JP5168168B2 - 屈折率測定装置 - Google Patents

屈折率測定装置 Download PDF

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Publication number
JP5168168B2
JP5168168B2 JP2009011530A JP2009011530A JP5168168B2 JP 5168168 B2 JP5168168 B2 JP 5168168B2 JP 2009011530 A JP2009011530 A JP 2009011530A JP 2009011530 A JP2009011530 A JP 2009011530A JP 5168168 B2 JP5168168 B2 JP 5168168B2
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JP
Japan
Prior art keywords
optical system
probe optical
light
probe
refractive index
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JP2009011530A
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English (en)
Japanese (ja)
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JP2010169496A5 (enExample
JP2010169496A (ja
Inventor
雄介 日下
洋平 武智
厚司 福井
誠司 濱野
和政 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
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Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP2009011530A priority Critical patent/JP5168168B2/ja
Priority to CN201080001377.9A priority patent/CN102007392B/zh
Priority to US12/990,547 priority patent/US8593624B2/en
Priority to PCT/JP2010/000311 priority patent/WO2010084748A1/ja
Publication of JP2010169496A publication Critical patent/JP2010169496A/ja
Publication of JP2010169496A5 publication Critical patent/JP2010169496A5/ja
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Publication of JP5168168B2 publication Critical patent/JP5168168B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2009011530A 2009-01-22 2009-01-22 屈折率測定装置 Expired - Fee Related JP5168168B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2009011530A JP5168168B2 (ja) 2009-01-22 2009-01-22 屈折率測定装置
CN201080001377.9A CN102007392B (zh) 2009-01-22 2010-01-21 折射率测定装置
US12/990,547 US8593624B2 (en) 2009-01-22 2010-01-21 Refractive index measuring apparatus
PCT/JP2010/000311 WO2010084748A1 (ja) 2009-01-22 2010-01-21 屈折率測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009011530A JP5168168B2 (ja) 2009-01-22 2009-01-22 屈折率測定装置

Publications (3)

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JP2010169496A JP2010169496A (ja) 2010-08-05
JP2010169496A5 JP2010169496A5 (enExample) 2011-08-18
JP5168168B2 true JP5168168B2 (ja) 2013-03-21

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Family Applications (1)

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JP2009011530A Expired - Fee Related JP5168168B2 (ja) 2009-01-22 2009-01-22 屈折率測定装置

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US (1) US8593624B2 (enExample)
JP (1) JP5168168B2 (enExample)
CN (1) CN102007392B (enExample)
WO (1) WO2010084748A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5603651B2 (ja) * 2010-05-13 2014-10-08 ナブテスコ株式会社 航空機アクチュエータの油圧装置
JP5503431B2 (ja) * 2010-06-30 2014-05-28 ナブテスコ株式会社 航空機アクチュエータの油圧システム
JP5666233B2 (ja) * 2010-10-08 2015-02-12 ナブテスコ株式会社 航空機アクチュエータの油圧装置
DE102012201410B4 (de) * 2012-02-01 2013-08-14 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage mit einer Messvorrichtung zum Vermessen eines optischen Elements
US10620118B2 (en) * 2012-02-27 2020-04-14 Steris Instrument Management Services, Inc. Systems and methods for identifying optical materials
CN102645319A (zh) * 2012-05-04 2012-08-22 中国科学院长春光学精密机械与物理研究所 一种模拟空间目标分离的旋转靶标及其应用方法
CN102928200B (zh) * 2012-10-22 2015-02-18 中国科学院上海光学精密机械研究所 干涉测量光学材料均匀性的方法
CN103335982B (zh) * 2013-06-21 2016-05-11 中国科学院上海光学精密机械研究所 利用波长调谐移相干涉仪测量平行平板光学均匀性的方法
JP6217748B2 (ja) * 2013-06-24 2017-10-25 株式会社島津製作所 屈折率測定装置
US9494410B2 (en) 2013-12-05 2016-11-15 National Taiwan University Method for measuring characteristics of sample
CN104198435B (zh) * 2014-09-16 2017-02-01 北京航空航天大学 一种基于调频连续波的光子带隙光纤群折射率测量装置及方法
JP2017003434A (ja) * 2015-06-10 2017-01-05 キヤノン株式会社 屈折率の計測方法、計測装置、光学素子の製造方法
DE102015211879B4 (de) * 2015-06-25 2018-10-18 Carl Zeiss Ag Vermessen von individuellen Daten einer Brille
CN108317962B (zh) * 2018-01-29 2020-04-07 哈尔滨工程大学 消除透射光的共光路自校准薄膜厚度与折射率的测量方法
CN111721776B (zh) * 2019-03-22 2024-02-20 住友化学株式会社 检查方法及检查装置
CN112082492B (zh) * 2020-09-04 2021-12-21 哈尔滨工程大学 具有角度监测的薄膜厚度与折射率同时测量的装置及方法
CN113188767B (zh) * 2021-04-25 2023-12-08 中国科学院西安光学精密机械研究所 紫外镜片反、透射率测试及紫外成像系统定标装置及方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06174430A (ja) * 1992-12-08 1994-06-24 Nikon Corp 中心厚測定方法およびそれに使用する装置
JP3264469B2 (ja) * 1993-12-07 2002-03-11 富士写真フイルム株式会社 光散乱媒体の屈折率分布情報の計測装置
US5469261A (en) * 1994-04-05 1995-11-21 Carl Zeiss, Inc. Measurement of lens characteristics
US5767971A (en) * 1994-12-20 1998-06-16 Nikon Corporation Apparatus for measuring refractive index of medium using light, displacement measuring system using the same apparatus, and direction-of-polarization rotating unit
JP3513566B2 (ja) * 1995-03-24 2004-03-31 独立行政法人産業技術総合研究所 光学的界面間寸法測定装置
JP4151159B2 (ja) * 1999-06-17 2008-09-17 松下電器産業株式会社 媒質の測定装置
JP3913407B2 (ja) 1999-07-09 2007-05-09 株式会社リコー 屈折率分布の測定装置及び方法
JP2003106934A (ja) * 2001-09-28 2003-04-09 Nikon Corp 光路長測定装置及び方法、厚さ測定装置及び方法、屈折率分布傾斜成分測定装置及び方法
JP4654003B2 (ja) * 2004-11-09 2011-03-16 株式会社栃木ニコン 測定装置
JP5022090B2 (ja) * 2006-05-16 2012-09-12 株式会社トプコン 屈折率測定用器具
CN101187631A (zh) * 2007-12-19 2008-05-28 山东大学 单轴晶体双折射率的测量方法

Also Published As

Publication number Publication date
WO2010084748A1 (ja) 2010-07-29
CN102007392A (zh) 2011-04-06
US20110051127A1 (en) 2011-03-03
CN102007392B (zh) 2013-01-16
JP2010169496A (ja) 2010-08-05
US8593624B2 (en) 2013-11-26

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