JP5163935B2 - イメージセンサ - Google Patents
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- JP5163935B2 JP5163935B2 JP2007132099A JP2007132099A JP5163935B2 JP 5163935 B2 JP5163935 B2 JP 5163935B2 JP 2007132099 A JP2007132099 A JP 2007132099A JP 2007132099 A JP2007132099 A JP 2007132099A JP 5163935 B2 JP5163935 B2 JP 5163935B2
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- 238000005096 rolling process Methods 0.000 claims description 6
- 238000010408 sweeping Methods 0.000 claims description 4
- 230000001276 controlling effect Effects 0.000 claims description 3
- 230000001105 regulatory effect Effects 0.000 claims description 3
- 230000000875 corresponding effect Effects 0.000 description 16
- 238000000034 method Methods 0.000 description 10
- 238000009825 accumulation Methods 0.000 description 7
- 239000004973 liquid crystal related substance Substances 0.000 description 7
- 230000006835 compression Effects 0.000 description 6
- 238000007906 compression Methods 0.000 description 6
- 238000003384 imaging method Methods 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 238000012546 transfer Methods 0.000 description 6
- 238000004364 calculation method Methods 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000006731 degradation reaction Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000000470 constituent Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 229920006395 saturated elastomer Polymers 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 2
- 238000007667 floating Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000009416 shuttering Methods 0.000 description 2
- 238000004040 coloring Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000003340 mental effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
- H04N25/443—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/53—Control of the integration time
- H04N25/531—Control of the integration time by controlling rolling shutters in CMOS SSIS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/53—Control of the integration time
- H04N25/532—Control of the integration time by controlling global shutters in CMOS SSIS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Studio Devices (AREA)
- Facsimile Heads (AREA)
Description
図6は、センサコントローラ16による電子シャッタ発生本数の制御の第1実施の形態を示している。
図8は、センサコントローラ16による電子シャッタ発生本数の制御の第2実施の形態を示している。
図9は、センサコントローラ16による電子シャッタ発生本数の制御の第3実施の形態を示している。
図10は、センサコントローラ16による電子シャッタ発生本数の制御の第4実施の形態を示している。
図11は、センサコントローラ16による電子シャッタ発生本数の制御の第5実施の形態を示している。
Claims (8)
- 画素が垂直方向と水平方向に2次元配列されている画素アレイ部を有し、ローリングシャッタ方式により各画素の露光時間を制御するイメージセンサにおいて、
各画素において電荷読み出しに対応して実行される、露光を規定する電子シャッタである露光規定シャッタの、1水平走査期間ごとの画素アレイ部の垂直方向のアドレスの移動量がアドレス加算量(P1,P2,P3,・・・,PN)の繰り返しとして表されるとき、前記アドレス加算量(P1,P2,P3,・・・,PN)を取得する取得手段と、
1水平走査期間に同時に電子シャッタを行う行数である、1水平走査期間の電子シャッタ発生本数を、取得された前記アドレス加算量(P1,P2,P3,・・・,PN)を用いて、P1+P2,P2+P3,P3+P4,・・・,PN-1+PN,PN+P1それぞれの絶対値の最大値Rの半分以上の値に決定し、いずれの1水平走査期間においても、決定された前記値となるように制御する制御手段と
を備えるイメージセンサ。 - 前記制御手段は、さらに、前記露光規定シャッタの対象行から、1行飛ばしの飛び飛びの垂直方向のアドレスの行に対して電子シャッタが行われるように制御する
請求項1に記載のイメージセンサ。 - 前記制御手段は、前記露光規定シャッタの対象行から(R+2)/2個の1行飛ばしの飛び飛びの垂直方向のアドレスの行に対して電子シャッタが行われるように制御する
請求項2に記載のイメージセンサ。 - 前記制御手段は、1フレームに相当する期間に発生する電子シャッタの回数が、垂直方向の各行で同一の前記値となるように制御する
請求項1に記載のイメージセンサ。 - 前記制御手段は、前記アドレス加算量(P1,P2,P3,・・・,PN)に従い垂直方向または水平方向の画素数を間引いた間引き画像を生成する場合、アドレス加算量P1,P2,P3,・・・,PNそれぞれの絶対値の最大値Q個以上の値に、前記1水平走査期間の電子シャッタ発生本数を決定するモードも有する
請求項1に記載のイメージセンサ。 - 前記制御手段は、さらに、前記露光規定シャッタの対象行から、決定された前記1水平走査期間の電子シャッタ発生本数だけ連続した垂直方向のアドレスの行に対して電子シャッタが行われるように制御する
請求項5に記載のイメージセンサ。 - 前記制御手段は、前記露光規定シャッタの対象行からQ+2個の連続した垂直方向のアドレスの行に対して電子シャッタが行われるように制御する
請求項6に記載のイメージセンサ。 - 行われる前記電子シャッタには、前記露光規定シャッタの前に、不要電荷の掃き出し動作であるプレシャッタが含まれる
請求項3または7に記載のイメージセンサ。
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007132099A JP5163935B2 (ja) | 2007-05-17 | 2007-05-17 | イメージセンサ |
TW097114934A TWI364983B (en) | 2007-05-17 | 2008-04-23 | Image sensor, electronic apparatus, and driving method of electronic apparatus |
US12/119,825 US8031246B2 (en) | 2007-05-17 | 2008-05-13 | Image sensor, electronic apparatus, and driving method of electronic apparatus |
KR1020080045494A KR101473275B1 (ko) | 2007-05-17 | 2008-05-16 | 이미지 센서, 전자 기기, 및 전자 기기의 구동 방법 |
CN2008100971575A CN101309346B (zh) | 2007-05-17 | 2008-05-19 | 图像传感器、电子装置和电子装置的驱动方法 |
CN2010102752512A CN101931760B (zh) | 2007-05-17 | 2008-05-19 | 图像传感器和电子装置的驱动方法 |
US13/100,664 US8767104B2 (en) | 2007-05-17 | 2011-05-04 | Image sensor, electronic apparatus, and driving method of electronic apparatus |
US14/219,406 US9001244B2 (en) | 2007-05-17 | 2014-03-19 | Image sensor, electronic apparatus, and driving method of electronic apparatus |
US14/611,801 US9628729B2 (en) | 2007-05-17 | 2015-02-02 | Image sensor, electronic apparatus, and driving method of electronic apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007132099A JP5163935B2 (ja) | 2007-05-17 | 2007-05-17 | イメージセンサ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008288904A JP2008288904A (ja) | 2008-11-27 |
JP5163935B2 true JP5163935B2 (ja) | 2013-03-13 |
Family
ID=40027084
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007132099A Expired - Fee Related JP5163935B2 (ja) | 2007-05-17 | 2007-05-17 | イメージセンサ |
Country Status (5)
Country | Link |
---|---|
US (4) | US8031246B2 (ja) |
JP (1) | JP5163935B2 (ja) |
KR (1) | KR101473275B1 (ja) |
CN (2) | CN101309346B (ja) |
TW (1) | TWI364983B (ja) |
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Also Published As
Publication number | Publication date |
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TWI364983B (en) | 2012-05-21 |
US20140204254A1 (en) | 2014-07-24 |
TW200908718A (en) | 2009-02-16 |
CN101309346A (zh) | 2008-11-19 |
US9001244B2 (en) | 2015-04-07 |
US8031246B2 (en) | 2011-10-04 |
CN101931760B (zh) | 2013-02-13 |
CN101931760A (zh) | 2010-12-29 |
US20150146059A1 (en) | 2015-05-28 |
KR20080101766A (ko) | 2008-11-21 |
US20110205415A1 (en) | 2011-08-25 |
US9628729B2 (en) | 2017-04-18 |
KR101473275B1 (ko) | 2014-12-16 |
JP2008288904A (ja) | 2008-11-27 |
US20080284884A1 (en) | 2008-11-20 |
US8767104B2 (en) | 2014-07-01 |
CN101309346B (zh) | 2010-12-01 |
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