JP5053479B2 - マトリクスアレイ基板及びその製造方法 - Google Patents
マトリクスアレイ基板及びその製造方法 Download PDFInfo
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- JP5053479B2 JP5053479B2 JP2000280270A JP2000280270A JP5053479B2 JP 5053479 B2 JP5053479 B2 JP 5053479B2 JP 2000280270 A JP2000280270 A JP 2000280270A JP 2000280270 A JP2000280270 A JP 2000280270A JP 5053479 B2 JP5053479 B2 JP 5053479B2
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- 239000000758 substrate Substances 0.000 title claims description 66
- 239000011159 matrix material Substances 0.000 title claims description 22
- 238000004519 manufacturing process Methods 0.000 title claims description 4
- 238000007689 inspection Methods 0.000 claims description 66
- 230000002093 peripheral effect Effects 0.000 claims description 24
- 239000002184 metal Substances 0.000 claims description 11
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 17
- 239000010410 layer Substances 0.000 description 10
- 239000010408 film Substances 0.000 description 7
- 239000011521 glass Substances 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
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- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 210000002858 crystal cell Anatomy 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009616 inductively coupled plasma Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000009740 moulding (composite fabrication) Methods 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 235000010384 tocopherol Nutrition 0.000 description 1
- 235000019731 tricalcium phosphate Nutrition 0.000 description 1
Images
Landscapes
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000280270A JP5053479B2 (ja) | 2000-09-14 | 2000-09-14 | マトリクスアレイ基板及びその製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000280270A JP5053479B2 (ja) | 2000-09-14 | 2000-09-14 | マトリクスアレイ基板及びその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002090424A JP2002090424A (ja) | 2002-03-27 |
| JP2002090424A5 JP2002090424A5 (enExample) | 2007-10-11 |
| JP5053479B2 true JP5053479B2 (ja) | 2012-10-17 |
Family
ID=18765144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000280270A Expired - Fee Related JP5053479B2 (ja) | 2000-09-14 | 2000-09-14 | マトリクスアレイ基板及びその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5053479B2 (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100900537B1 (ko) * | 2002-08-23 | 2009-06-02 | 삼성전자주식회사 | 액정 표시 장치, 그 검사 방법 및 제조 방법 |
| KR100895311B1 (ko) * | 2002-11-19 | 2009-05-07 | 삼성전자주식회사 | 액정 표시 장치 및 그 검사 방법 |
| KR100479525B1 (ko) * | 2002-12-31 | 2005-03-31 | 엘지.필립스 엘시디 주식회사 | 다수의 어레이셀을 포함하는 액정표시장치용 기판 및 이의 제조방법 |
| JP3964337B2 (ja) * | 2003-03-07 | 2007-08-22 | 三菱電機株式会社 | 画像表示装置 |
| JP2004317885A (ja) * | 2003-04-17 | 2004-11-11 | Sharp Corp | 表示パネル形成板及び表示パネル |
| JP4483224B2 (ja) * | 2003-08-08 | 2010-06-16 | セイコーエプソン株式会社 | 電気光学パネル、電気光学装置、及び電子機器 |
| KR100828294B1 (ko) | 2004-04-29 | 2008-05-07 | 엘지디스플레이 주식회사 | 액정표시장치용 기판 및 이를 이용한 액정표시장치 제조방법 |
| JP2006038988A (ja) * | 2004-07-23 | 2006-02-09 | Seiko Epson Corp | 電気光学装置、電子機器、および実装構造体 |
| JP4476737B2 (ja) * | 2004-08-06 | 2010-06-09 | 東芝モバイルディスプレイ株式会社 | 表示装置、表示装置の検査方法、及び、表示装置の検査装置 |
| KR101051009B1 (ko) * | 2004-09-07 | 2011-07-21 | 삼성전자주식회사 | 표시기판 및 이의 제조 방법 |
| JP2006091239A (ja) | 2004-09-22 | 2006-04-06 | Seiko Epson Corp | 電気光学装置用基板及び電気光学装置、並びに検査方法 |
| US7342579B2 (en) | 2004-10-11 | 2008-03-11 | Chunghwa Picture Tubes, Ltd. | Thin film transistor array plate, liquid crystal display panel and method of preventing electrostatic discharge |
| JP2006267416A (ja) * | 2005-03-23 | 2006-10-05 | Victor Co Of Japan Ltd | アクティブマトリクス基板の検査方法 |
| JP4964444B2 (ja) * | 2005-08-31 | 2012-06-27 | 京セラディスプレイ株式会社 | 表示素子の製造方法 |
| KR100916914B1 (ko) | 2008-04-25 | 2009-09-09 | 삼성모바일디스플레이주식회사 | 유기전계발광 표시장치 |
| US8502227B2 (en) | 2008-07-23 | 2013-08-06 | Sharp Kabushiki Kaisha | Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device |
| CN102540508B (zh) * | 2010-12-30 | 2015-02-04 | 上海天马微电子有限公司 | 液晶显示装置的线路检测结构及检测方法 |
| WO2013011911A1 (ja) * | 2011-07-19 | 2013-01-24 | シャープ株式会社 | 素子基板の製造方法 |
| JP6370057B2 (ja) * | 2014-02-20 | 2018-08-08 | 三菱電機株式会社 | アレイ基板およびアレイ基板の検査方法 |
| JP2019191403A (ja) * | 2018-04-26 | 2019-10-31 | シャープ株式会社 | 配線基板及び表示パネル |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0394223A (ja) * | 1989-09-07 | 1991-04-19 | Sharp Corp | アクティブマトリクス表示装置の製造方法 |
| JP2758105B2 (ja) * | 1992-04-28 | 1998-05-28 | シャープ株式会社 | アクティブマトリクス基板の検査方法及び検査装置 |
| JP2834935B2 (ja) * | 1992-06-11 | 1998-12-14 | シャープ株式会社 | アクティブマトリクス型表示素子及びその製造方法 |
| JP3213472B2 (ja) * | 1994-04-26 | 2001-10-02 | シャープ株式会社 | アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置 |
| JP2776349B2 (ja) * | 1995-11-10 | 1998-07-16 | 日本電気株式会社 | 液晶表示装置の検査方法 |
| JPH10177184A (ja) * | 1996-12-17 | 1998-06-30 | Sharp Corp | 液晶表示パネルの製造装置 |
-
2000
- 2000-09-14 JP JP2000280270A patent/JP5053479B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2002090424A (ja) | 2002-03-27 |
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