JP4834718B2 - パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置 - Google Patents

パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置 Download PDF

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JP4834718B2
JP4834718B2 JP2008304605A JP2008304605A JP4834718B2 JP 4834718 B2 JP4834718 B2 JP 4834718B2 JP 2008304605 A JP2008304605 A JP 2008304605A JP 2008304605 A JP2008304605 A JP 2008304605A JP 4834718 B2 JP4834718 B2 JP 4834718B2
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fiber
pulse
terahertz
pulse laser
wavelength
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JP2009206484A (ja
JP2009206484A5 (enExample
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敏彦 尾内
崇史 片桐
健太郎 古澤
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Canon Inc
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Canon Inc
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0057—Temporal shaping, e.g. pulse compression, frequency chirping
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S1/00—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range
    • H01S1/02—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range solid
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/06—Construction or shape of active medium
    • H01S3/063—Waveguide lasers, i.e. whereby the dimensions of the waveguide are of the order of the light wavelength
    • H01S3/067—Fibre lasers
    • H01S3/06754—Fibre amplifiers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
    • H01S3/2308—Amplifier arrangements, e.g. MOPA

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Lasers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
JP2008304605A 2008-01-29 2008-11-28 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置 Expired - Fee Related JP4834718B2 (ja)

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JP2008017842 2008-01-29
JP2008017842 2008-01-29
JP2008304605A JP4834718B2 (ja) 2008-01-29 2008-11-28 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置

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JP2009206484A JP2009206484A (ja) 2009-09-10
JP2009206484A5 JP2009206484A5 (enExample) 2011-06-02
JP4834718B2 true JP4834718B2 (ja) 2011-12-14

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US (2) US7953130B2 (enExample)
EP (1) EP2086074A3 (enExample)
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CN (2) CN102208734B (enExample)

Families Citing this family (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9153928B2 (en) 2006-03-10 2015-10-06 Imra America, Inc. Optical signal processing with modelocked lasers
US8120778B2 (en) 2009-03-06 2012-02-21 Imra America, Inc. Optical scanning and imaging systems based on dual pulsed laser systems
JP5196779B2 (ja) * 2006-03-17 2013-05-15 キヤノン株式会社 光伝導素子及びセンサ装置
JP4807707B2 (ja) * 2007-11-30 2011-11-02 キヤノン株式会社 波形情報取得装置
JP5341488B2 (ja) 2008-01-18 2013-11-13 キヤノン株式会社 テラヘルツ波を測定するための装置及び方法
JP4834718B2 (ja) * 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置
JP5357531B2 (ja) * 2008-02-05 2013-12-04 キヤノン株式会社 情報取得装置及び情報取得方法
JP5665305B2 (ja) * 2008-12-25 2015-02-04 キヤノン株式会社 分析装置
JP5472675B2 (ja) 2009-02-03 2014-04-16 アイシン精機株式会社 非接触膜厚測定装置
KR101747153B1 (ko) * 2009-05-11 2017-06-14 오에프에스 피텔 엘엘씨 라만 레이징 애플리케이션들에서 이용하기 위한 필터 섬유 및 이를 제조하기 위한 기법들
US8837948B2 (en) * 2009-06-24 2014-09-16 Bae Systems Information And Electronic Systems Integration Inc. Multimode optical amplifier as a receiver pre-amplifier for free-space optical communications
JP5612842B2 (ja) 2009-09-07 2014-10-22 キヤノン株式会社 発振器
JP5653722B2 (ja) * 2009-11-06 2015-01-14 古河電気工業株式会社 テラヘルツ波イメージング装置
RU2448399C2 (ru) * 2009-12-16 2012-04-20 Государственное учебно-научное учреждение физический факультет Московского государственного университета имени М.В. Ломоносова (Физический факультет МГУ) Способ детектирования электромагнитных волн в терагерцовом диапазоне и устройство для его осуществления
JP5648321B2 (ja) * 2010-05-31 2015-01-07 富士通株式会社 波長変換装置、波長変換方法、及び、光分岐挿入装置
CN101876571B (zh) * 2010-06-08 2011-09-14 中国科学院上海光学精密机械研究所 用于提高纳秒脉冲单次测量动态范围的脉冲复制环装置
JP2012053450A (ja) * 2010-08-05 2012-03-15 Canon Inc テラヘルツ波発生素子、テラヘルツ波検出素子、テラヘルツ波発生装置、テラヘルツ波検出装置、テラヘルツ波測定装置、及びテラヘルツ波トモグラフィックイメージング装置
JP5885414B2 (ja) * 2010-08-05 2016-03-15 キヤノン株式会社 光周波数変換素子
JP5836683B2 (ja) * 2010-08-24 2015-12-24 キヤノン株式会社 電磁波発生素子、電磁波検出素子、時間領域分光装置
JP2012068621A (ja) * 2010-08-24 2012-04-05 Canon Inc テラヘルツ波発生素子、テラヘルツ波検出素子、及びテラヘルツ時間領域分光装置
JP5675219B2 (ja) * 2010-08-27 2015-02-25 キヤノン株式会社 光パルス発生装置、テラヘルツ分光装置およびトモグラフィ装置
US9035258B2 (en) 2011-01-08 2015-05-19 Canon Kabushiki Kaisha Tomography apparatus and electromagnetic pulse transmitting apparatus
JP5943594B2 (ja) 2011-01-14 2016-07-05 キヤノン株式会社 テラヘルツ波素子、テラヘルツ波検出装置、テラヘルツ時間領域分光システム及びトモグラフィ装置
US9075243B2 (en) * 2011-03-01 2015-07-07 Ofs Fitel, Llc Method and system for ultrashort pulse fiber delivery using higher order mode fiber
JP5799538B2 (ja) * 2011-03-18 2015-10-28 セイコーエプソン株式会社 テラヘルツ波発生装置、カメラ、イメージング装置、計測装置および光源装置
US8804233B2 (en) * 2011-08-09 2014-08-12 Ofs Fitel, Llc Fiber assembly for all-fiber delivery of high energy femtosecond pulses
WO2013039668A1 (en) 2011-09-14 2013-03-21 Fianium, Inc. Methods and apparatus pertaining to picosecond pulsed fiber based lasers
JP5818084B2 (ja) * 2011-09-22 2015-11-18 アイシン精機株式会社 テラヘルツ波発生検出装置、およびフェムト秒レーザ発生装置
US20130222787A1 (en) * 2012-02-23 2013-08-29 Canon Kabushiki Kaisha Roughness evaluating apparatus, and object evaluating apparatus and roughness evaluating method using the same
US10024963B2 (en) * 2012-03-23 2018-07-17 Picometrix Llc System and method to detect anomalies
FR2989475B1 (fr) 2012-04-12 2014-12-05 Amplitude Systemes Systeme et procede d'amplification optique d'impulsions lumineuses ultra-breves au-dela de la limite de la bande spectrale de gain
KR101700779B1 (ko) * 2012-09-21 2017-01-31 한국전자통신연구원 포토믹서 및 그의 제조방법
CN102967566A (zh) * 2012-11-14 2013-03-13 广东汉唐量子光电科技有限公司 一种高精密度快速痕量分析装置
DE102012113029A1 (de) 2012-12-21 2014-06-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kurzpulslasersystem
US8716685B1 (en) 2012-12-27 2014-05-06 The Aerospace Corporation Systems and methods for use in generating pulsed terahertz radiation
CN106030934B (zh) * 2014-01-07 2019-08-06 统雷有限公司 使用一可调谐飞秒振荡器的可调节中红外超连续谱发生器
EP3238351B1 (en) * 2014-12-23 2019-08-07 Leonardo Mw Ltd Down conversion system and method
JP6363511B2 (ja) * 2015-01-08 2018-07-25 浜松ホトニクス株式会社 テラヘルツ波時間波形取得装置
US9774161B2 (en) * 2015-02-18 2017-09-26 Toptica Photonics Ag Fiber delivery of short laser pulses
CN105334182A (zh) * 2015-12-10 2016-02-17 中国科学院重庆绿色智能技术研究院 一种全光纤太赫兹准时域实时光谱仪
CN105527306B (zh) * 2016-01-15 2018-05-08 北京工业大学 一种基于面阵式探测器太赫兹层析三维成像的方法
CN106872800B (zh) * 2017-02-15 2019-04-30 上海理工大学 石墨烯量子点荧光增强的太赫兹时域电场检测系统
IL254803B2 (en) * 2017-09-29 2023-09-01 Prisma Photonics Ltd Distributed amplification optimized for fiber sensing
CN108267418B (zh) * 2018-03-30 2023-12-05 北京农业信息技术研究中心 基于太赫兹层析技术的种子内部形态获取方法及装置
CN108692918B (zh) * 2018-07-17 2023-12-15 中国人民解放军国防科技大学 用于评价高功率光纤激光系统时域稳定性的装置及方法
CN109149339B (zh) * 2018-08-30 2020-06-30 中国人民解放军国防科技大学 可用于泵浦掺铥光纤的800nm波段高亮度光纤激光器
CN109301686B (zh) * 2018-09-25 2020-04-24 电子科技大学 一种高重复频率的飞秒激光脉冲产生系统及方法
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FR3098934B1 (fr) * 2019-07-17 2022-03-25 Alphanov Système de génération d’impulsion lumineuse ultra-courte de forte énergie avec module de mise en forme spectrale
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US11876335B2 (en) * 2021-11-03 2024-01-16 National Yang Ming Chiao Tung University Method and system to simultaneously generate tunable redshift and blueshift femtosecond laser pulses with adjustable spectral bandwidth and output power
CN114885179B (zh) * 2022-05-23 2024-10-22 浙大城市学院 一种太赫兹时域光谱透射成像数据压缩重构方法
CN115507759B (zh) * 2022-07-22 2025-06-27 中国矿业大学 基于自适应迁移学习的陶瓷层厚度太赫兹测量方法
CN115657081B (zh) * 2022-12-29 2023-03-28 北京无线电测量研究所 一种机载太赫兹雷达系统自适应控制方法及装置

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155621A (en) * 1990-07-31 1992-10-13 Fujitsu Limited Optical fiber amplifier
JP2998247B2 (ja) * 1991-03-20 2000-01-11 富士通株式会社 光増幅器用エルビウムファイバ
JP2711778B2 (ja) * 1992-09-07 1998-02-10 国際電信電話株式会社 光パルス圧縮装置
US5880877A (en) 1997-01-28 1999-03-09 Imra America, Inc. Apparatus and method for the generation of high-power femtosecond pulses from a fiber amplifier
US5892615A (en) * 1997-03-17 1999-04-06 Sdl, Inc. Output power enhancement in optical fiber lasers
US6181463B1 (en) 1997-03-21 2001-01-30 Imra America, Inc. Quasi-phase-matched parametric chirped pulse amplification systems
JP2007516600A (ja) * 1997-03-21 2007-06-21 イムラ アメリカ インコーポレイテッド 先進材料処理応用のためのピコ秒−ナノ秒パルス用高エネルギ光ファイバ増幅器
DE19926866C1 (de) 1999-06-12 2000-08-24 Duerkopp Adler Ag Nähmaschine
GB2359716B (en) * 2000-02-28 2002-06-12 Toshiba Res Europ Ltd An imaging apparatus and method
GB2371618B (en) * 2001-01-30 2004-11-17 Teraprobe Ltd A probe, apparatus and method for examining a sample
CN100480751C (zh) * 2001-12-18 2009-04-22 古河电气工业株式会社 光放大器用的光纤
US7224518B2 (en) * 2003-02-25 2007-05-29 Toptica Photonics Ag Fiber-optic amplification of light pulses
US7330301B2 (en) * 2003-05-14 2008-02-12 Imra America, Inc. Inexpensive variable rep-rate source for high-energy, ultrafast lasers
GB2402471B (en) * 2003-06-02 2006-01-18 Teraview Ltd An analysis method and apparatus
US7414780B2 (en) * 2003-06-30 2008-08-19 Imra America, Inc. All-fiber chirped pulse amplification systems
JP2005157601A (ja) * 2003-11-25 2005-06-16 Canon Inc 電磁波による積層状物体計数装置及び計数方法
US6990270B2 (en) * 2004-02-11 2006-01-24 Fitel U.S.A. Corp. Fiber amplifier for generating femtosecond pulses in single mode fiber
JP4217646B2 (ja) * 2004-03-26 2009-02-04 キヤノン株式会社 認証方法及び認証装置
JP4546326B2 (ja) * 2004-07-30 2010-09-15 キヤノン株式会社 センシング装置
JP4250603B2 (ja) * 2005-03-28 2009-04-08 キヤノン株式会社 テラヘルツ波の発生素子、及びその製造方法
JP2006275910A (ja) * 2005-03-30 2006-10-12 Canon Inc 位置センシング装置及び位置センシング方法
JP2007005484A (ja) * 2005-06-22 2007-01-11 Fujitsu Ltd 光増幅装置及び光ファイバ
JP4402026B2 (ja) * 2005-08-30 2010-01-20 キヤノン株式会社 センシング装置
JP4773839B2 (ja) * 2006-02-15 2011-09-14 キヤノン株式会社 対象物の情報を検出する検出装置
JP5132146B2 (ja) * 2006-03-17 2013-01-30 キヤノン株式会社 分析方法、分析装置、及び検体保持部材
JP4898472B2 (ja) 2006-04-11 2012-03-14 キヤノン株式会社 検査装置
JP4709059B2 (ja) 2006-04-28 2011-06-22 キヤノン株式会社 検査装置及び検査方法
JP5196750B2 (ja) * 2006-08-25 2013-05-15 キヤノン株式会社 発振素子
JP5144175B2 (ja) * 2007-08-31 2013-02-13 キヤノン株式会社 電磁波を用いる検査装置及び検査方法
US7869036B2 (en) * 2007-08-31 2011-01-11 Canon Kabushiki Kaisha Analysis apparatus for analyzing a specimen by obtaining electromagnetic spectrum information
JP4834718B2 (ja) * 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置
JP5357531B2 (ja) 2008-02-05 2013-12-04 キヤノン株式会社 情報取得装置及び情報取得方法

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US20110210252A1 (en) 2011-09-01
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