JP4884828B2 - 表示用パネルの処理装置 - Google Patents
表示用パネルの処理装置 Download PDFInfo
- Publication number
- JP4884828B2 JP4884828B2 JP2006127219A JP2006127219A JP4884828B2 JP 4884828 B2 JP4884828 B2 JP 4884828B2 JP 2006127219 A JP2006127219 A JP 2006127219A JP 2006127219 A JP2006127219 A JP 2006127219A JP 4884828 B2 JP4884828 B2 JP 4884828B2
- Authority
- JP
- Japan
- Prior art keywords
- panel
- mark
- video camera
- probe
- display panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012545 processing Methods 0.000 title claims description 38
- 239000000523 sample Substances 0.000 claims description 66
- 239000003550 marker Substances 0.000 claims description 27
- 238000003384 imaging method Methods 0.000 claims description 18
- 230000002950 deficient Effects 0.000 description 45
- 238000007689 inspection Methods 0.000 description 20
- 239000011521 glass Substances 0.000 description 11
- 239000000758 substrate Substances 0.000 description 10
- 239000004973 liquid crystal related substance Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000000007 visual effect Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005323 electroforming Methods 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Crystallography & Structural Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Crystal (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006127219A JP4884828B2 (ja) | 2006-05-01 | 2006-05-01 | 表示用パネルの処理装置 |
TW096111980A TW200742840A (en) | 2006-05-01 | 2007-04-04 | Processor for display panel |
KR1020070040260A KR100812408B1 (ko) | 2006-05-01 | 2007-04-25 | 표시용 패널의 처리장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006127219A JP4884828B2 (ja) | 2006-05-01 | 2006-05-01 | 表示用パネルの処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007298787A JP2007298787A (ja) | 2007-11-15 |
JP4884828B2 true JP4884828B2 (ja) | 2012-02-29 |
Family
ID=38768317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006127219A Active JP4884828B2 (ja) | 2006-05-01 | 2006-05-01 | 表示用パネルの処理装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4884828B2 (ko) |
KR (1) | KR100812408B1 (ko) |
TW (1) | TW200742840A (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100911331B1 (ko) * | 2008-12-30 | 2009-08-07 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치 및 상기 어레이 테스트 장치의 기판 일지점 위치 측정 방법 |
KR100911330B1 (ko) * | 2008-12-30 | 2009-08-07 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치와, 상기 어레이 테스트 장치의 기판 일지점 위치 측정 방법과, 카메라 어셈블리에 촬상된 특정 위치좌표 측정 방법 |
KR101128913B1 (ko) * | 2009-05-07 | 2012-03-27 | 에스엔유 프리시젼 주식회사 | 비전 검사시스템 및 이를 이용한 좌표변환방법 |
CN106525389B (zh) * | 2016-10-27 | 2019-03-05 | 北京兆维科技开发有限公司 | 一种单调双变的oled面板载物平台 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09113857A (ja) * | 1995-10-24 | 1997-05-02 | Sharp Corp | 液晶パネル点灯機構 |
JP4281337B2 (ja) | 2002-11-20 | 2009-06-17 | パナソニック株式会社 | ディスプレイパネルの点灯検査装置 |
JP4135143B2 (ja) * | 2003-04-22 | 2008-08-20 | 株式会社島津製作所 | 基板検査装置 |
JP4411588B2 (ja) * | 2003-11-27 | 2010-02-10 | 横河電機株式会社 | 欠陥検査装置 |
-
2006
- 2006-05-01 JP JP2006127219A patent/JP4884828B2/ja active Active
-
2007
- 2007-04-04 TW TW096111980A patent/TW200742840A/zh not_active IP Right Cessation
- 2007-04-25 KR KR1020070040260A patent/KR100812408B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
TW200742840A (en) | 2007-11-16 |
KR100812408B1 (ko) | 2008-03-11 |
JP2007298787A (ja) | 2007-11-15 |
TWI338772B (ko) | 2011-03-11 |
KR20070106920A (ko) | 2007-11-06 |
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