JP4940064B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP4940064B2
JP4940064B2 JP2007221199A JP2007221199A JP4940064B2 JP 4940064 B2 JP4940064 B2 JP 4940064B2 JP 2007221199 A JP2007221199 A JP 2007221199A JP 2007221199 A JP2007221199 A JP 2007221199A JP 4940064 B2 JP4940064 B2 JP 4940064B2
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JP
Japan
Prior art keywords
chip
semiconductor chip
circuit
analog
driver
Prior art date
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Active
Application number
JP2007221199A
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English (en)
Japanese (ja)
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JP2009054850A (ja
JP2009054850A5 (https=
Inventor
信也 小池
真也 永田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics Corp
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Priority to JP2007221199A priority Critical patent/JP4940064B2/ja
Priority to US12/197,938 priority patent/US8362626B2/en
Publication of JP2009054850A publication Critical patent/JP2009054850A/ja
Publication of JP2009054850A5 publication Critical patent/JP2009054850A5/ja
Application granted granted Critical
Publication of JP4940064B2 publication Critical patent/JP4940064B2/ja
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/811Multiple chips on leadframes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/70Fillings or auxiliary members in containers or in encapsulations for thermal protection or control
    • H10W40/77Auxiliary members characterised by their shape
    • H10W40/778Auxiliary members characterised by their shape in encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5445Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5449Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/551Materials of bond wires
    • H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5522Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/551Materials of bond wires
    • H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5524Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/874On different surfaces
    • H10W72/884Die-attach connectors and bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/931Shapes of bond pads
    • H10W72/932Plan-view shape, i.e. in top view
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/732Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/736Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked lead frame, conducting package substrate or heat sink
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/752Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between stacked chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/753Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Lead Frames For Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2007221199A 2007-08-28 2007-08-28 半導体装置 Active JP4940064B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007221199A JP4940064B2 (ja) 2007-08-28 2007-08-28 半導体装置
US12/197,938 US8362626B2 (en) 2007-08-28 2008-08-25 Semiconductor device with non-overlapped circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007221199A JP4940064B2 (ja) 2007-08-28 2007-08-28 半導体装置

Publications (3)

Publication Number Publication Date
JP2009054850A JP2009054850A (ja) 2009-03-12
JP2009054850A5 JP2009054850A5 (https=) 2010-10-07
JP4940064B2 true JP4940064B2 (ja) 2012-05-30

Family

ID=40406166

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007221199A Active JP4940064B2 (ja) 2007-08-28 2007-08-28 半導体装置

Country Status (2)

Country Link
US (1) US8362626B2 (https=)
JP (1) JP4940064B2 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9105462B2 (en) 2013-03-01 2015-08-11 Kabushiki Kaisha Toshiba Semiconductor apparatus
US9312236B2 (en) 2013-03-01 2016-04-12 Kabushiki Kaisha Toshiba Semiconductor device, wireless device, and storage device

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101505551B1 (ko) * 2007-11-30 2015-03-25 페어차일드코리아반도체 주식회사 온도 감지소자가 장착된 반도체 파워 모듈 패키지 및 그제조방법
JP5405785B2 (ja) * 2008-09-19 2014-02-05 ルネサスエレクトロニクス株式会社 半導体装置
JP5685898B2 (ja) * 2010-01-08 2015-03-18 ソニー株式会社 半導体装置、固体撮像装置、およびカメラシステム
KR20120024099A (ko) * 2010-09-06 2012-03-14 삼성전자주식회사 멀티-칩 패키지 및 그의 제조 방법
TW201320263A (zh) * 2011-11-11 2013-05-16 南茂科技股份有限公司 加強散熱的封裝結構
WO2013080426A1 (ja) 2011-12-01 2013-06-06 パナソニック株式会社 熱を考慮した構造を持つ集積回路装置、三次元集積回路、三次元プロセッサ装置、及びプロセススケジューラ
US10461799B2 (en) * 2012-11-08 2019-10-29 Taiwan Semiconductor Manufacturing Company, Ltd. Integrated transmitter and receiver front end module, transceiver, and related method
JP6293562B2 (ja) * 2014-04-17 2018-03-14 株式会社不二工機 圧力センサ
WO2016007188A1 (en) 2014-07-07 2016-01-14 Bayer Healthcare Llc Improved device pairing taking into account at least one condition
JP6420617B2 (ja) 2014-09-30 2018-11-07 ルネサスエレクトロニクス株式会社 半導体装置
US10049969B1 (en) * 2017-06-16 2018-08-14 Allegro Microsystems, Llc Integrated circuit
JP6996385B2 (ja) * 2018-03-28 2022-01-17 住友電気工業株式会社 増幅器
DE102020106492A1 (de) * 2019-04-12 2020-10-15 Infineon Technologies Ag Chip -package, verfahren zum bilden eines chip -packages, halbleitervorrichtung, halbleiteranordnung, dreiphasensystem, verfahren zum bilden einer halbleitervorrichtung und verfahren zum bilden einer halbleiteranordnung
US11335383B2 (en) 2019-05-31 2022-05-17 Micron Technology, Inc. Memory component for a system-on-chip device
US11379398B2 (en) * 2019-06-04 2022-07-05 Microchip Technology Incorporated Virtual ports for connecting core independent peripherals
JP7574637B2 (ja) * 2020-12-18 2024-10-29 株式会社村田製作所 半導体装置及び半導体モジュール
CN116341461A (zh) * 2022-12-13 2023-06-27 湖北久之洋信息科技有限公司 一种模拟图像信号采集sip芯片

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DE3786314D1 (de) * 1986-09-23 1993-07-29 Siemens Ag Halbleiterbauelemente mit leistungs-mosfet und steuerschaltung.
US5644167A (en) * 1996-03-01 1997-07-01 National Semiconductor Corporation Integrated circuit package assemblies including an electrostatic discharge interposer
EP0890989A4 (en) * 1997-01-24 2006-11-02 Rohm Co Ltd SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD
JP3371240B2 (ja) 1997-12-02 2003-01-27 ローム株式会社 樹脂パッケージ型半導体装置
JP3737333B2 (ja) * 2000-03-17 2006-01-18 沖電気工業株式会社 半導体装置
US6472747B2 (en) * 2001-03-02 2002-10-29 Qualcomm Incorporated Mixed analog and digital integrated circuits
JP2003031736A (ja) * 2001-07-13 2003-01-31 Hitachi Ltd 半導体装置およびその製造方法
JP2003133512A (ja) * 2002-08-12 2003-05-09 Rohm Co Ltd 樹脂パッケージ型半導体装置
JP2004165269A (ja) * 2002-11-11 2004-06-10 Canon Inc 積層形半導体装置
JP2004296613A (ja) * 2003-03-26 2004-10-21 Renesas Technology Corp 半導体装置
JP4366472B2 (ja) * 2003-11-19 2009-11-18 Okiセミコンダクタ株式会社 半導体装置
TWI307830B (en) * 2005-03-25 2009-03-21 Delta Electronics Inc Heat dissipation device
JP4748648B2 (ja) * 2005-03-31 2011-08-17 ルネサスエレクトロニクス株式会社 半導体装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9105462B2 (en) 2013-03-01 2015-08-11 Kabushiki Kaisha Toshiba Semiconductor apparatus
US9312236B2 (en) 2013-03-01 2016-04-12 Kabushiki Kaisha Toshiba Semiconductor device, wireless device, and storage device

Also Published As

Publication number Publication date
JP2009054850A (ja) 2009-03-12
US8362626B2 (en) 2013-01-29
US20090057915A1 (en) 2009-03-05

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