JP4820616B2 - リードフレーム - Google Patents
リードフレーム Download PDFInfo
- Publication number
- JP4820616B2 JP4820616B2 JP2005306379A JP2005306379A JP4820616B2 JP 4820616 B2 JP4820616 B2 JP 4820616B2 JP 2005306379 A JP2005306379 A JP 2005306379A JP 2005306379 A JP2005306379 A JP 2005306379A JP 4820616 B2 JP4820616 B2 JP 4820616B2
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- Prior art keywords
- plating
- lead
- lead frame
- layer
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49579—Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
- H01L23/49582—Metallic layers on lead frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
- H01L2224/854—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/85463—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than 1550°C
- H01L2224/85464—Palladium (Pd) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01028—Nickel [Ni]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01046—Palladium [Pd]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3421—Leaded components
- H05K3/3426—Leaded components characterised by the leads
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Lead Frames For Integrated Circuits (AREA)
Description
2 インナーリード
3 ダイパッド
4 半導体素子
5 金属細線
6 モールドレジン
7 アウターリード
7a 第一の屈曲部
7b 第二の屈曲部
8 実装面
9 リードフレーム素材
10 下地めっき(ニッケルめっき)
11 パラジウムめっき
12 銀めっき
13 金めっき
30 プリント基板(配線基板)
31 はんだペースト
32 半導体装置
33 モールドレジン
34 アウターリード
35 実装面
36 コープラナリティ
Claims (7)
- 半導体素子を載置するダイパッド部と、前記半導体素子の電極パッドと電気的に接続されるインナーリードと、前記インナーリードに繋がり、鉛フリーはんだを介して配線基板に電気的に接続され、外部端子となるアウターリードとを備えたリードフレームであって、
少なくとも前記アウターリードにおける前記インナーリードとは反対側の先端部及び前記インナーリードに4層のめっきが施されており、
前記めっきのうち表面側の3層は、最表層から順にAu、Ag、Pdからなり、
Agからなる層の厚みは、0.1μm以上0.5μm以下であり、
前記4層のめっきのうち、最下層はNiであり、
前記アウターリードのリードピッチが、300μm以上500μm以下である、リードフレーム。 - 前記アウターリードのリード幅が、80μm以上250μm以下である、請求項1に記載のリードフレーム。
- 前記めっきのうち、Pdからなる層の厚みは、0.005μm以上0.2μm以下である、請求項1又は2に記載のリードフレーム。
- 前記めっきのうち、Auからなる層の厚みは、0.0015μm以上0.1μm以下である、請求項1から3の何れか一つに記載のリードフレーム。
- リードフレームの素材がCuまたはFeである、請求項1から4のいずれか一つに記載のリードフレーム。
- 前記4層のめっきのうち、Niからなる層の厚みは、0.2μm以上3.0μm以下である、請求項1から5のいずれか一つに記載のリードフレーム。
- 請求項1から6のいずれか一つに記載のリードフレームと、
前記ダイパッド部上に搭載された前記半導体素子と、
前記半導体素子の前記電極パッドと前記インナーリードとを電気的に接続する金属細線と、
前記半導体素子と前記金属細線と前記インナーリードとを被覆するモールドレジンと
を備える半導体装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005306379A JP4820616B2 (ja) | 2005-10-20 | 2005-10-20 | リードフレーム |
EP06122491A EP1777743A3 (en) | 2005-10-20 | 2006-10-18 | Lead frame |
CN2006101356292A CN1953168B (zh) | 2005-10-20 | 2006-10-18 | 引线框架 |
US11/582,972 US8283759B2 (en) | 2005-10-20 | 2006-10-19 | Lead frame having outer leads coated with a four layer plating |
TW095138819A TW200717729A (en) | 2005-10-20 | 2006-10-20 | Lead frame |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005306379A JP4820616B2 (ja) | 2005-10-20 | 2005-10-20 | リードフレーム |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007115925A JP2007115925A (ja) | 2007-05-10 |
JP4820616B2 true JP4820616B2 (ja) | 2011-11-24 |
Family
ID=37719312
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005306379A Active JP4820616B2 (ja) | 2005-10-20 | 2005-10-20 | リードフレーム |
Country Status (5)
Country | Link |
---|---|
US (1) | US8283759B2 (ja) |
EP (1) | EP1777743A3 (ja) |
JP (1) | JP4820616B2 (ja) |
CN (1) | CN1953168B (ja) |
TW (1) | TW200717729A (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006032074B3 (de) * | 2006-07-11 | 2007-12-27 | Infineon Technologies Ag | Bauelement und zugehöriger Anschlussdraht |
CN101821431B (zh) | 2007-07-06 | 2012-02-15 | 第一电子工业株式会社 | 连接器制造方法和通过该方法制造的连接器 |
JP5762081B2 (ja) * | 2011-03-29 | 2015-08-12 | 新光電気工業株式会社 | リードフレーム及び半導体装置 |
CN105018995A (zh) * | 2015-07-10 | 2015-11-04 | 陈圳浩 | 银饰品表面光亮五层电镀工艺 |
US20230374688A1 (en) * | 2022-05-19 | 2023-11-23 | Te Connectivity Solutions Gmbh | Layered Plating Stack for Improved Contact Resistance in Corrosive Environments |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE68923024T2 (de) * | 1988-03-28 | 1995-11-02 | Texas Instruments Inc | Leiterrahmen mit verminderter Korrosion. |
US5014113A (en) * | 1989-12-27 | 1991-05-07 | Motorola, Inc. | Multiple layer lead frame |
JP2543619B2 (ja) | 1990-09-05 | 1996-10-16 | 新光電気工業株式会社 | 半導体装置用リ―ドフレ―ム |
JPH04337657A (ja) | 1991-05-14 | 1992-11-25 | Hitachi Cable Ltd | 半導体装置用リードフレーム |
US5360991A (en) * | 1993-07-29 | 1994-11-01 | At&T Bell Laboratories | Integrated circuit devices with solderable lead frame |
US5436082A (en) * | 1993-12-27 | 1995-07-25 | National Semiconductor Corporation | Protective coating combination for lead frames |
US5650661A (en) * | 1993-12-27 | 1997-07-22 | National Semiconductor Corporation | Protective coating combination for lead frames |
JP3550875B2 (ja) | 1996-05-14 | 2004-08-04 | ソニー株式会社 | リードフレームとこれを用いた半導体装置 |
JPH1074879A (ja) | 1996-08-30 | 1998-03-17 | Mitsui High Tec Inc | 半導体装置用リードフレーム |
KR100231828B1 (ko) * | 1997-02-20 | 1999-12-01 | 유무성 | 다층 도금 리드프레임 |
US5994767A (en) * | 1997-04-09 | 1999-11-30 | Sitron Precision Co., Ltd. | Leadframe for integrated circuit package and method of manufacturing the same |
DE19850526C2 (de) * | 1998-11-03 | 2002-11-28 | Heraeus Gmbh W C | Substrat mit metallischer Beschichtung und seine Verwendung |
US6352634B1 (en) * | 1998-06-10 | 2002-03-05 | W. C. Heraeus Gmbh & Co. Kg | Method for producing a lead-free substrate |
US20030011048A1 (en) * | 1999-03-19 | 2003-01-16 | Abbott Donald C. | Semiconductor circuit assembly having a plated leadframe including gold selectively covering areas to be soldered |
JP2001230360A (ja) * | 2000-02-18 | 2001-08-24 | Hitachi Ltd | 半導体集積回路装置およびその製造方法 |
JP2002076229A (ja) * | 2000-07-13 | 2002-03-15 | Texas Instruments Inc | 銀めっきを含む半導体のリードフレームおよびその製造方法 |
KR100371567B1 (ko) * | 2000-12-08 | 2003-02-07 | 삼성테크윈 주식회사 | Ag 선도금을 이용한 반도체 패키지용 리드프레임 |
JP2003198117A (ja) | 2001-12-28 | 2003-07-11 | Matsushita Electric Ind Co Ltd | はんだ付け方法および接合構造体 |
JP3519726B1 (ja) * | 2002-11-26 | 2004-04-19 | Fcm株式会社 | 端子およびそれを有する部品 |
CN101546803B (zh) * | 2003-01-16 | 2010-12-08 | 松下电器产业株式会社 | 光学半导体器件 |
JP2004241542A (ja) | 2003-02-05 | 2004-08-26 | Matsushita Electric Ind Co Ltd | はんだ付け方法およびこのはんだ付け方法により接合される部品および接合された接合構造体 |
JP2005019922A (ja) * | 2003-06-30 | 2005-01-20 | Shinko Electric Ind Co Ltd | 半導体パッケージ用リードフレーム |
KR100998042B1 (ko) * | 2004-02-23 | 2010-12-03 | 삼성테크윈 주식회사 | 리드 프레임 및 이를 구비한 반도체 패키지의 제조방법 |
CN100483707C (zh) * | 2004-05-27 | 2009-04-29 | 新光电气工业株式会社 | 用于半导体器件的引线框架 |
JP2006269903A (ja) * | 2005-03-25 | 2006-10-05 | Shinko Electric Ind Co Ltd | 半導体装置用リードフレーム |
-
2005
- 2005-10-20 JP JP2005306379A patent/JP4820616B2/ja active Active
-
2006
- 2006-10-18 EP EP06122491A patent/EP1777743A3/en not_active Ceased
- 2006-10-18 CN CN2006101356292A patent/CN1953168B/zh active Active
- 2006-10-19 US US11/582,972 patent/US8283759B2/en active Active
- 2006-10-20 TW TW095138819A patent/TW200717729A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
JP2007115925A (ja) | 2007-05-10 |
CN1953168A (zh) | 2007-04-25 |
EP1777743A3 (en) | 2008-11-19 |
TW200717729A (en) | 2007-05-01 |
US20070090501A1 (en) | 2007-04-26 |
EP1777743A2 (en) | 2007-04-25 |
US8283759B2 (en) | 2012-10-09 |
CN1953168B (zh) | 2010-07-28 |
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