JP4884828B2 - 表示用パネルの処理装置 - Google Patents

表示用パネルの処理装置 Download PDF

Info

Publication number
JP4884828B2
JP4884828B2 JP2006127219A JP2006127219A JP4884828B2 JP 4884828 B2 JP4884828 B2 JP 4884828B2 JP 2006127219 A JP2006127219 A JP 2006127219A JP 2006127219 A JP2006127219 A JP 2006127219A JP 4884828 B2 JP4884828 B2 JP 4884828B2
Authority
JP
Japan
Prior art keywords
panel
mark
video camera
probe
display panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2006127219A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007298787A (ja
Inventor
啓一 蔵所
邦広 水野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2006127219A priority Critical patent/JP4884828B2/ja
Priority to TW096111980A priority patent/TW200742840A/zh
Priority to KR1020070040260A priority patent/KR100812408B1/ko
Publication of JP2007298787A publication Critical patent/JP2007298787A/ja
Application granted granted Critical
Publication of JP4884828B2 publication Critical patent/JP4884828B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
JP2006127219A 2006-05-01 2006-05-01 表示用パネルの処理装置 Active JP4884828B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006127219A JP4884828B2 (ja) 2006-05-01 2006-05-01 表示用パネルの処理装置
TW096111980A TW200742840A (en) 2006-05-01 2007-04-04 Processor for display panel
KR1020070040260A KR100812408B1 (ko) 2006-05-01 2007-04-25 표시용 패널의 처리장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006127219A JP4884828B2 (ja) 2006-05-01 2006-05-01 表示用パネルの処理装置

Publications (2)

Publication Number Publication Date
JP2007298787A JP2007298787A (ja) 2007-11-15
JP4884828B2 true JP4884828B2 (ja) 2012-02-29

Family

ID=38768317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006127219A Active JP4884828B2 (ja) 2006-05-01 2006-05-01 表示用パネルの処理装置

Country Status (3)

Country Link
JP (1) JP4884828B2 (ko)
KR (1) KR100812408B1 (ko)
TW (1) TW200742840A (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100911331B1 (ko) * 2008-12-30 2009-08-07 주식회사 탑 엔지니어링 어레이 테스트 장치 및 상기 어레이 테스트 장치의 기판 일지점 위치 측정 방법
KR100911330B1 (ko) * 2008-12-30 2009-08-07 주식회사 탑 엔지니어링 어레이 테스트 장치와, 상기 어레이 테스트 장치의 기판 일지점 위치 측정 방법과, 카메라 어셈블리에 촬상된 특정 위치좌표 측정 방법
KR101128913B1 (ko) * 2009-05-07 2012-03-27 에스엔유 프리시젼 주식회사 비전 검사시스템 및 이를 이용한 좌표변환방법
CN106525389B (zh) * 2016-10-27 2019-03-05 北京兆维科技开发有限公司 一种单调双变的oled面板载物平台

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09113857A (ja) * 1995-10-24 1997-05-02 Sharp Corp 液晶パネル点灯機構
JP4281337B2 (ja) 2002-11-20 2009-06-17 パナソニック株式会社 ディスプレイパネルの点灯検査装置
JP4135143B2 (ja) * 2003-04-22 2008-08-20 株式会社島津製作所 基板検査装置
JP4411588B2 (ja) * 2003-11-27 2010-02-10 横河電機株式会社 欠陥検査装置

Also Published As

Publication number Publication date
TW200742840A (en) 2007-11-16
KR100812408B1 (ko) 2008-03-11
JP2007298787A (ja) 2007-11-15
TWI338772B (ko) 2011-03-11
KR20070106920A (ko) 2007-11-06

Similar Documents

Publication Publication Date Title
JP5348765B2 (ja) 平板状透明体の微小凹凸欠陥検査方法及び装置
TW201447422A (zh) 液晶面板檢查裝置
TWI773032B (zh) 一種拱形照明裝置、具有其之成像系統及成像方法
JP4706356B2 (ja) ねじ形状測定装置
US10147174B2 (en) Substrate inspection device and method thereof
JP4884828B2 (ja) 表示用パネルの処理装置
JP4362335B2 (ja) 検査装置
KR101470424B1 (ko) 렌즈 검사 장치
JP5272784B2 (ja) 光学的検査方法および光学的検査装置
KR100662209B1 (ko) 백라이트 유닛의 비젼 및 휘도 검출시스템
TW200925588A (en) Defect inspecting device and its method thereof
JP2007212690A (ja) 液晶パネルの検査装置及びその検査方法
KR102037050B1 (ko) 표시장치용 비전검사 시스템 및 이의 검사방법
JP2005274272A (ja) ラインセンサカメラのキャリブレーション方法および外観検査装置
JP2008091843A (ja) 基板の圧着状態検査装置
TW200303410A (en) Method and apparatus for measuring a line width
JP2012169370A (ja) 表示パネル検査装置及び表示パネル検査方法
KR20130134050A (ko) 백라이트유닛 불량검사용 카메라 조립체
JP2005249946A (ja) 表示装置の欠陥検査装置
KR20070082773A (ko) 패널 검사 장치
KR20010055184A (ko) 유리기판의 패턴 검사용 광학 장치
JP2004333663A (ja) 表示用パネルの検査装置
KR20140139929A (ko) 표시 패널의 검사 장치 및 검사 방법
JP2000333047A (ja) 光学的撮像装置および光学的撮像方法
JP4712284B2 (ja) 表面検査装置

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090402

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20111027

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20111108

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20111207

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20141216

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 4884828

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250