JP5111094B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

Info

Publication number
JP5111094B2
JP5111094B2 JP2007334250A JP2007334250A JP5111094B2 JP 5111094 B2 JP5111094 B2 JP 5111094B2 JP 2007334250 A JP2007334250 A JP 2007334250A JP 2007334250 A JP2007334250 A JP 2007334250A JP 5111094 B2 JP5111094 B2 JP 5111094B2
Authority
JP
Japan
Prior art keywords
conductive film
chip
film
antenna
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007334250A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008181502A (ja
JP2008181502A5 (enrdf_load_stackoverflow
Inventor
真 柳澤
貴章 高縁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2007334250A priority Critical patent/JP5111094B2/ja
Publication of JP2008181502A publication Critical patent/JP2008181502A/ja
Publication of JP2008181502A5 publication Critical patent/JP2008181502A5/ja
Application granted granted Critical
Publication of JP5111094B2 publication Critical patent/JP5111094B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
JP2007334250A 2006-12-27 2007-12-26 半導体装置 Expired - Fee Related JP5111094B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007334250A JP5111094B2 (ja) 2006-12-27 2007-12-26 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006351402 2006-12-27
JP2006351402 2006-12-27
JP2007334250A JP5111094B2 (ja) 2006-12-27 2007-12-26 半導体装置

Publications (3)

Publication Number Publication Date
JP2008181502A JP2008181502A (ja) 2008-08-07
JP2008181502A5 JP2008181502A5 (enrdf_load_stackoverflow) 2011-01-20
JP5111094B2 true JP5111094B2 (ja) 2012-12-26

Family

ID=39725322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007334250A Expired - Fee Related JP5111094B2 (ja) 2006-12-27 2007-12-26 半導体装置

Country Status (1)

Country Link
JP (1) JP5111094B2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220011357A1 (en) * 2006-11-16 2022-01-13 Semiconductor Energy Laboratory Co., Ltd. Radio field intensity measurement device, and radio field intensity detector and game console using the same

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010035627A1 (en) * 2008-09-25 2010-04-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP4340717B1 (ja) * 2008-12-08 2009-10-07 義幸 梶野 アンテナ装置及びアンテナ装置付きの家具
JP2020005170A (ja) * 2018-06-29 2020-01-09 共同印刷株式会社 無線装置及び通信方法
WO2020148550A1 (en) * 2019-01-17 2020-07-23 Frisense Limited Electronic tag
GB202010923D0 (en) 2020-07-15 2020-08-26 Frisense Ltd Electronic tag

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08138018A (ja) * 1994-11-10 1996-05-31 Rikagaku Kenkyusho データ・キャリア・システム
US6107920A (en) * 1998-06-09 2000-08-22 Motorola, Inc. Radio frequency identification tag having an article integrated antenna
JP2000057287A (ja) * 1998-08-10 2000-02-25 Sony Corp 非接触式データキャリア
FI112550B (fi) * 2001-05-31 2003-12-15 Rafsec Oy Älytarra ja älytarraraina
JP2003309490A (ja) * 2002-04-12 2003-10-31 Yuji Nishi Ｒｆｉｄ装置
JP4236974B2 (ja) * 2003-03-28 2009-03-11 トッパン・フォームズ株式会社 非接触型情報記録媒体
JP2007150868A (ja) * 2005-11-29 2007-06-14 Renesas Technology Corp 電子装置およびその製造方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220011357A1 (en) * 2006-11-16 2022-01-13 Semiconductor Energy Laboratory Co., Ltd. Radio field intensity measurement device, and radio field intensity detector and game console using the same
US11656258B2 (en) * 2006-11-16 2023-05-23 Semiconductor Energy Laboratory Co., Ltd. Radio field intensity measurement device, and radio field intensity detector and game console using the same

Also Published As

Publication number Publication date
JP2008181502A (ja) 2008-08-07

Similar Documents

Publication Publication Date Title
JP5184872B2 (ja) 半導体装置
JP4944745B2 (ja) アンテナ及び当該アンテナを有する半導体装置
US8816484B2 (en) Semiconductor device
US7683838B2 (en) Semiconductor device
US8232880B2 (en) Semiconductor device
CN101189625B (zh) 半导体器件及其制造方法以及天线的制造方法
JP5422138B2 (ja) 半導体装置の作製方法
JP5389582B2 (ja) 半導体装置
JP4827618B2 (ja) アンテナの作製方法、半導体装置の作製方法
JP5583248B2 (ja) 半導体装置
JP5322408B2 (ja) 半導体装置及びその作製方法
US8232181B2 (en) Manufacturing method of semiconductor device
JP5236243B2 (ja) Ｒｆタグ
JP5111094B2 (ja) 半導体装置
JP5089033B2 (ja) 半導体装置の作製方法
JP5041787B2 (ja) 圧着方法及び半導体装置の作製方法
JP2008103706A (ja) 半導体装置
JP4908936B2 (ja) 半導体装置の作製方法
JP5105918B2 (ja) 半導体装置の作製方法
KR20080074800A (ko) 반도체 장치

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101130

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20101130

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120720

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120731

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120905

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20121002

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20121009

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20151019

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 5111094

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20151019

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees