JP4807846B2 - X線画像診断装置 - Google Patents
X線画像診断装置 Download PDFInfo
- Publication number
- JP4807846B2 JP4807846B2 JP2006203320A JP2006203320A JP4807846B2 JP 4807846 B2 JP4807846 B2 JP 4807846B2 JP 2006203320 A JP2006203320 A JP 2006203320A JP 2006203320 A JP2006203320 A JP 2006203320A JP 4807846 B2 JP4807846 B2 JP 4807846B2
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- 238000002059 diagnostic imaging Methods 0.000 title claims description 14
- 238000012937 correction Methods 0.000 claims description 112
- 238000003384 imaging method Methods 0.000 claims description 86
- 238000012545 processing Methods 0.000 claims description 57
- 238000001514 detection method Methods 0.000 claims description 42
- 238000013480 data collection Methods 0.000 claims description 19
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000003745 diagnosis Methods 0.000 claims description 3
- 238000004846 x-ray emission Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 34
- 230000008569 process Effects 0.000 description 17
- 239000000463 material Substances 0.000 description 14
- 238000006243 chemical reaction Methods 0.000 description 10
- 230000008859 change Effects 0.000 description 7
- 238000003825 pressing Methods 0.000 description 7
- 238000012935 Averaging Methods 0.000 description 4
- 238000013500 data storage Methods 0.000 description 4
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- 230000003321 amplification Effects 0.000 description 2
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- 230000006872 improvement Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 238000002601 radiography Methods 0.000 description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
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- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000011669 selenium Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
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- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006203320A JP4807846B2 (ja) | 2006-07-26 | 2006-07-26 | X線画像診断装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006203320A JP4807846B2 (ja) | 2006-07-26 | 2006-07-26 | X線画像診断装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008029393A JP2008029393A (ja) | 2008-02-14 |
| JP2008029393A5 JP2008029393A5 (enExample) | 2009-08-20 |
| JP4807846B2 true JP4807846B2 (ja) | 2011-11-02 |
Family
ID=39119432
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006203320A Expired - Fee Related JP4807846B2 (ja) | 2006-07-26 | 2006-07-26 | X線画像診断装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4807846B2 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5396814B2 (ja) * | 2008-10-28 | 2014-01-22 | コニカミノルタ株式会社 | 放射線画像撮影システム |
| WO2010109353A2 (en) * | 2009-03-26 | 2010-09-30 | Koninklijke Philips Electronics, N.V. | Data acquisition |
| JP5362444B2 (ja) * | 2009-05-25 | 2013-12-11 | 株式会社日立メディコ | X線画像診断装置 |
| JP5448643B2 (ja) * | 2009-08-26 | 2014-03-19 | キヤノン株式会社 | 撮像システム、その画像処理方法及びそのプログラム |
| KR101760896B1 (ko) | 2010-10-28 | 2017-08-01 | 삼성디스플레이 주식회사 | 엑스레이 검출기, 그 구동방법, 및 엑스레이 촬영 시스템 |
| US20130279661A1 (en) | 2012-04-19 | 2013-10-24 | Canon Kabushiki Kaisha | Radiant ray generation control apparatus, radiation imaging system, and method for controlling the same |
| JP2013225380A (ja) * | 2012-04-19 | 2013-10-31 | Canon Inc | 放射線発生制御装置、制御装置、放射線撮影システムおよび制御方法 |
| GB2522347B (en) * | 2012-07-24 | 2016-03-09 | Canon Kk | Imaging apparatus, radiation imaging apparatus, and method for controlling the same |
| US9279893B2 (en) | 2012-07-24 | 2016-03-08 | Canon Kabushiki Kaisha | Radiation imaging control apparatus, radiation imaging system and radiation imaging apparatus, and method for controlling the same |
| KR102490836B1 (ko) * | 2018-03-20 | 2023-01-26 | 한국전자통신연구원 | 실시간으로 다크 이미지를 보정하기 위한 전자 장치 |
| JP7105589B2 (ja) * | 2018-03-27 | 2022-07-25 | キヤノン株式会社 | 放射線撮像システム、その制御装置及び制御方法 |
| CN110974271A (zh) * | 2019-12-24 | 2020-04-10 | 上海联影医疗科技有限公司 | 射线影像设备的成像方法、装置、射线影像设备及介质 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4708576B2 (ja) * | 2001-01-31 | 2011-06-22 | キヤノン株式会社 | 放射線撮影装置、制御方法 |
| JP4649061B2 (ja) * | 2001-06-05 | 2011-03-09 | キヤノン株式会社 | 撮像装置及び撮像方法、並びに記憶媒体及びプログラム |
| JP2004202026A (ja) * | 2002-12-26 | 2004-07-22 | Toshiba Corp | X線診断装置及びx線撮影方法 |
| JP2005006792A (ja) * | 2003-06-18 | 2005-01-13 | Canon Inc | X線デジタル画像撮影システム |
| JP2005312949A (ja) * | 2004-03-31 | 2005-11-10 | Canon Inc | 放射線撮像装置及びその制御方法 |
| JP4744831B2 (ja) * | 2004-09-09 | 2011-08-10 | 株式会社東芝 | X線診断装置 |
-
2006
- 2006-07-26 JP JP2006203320A patent/JP4807846B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008029393A (ja) | 2008-02-14 |
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