TW200742840A - Processor for display panel - Google Patents

Processor for display panel

Info

Publication number
TW200742840A
TW200742840A TW096111980A TW96111980A TW200742840A TW 200742840 A TW200742840 A TW 200742840A TW 096111980 A TW096111980 A TW 096111980A TW 96111980 A TW96111980 A TW 96111980A TW 200742840 A TW200742840 A TW 200742840A
Authority
TW
Taiwan
Prior art keywords
panel
video cameras
display panel
receiver apparatus
processor
Prior art date
Application number
TW096111980A
Other languages
Chinese (zh)
Other versions
TWI338772B (en
Inventor
Keiichi Kurasho
Kunihiro Mizuno
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200742840A publication Critical patent/TW200742840A/en
Application granted granted Critical
Publication of TWI338772B publication Critical patent/TWI338772B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

To obtain an address of a defective pixel within a photographing area of a middle video camera. The processor comprises: a panel receiver apparatus which receives a display panel to turn this on; and two or more video cameras which photograph the panel received by the panel receiver apparatus from a first direction angled to the panel and include two or more video cameras aligned in a second direction parallel to the panel. The panel receiver apparatus is provided with: a panel receiver for receiving the panel; at least one probe unit for energizing the panel received by the panel receiver; and a marker which is at least one marker arranged at the probe unit and has a mark for referring to a coordinate position which can be photographed by adjoining video cameras in the second direction.
TW096111980A 2006-05-01 2007-04-04 Processor for display panel TW200742840A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006127219A JP4884828B2 (en) 2006-05-01 2006-05-01 Processing device for display panel

Publications (2)

Publication Number Publication Date
TW200742840A true TW200742840A (en) 2007-11-16
TWI338772B TWI338772B (en) 2011-03-11

Family

ID=38768317

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111980A TW200742840A (en) 2006-05-01 2007-04-04 Processor for display panel

Country Status (3)

Country Link
JP (1) JP4884828B2 (en)
KR (1) KR100812408B1 (en)
TW (1) TW200742840A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101769878B (en) * 2008-12-30 2012-07-04 塔工程有限公司 Array tester, method for measuring a point of substrate of the same and method for measuring a position coordinate photographed by a camera assembly

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100911331B1 (en) * 2008-12-30 2009-08-07 주식회사 탑 엔지니어링 Array tester and method for measuring a point of substrate of the same
KR101128913B1 (en) * 2009-05-07 2012-03-27 에스엔유 프리시젼 주식회사 Vision inspection system and method for converting coordinates using the same
CN106525389B (en) * 2016-10-27 2019-03-05 北京兆维科技开发有限公司 A kind of dull double oled panel article carrying platforms become

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09113857A (en) * 1995-10-24 1997-05-02 Sharp Corp Liquid crystal panel lighting mechanism
JP4281337B2 (en) 2002-11-20 2009-06-17 パナソニック株式会社 Display panel lighting inspection device
JP4135143B2 (en) * 2003-04-22 2008-08-20 株式会社島津製作所 Board inspection equipment
JP4411588B2 (en) * 2003-11-27 2010-02-10 横河電機株式会社 Defect inspection equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101769878B (en) * 2008-12-30 2012-07-04 塔工程有限公司 Array tester, method for measuring a point of substrate of the same and method for measuring a position coordinate photographed by a camera assembly

Also Published As

Publication number Publication date
JP4884828B2 (en) 2012-02-29
KR20070106920A (en) 2007-11-06
TWI338772B (en) 2011-03-11
JP2007298787A (en) 2007-11-15
KR100812408B1 (en) 2008-03-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees