JP5001899B2 - 放射線測定装置 - Google Patents
放射線測定装置 Download PDFInfo
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- JP5001899B2 JP5001899B2 JP2008119495A JP2008119495A JP5001899B2 JP 5001899 B2 JP5001899 B2 JP 5001899B2 JP 2008119495 A JP2008119495 A JP 2008119495A JP 2008119495 A JP2008119495 A JP 2008119495A JP 5001899 B2 JP5001899 B2 JP 5001899B2
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- 230000005855 radiation Effects 0.000 title claims description 67
- 238000005259 measurement Methods 0.000 title claims description 49
- 238000001514 detection method Methods 0.000 claims description 9
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 description 7
- 230000010354 integration Effects 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 4
- 230000002123 temporal effect Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000011109 contamination Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
- G01T1/171—Compensation of dead-time counting losses
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
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- Spectroscopy & Molecular Physics (AREA)
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Description
Claims (4)
- 測定対象から放射される放射線を検出して検出信号を得る放射線検出部と、
検出信号に基づいて放射線の量を反映させた測定値を算出する測定値算出部と、
算出された測定値を表示する測定値表示部と、
を有し、
仮の時定数T1を用いて得られる測定値D1と時定数T1よりも大きい仮の時定数T2を用いて得られる測定値D2との差が、予め設定された許容値の範囲内となる場合に、放射線の量が時間的に安定していると判断して、真の時定数として比較的大きな大時定数を選択し、
前記測定値D1と測定値D2との差が、連続的に前記許容値の範囲外となる場合に、放射線の量が時間的に変動していると判断して、前記仮の時定数T1よりも小さい仮の時定数T3を用いて得られる測定値D3に基づいて、前記真の時定数として、前記大時定数よりも小さい時定数を選択する、
ことを特徴とする放射線測定装置。 - 請求項1に記載の放射線測定装置において、
放射線の量が時間的に変動していると判断した場合に、前記測定値D3の大きさに応じて複数の候補値の中から前記小さい時定数を選択する、
ことを特徴とする放射線測定装置。 - 請求項2に記載の放射線測定装置において、
前記測定値D3の大きさと選択される前記各候補値とを対応付けた選択条件を、放射線の量が時間的に増加している場合と減少している場合において互いに異ならせる、
ことを特徴とする放射線測定装置。 - 請求項1から3のいずれか1項に記載の放射線測定装置において、
前記測定値表示部は、真の時定数を用いて得られる最新の測定値を表示し、さらに、真の時定数を用いて得られる最新の測定値と前回の測定値との差を表示する、
ことを特徴とする放射線測定装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008119495A JP5001899B2 (ja) | 2008-05-01 | 2008-05-01 | 放射線測定装置 |
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JP2008119495A JP5001899B2 (ja) | 2008-05-01 | 2008-05-01 | 放射線測定装置 |
Publications (2)
Publication Number | Publication Date |
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JP2009270850A JP2009270850A (ja) | 2009-11-19 |
JP5001899B2 true JP5001899B2 (ja) | 2012-08-15 |
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JP2008119495A Active JP5001899B2 (ja) | 2008-05-01 | 2008-05-01 | 放射線測定装置 |
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JP (1) | JP5001899B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5681765B2 (ja) | 2013-07-23 | 2015-03-11 | 日立アロカメディカル株式会社 | 放射線測定装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS626544Y2 (ja) * | 1981-03-14 | 1987-02-14 | ||
US4670891A (en) * | 1985-03-06 | 1987-06-02 | Westinghouse Electric Corp. | Storage of data in compressed form |
JPS63128281A (ja) * | 1986-11-19 | 1988-05-31 | Nippon Atom Ind Group Co Ltd | サ−ベイメ−タ |
JPH0335191A (ja) * | 1989-06-30 | 1991-02-15 | Toshiba Corp | 放射線モニタ装置 |
JP2815978B2 (ja) * | 1990-05-25 | 1998-10-27 | 株式会社東芝 | 放射線測定装置 |
JP3311123B2 (ja) * | 1993-12-03 | 2002-08-05 | アロカ株式会社 | 放射性表面汚染計 |
JP3207310B2 (ja) * | 1993-12-24 | 2001-09-10 | アロカ株式会社 | 放射線測定器 |
JP3807652B2 (ja) * | 1999-03-08 | 2006-08-09 | 独立行政法人放射線医学総合研究所 | 放射線測定装置及び方法 |
JP4455312B2 (ja) * | 2004-12-24 | 2010-04-21 | 株式会社東芝 | 表面汚染検査装置およびその検査方法 |
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2008
- 2008-05-01 JP JP2008119495A patent/JP5001899B2/ja active Active
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