JP5111094B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP5111094B2
JP5111094B2 JP2007334250A JP2007334250A JP5111094B2 JP 5111094 B2 JP5111094 B2 JP 5111094B2 JP 2007334250 A JP2007334250 A JP 2007334250A JP 2007334250 A JP2007334250 A JP 2007334250A JP 5111094 B2 JP5111094 B2 JP 5111094B2
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Japan
Prior art keywords
conductive film
chip
film
antenna
substrate
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Expired - Fee Related
Application number
JP2007334250A
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English (en)
Japanese (ja)
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JP2008181502A (ja
JP2008181502A5 (enExample
Inventor
真 柳澤
貴章 高縁
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2007334250A priority Critical patent/JP5111094B2/ja
Publication of JP2008181502A publication Critical patent/JP2008181502A/ja
Publication of JP2008181502A5 publication Critical patent/JP2008181502A5/ja
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Publication of JP5111094B2 publication Critical patent/JP5111094B2/ja
Expired - Fee Related legal-status Critical Current
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  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
JP2007334250A 2006-12-27 2007-12-26 半導体装置 Expired - Fee Related JP5111094B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007334250A JP5111094B2 (ja) 2006-12-27 2007-12-26 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006351402 2006-12-27
JP2006351402 2006-12-27
JP2007334250A JP5111094B2 (ja) 2006-12-27 2007-12-26 半導体装置

Publications (3)

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JP2008181502A JP2008181502A (ja) 2008-08-07
JP2008181502A5 JP2008181502A5 (enExample) 2011-01-20
JP5111094B2 true JP5111094B2 (ja) 2012-12-26

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Family Applications (1)

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JP2007334250A Expired - Fee Related JP5111094B2 (ja) 2006-12-27 2007-12-26 半導体装置

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JP (1) JP5111094B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220011357A1 (en) * 2006-11-16 2022-01-13 Semiconductor Energy Laboratory Co., Ltd. Radio field intensity measurement device, and radio field intensity detector and game console using the same

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010035627A1 (en) * 2008-09-25 2010-04-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP4340717B1 (ja) * 2008-12-08 2009-10-07 義幸 梶野 アンテナ装置及びアンテナ装置付きの家具
JP2020005170A (ja) * 2018-06-29 2020-01-09 共同印刷株式会社 無線装置及び通信方法
JP7565929B2 (ja) * 2019-01-17 2024-10-11 フライセンス リミテッド 電子タグ
GB202010923D0 (en) 2020-07-15 2020-08-26 Frisense Ltd Electronic tag

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08138018A (ja) * 1994-11-10 1996-05-31 Rikagaku Kenkyusho データ・キャリア・システム
US6107920A (en) * 1998-06-09 2000-08-22 Motorola, Inc. Radio frequency identification tag having an article integrated antenna
JP2000057287A (ja) * 1998-08-10 2000-02-25 Sony Corp 非接触式データキャリア
FI112550B (fi) * 2001-05-31 2003-12-15 Rafsec Oy Älytarra ja älytarraraina
JP2003309490A (ja) * 2002-04-12 2003-10-31 Yuji Nishi Ｒｆｉｄ装置
JP4236974B2 (ja) * 2003-03-28 2009-03-11 トッパン・フォームズ株式会社 非接触型情報記録媒体
JP2007150868A (ja) * 2005-11-29 2007-06-14 Renesas Technology Corp 電子装置およびその製造方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220011357A1 (en) * 2006-11-16 2022-01-13 Semiconductor Energy Laboratory Co., Ltd. Radio field intensity measurement device, and radio field intensity detector and game console using the same
US11656258B2 (en) * 2006-11-16 2023-05-23 Semiconductor Energy Laboratory Co., Ltd. Radio field intensity measurement device, and radio field intensity detector and game console using the same

Also Published As

Publication number Publication date
JP2008181502A (ja) 2008-08-07

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