軸ケーブル用インターフェース装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02267831A (ja) * 1989-04-07 1990-11-01 Omron Corp 電気機器
JP2005537481A (ja) * 2002-08-29 2005-12-08 スリーエム イノベイティブ プロパティズ カンパニー 高密度プローブデバイス

Also Published As

Publication number Publication date
EP0317191A3 (en) 1990-06-13
EP0317191A2 (en) 1989-05-24

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