JP4898522B2 - 撮像装置、放射線撮像システム、及び、撮像装置の制御方法 - Google Patents

撮像装置、放射線撮像システム、及び、撮像装置の制御方法 Download PDF

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Publication number
JP4898522B2
JP4898522B2 JP2007092029A JP2007092029A JP4898522B2 JP 4898522 B2 JP4898522 B2 JP 4898522B2 JP 2007092029 A JP2007092029 A JP 2007092029A JP 2007092029 A JP2007092029 A JP 2007092029A JP 4898522 B2 JP4898522 B2 JP 4898522B2
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JP
Japan
Prior art keywords
power supply
supply voltage
imaging apparatus
amplifier
amplifier circuit
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Expired - Fee Related
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JP2007092029A
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English (en)
Japanese (ja)
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JP2007312361A5 (enExample
JP2007312361A (ja
Inventor
登志男 亀島
忠夫 遠藤
朋之 八木
克郎 竹中
啓吾 横山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2007092029A priority Critical patent/JP4898522B2/ja
Priority to US11/737,592 priority patent/US7595831B2/en
Priority to EP07106640.1A priority patent/EP1848198B1/en
Publication of JP2007312361A publication Critical patent/JP2007312361A/ja
Publication of JP2007312361A5 publication Critical patent/JP2007312361A5/ja
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70Circuitry for compensating brightness variation in the scene
    • H04N23/76Circuitry for compensating brightness variation in the scene by influencing the image signals
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/709Circuitry for control of the power supply
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/191Photoconductor image sensors
    • H10F39/195X-ray, gamma-ray or corpuscular radiation imagers

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
JP2007092029A 2006-04-21 2007-03-30 撮像装置、放射線撮像システム、及び、撮像装置の制御方法 Expired - Fee Related JP4898522B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2007092029A JP4898522B2 (ja) 2006-04-21 2007-03-30 撮像装置、放射線撮像システム、及び、撮像装置の制御方法
US11/737,592 US7595831B2 (en) 2006-04-21 2007-04-19 Imaging apparatus, radiation imaging apparatus, and radiation imaging system
EP07106640.1A EP1848198B1 (en) 2006-04-21 2007-04-20 Imaging apparartus and radiation imaging system

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006118325 2006-04-21
JP2006118325 2006-04-21
JP2007092029A JP4898522B2 (ja) 2006-04-21 2007-03-30 撮像装置、放射線撮像システム、及び、撮像装置の制御方法

Publications (3)

Publication Number Publication Date
JP2007312361A JP2007312361A (ja) 2007-11-29
JP2007312361A5 JP2007312361A5 (enExample) 2011-10-20
JP4898522B2 true JP4898522B2 (ja) 2012-03-14

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JP2007092029A Expired - Fee Related JP4898522B2 (ja) 2006-04-21 2007-03-30 撮像装置、放射線撮像システム、及び、撮像装置の制御方法

Country Status (3)

Country Link
US (1) US7595831B2 (enExample)
EP (1) EP1848198B1 (enExample)
JP (1) JP4898522B2 (enExample)

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JP4818018B2 (ja) * 2006-08-01 2011-11-16 キヤノン株式会社 光電変換装置及びそれを用いた撮像システム
US7787402B2 (en) * 2006-08-18 2010-08-31 Wifi Rail, Inc. System and method of authenticating mobile devices
JP5008587B2 (ja) * 2008-02-29 2012-08-22 富士フイルム株式会社 検出信号処理装置
TWI363290B (en) * 2008-10-29 2012-05-01 Myson Century Inc Signal conversion control circuit for touch screen and method thereof
WO2011111549A1 (en) 2010-03-08 2011-09-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
CN103314577B (zh) * 2011-01-17 2016-10-12 浜松光子学株式会社 固体摄像装置
US8878570B2 (en) * 2011-09-30 2014-11-04 Silicon Laboratories Inc. Configurable analog front end
JP6004421B2 (ja) * 2012-03-30 2016-10-05 株式会社日立ハイテクノロジーズ 撮像素子、検査装置、及び検出装置
US9918017B2 (en) 2012-09-04 2018-03-13 Duelight Llc Image sensor apparatus and method for obtaining multiple exposures with zero interframe time
US12401911B2 (en) 2014-11-07 2025-08-26 Duelight Llc Systems and methods for generating a high-dynamic range (HDR) pixel stream
US12401912B2 (en) 2014-11-17 2025-08-26 Duelight Llc System and method for generating a digital image
US12445736B2 (en) 2015-05-01 2025-10-14 Duelight Llc Systems and methods for generating a digital image
JP2017167030A (ja) * 2016-03-17 2017-09-21 株式会社日立ハイテクサイエンス X線分析装置
WO2018194934A1 (en) * 2017-04-18 2018-10-25 Board Of Regents, The University Of Texas System Method for the integration of monlithic thin film radiation detector systems
DE102018107089A1 (de) * 2017-05-12 2018-11-15 Taiwan Semiconductor Manufacturing Co., Ltd. Multiplexierer-Schaltkreis, Halbleitervorrichtung zum Multiplexieren von Spannungen, und Verfahren für seinen Betrieb
JP7374586B2 (ja) * 2019-01-17 2023-11-07 ブリルニクス シンガポール プライベート リミテッド 固体撮像装置、固体撮像装置の駆動方法、および電子機器
JP7566679B2 (ja) * 2021-03-31 2024-10-15 ラピステクノロジー株式会社 半導体装置及び電圧生成方法

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JP2965777B2 (ja) * 1992-01-29 1999-10-18 オリンパス光学工業株式会社 固体撮像装置
JP4035194B2 (ja) * 1996-03-13 2008-01-16 キヤノン株式会社 X線検出装置及びx線検出システム
US6335843B2 (en) * 1997-05-23 2002-01-01 Sony Corporation Recording medium driving device
JPH11308534A (ja) * 1998-04-20 1999-11-05 Sony Corp Ccd固体撮像素子の出力バッファ
JP2000224495A (ja) * 1998-11-24 2000-08-11 Canon Inc 撮像装置及びそれを用いた撮像システム
JP3984808B2 (ja) * 2000-09-07 2007-10-03 キヤノン株式会社 信号処理装置及びそれを用いた撮像装置並びに放射線撮像システム
JP2002365704A (ja) * 2001-06-06 2002-12-18 Canon Inc カメラ
EP1265291A1 (fr) * 2001-06-08 2002-12-11 EM Microelectronic-Marin SA Capteur d'image CMOS et procédé permettant d'opérer un capteur d'image CMOS avec une dynamique accrue
JP4222772B2 (ja) * 2001-08-01 2009-02-12 三洋電機株式会社 画像信号処理装置
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JP2004031658A (ja) 2002-06-26 2004-01-29 Shimadzu Corp 信号増幅用集積回路
JP3959381B2 (ja) * 2003-09-04 2007-08-15 株式会社東芝 半導体光センサ、及び、携帯端末
JP4469638B2 (ja) * 2004-03-12 2010-05-26 キヤノン株式会社 読み出し装置及び画像撮影装置
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JP4172471B2 (ja) * 2005-06-17 2008-10-29 セイコーエプソン株式会社 駆動回路、電気光学装置及び電子機器
JP5317388B2 (ja) * 2005-09-30 2013-10-16 キヤノン株式会社 放射線撮像装置、放射線撮像システム及びプログラム

Also Published As

Publication number Publication date
EP1848198A2 (en) 2007-10-24
US7595831B2 (en) 2009-09-29
EP1848198A3 (en) 2010-01-13
US20070258008A1 (en) 2007-11-08
EP1848198B1 (en) 2015-04-15
JP2007312361A (ja) 2007-11-29

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