JP4642046B2 - 基板処理装置 - Google Patents
基板処理装置 Download PDFInfo
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- JP4642046B2 JP4642046B2 JP2007156466A JP2007156466A JP4642046B2 JP 4642046 B2 JP4642046 B2 JP 4642046B2 JP 2007156466 A JP2007156466 A JP 2007156466A JP 2007156466 A JP2007156466 A JP 2007156466A JP 4642046 B2 JP4642046 B2 JP 4642046B2
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- 239000000758 substrate Substances 0.000 title claims description 44
- 238000006243 chemical reaction Methods 0.000 claims description 35
- 229910000859 α-Fe Inorganic materials 0.000 claims description 29
- 238000003780 insertion Methods 0.000 claims description 5
- 230000037431 insertion Effects 0.000 claims description 5
- 239000007789 gas Substances 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000001939 inductive effect Effects 0.000 description 3
- 230000035699 permeability Effects 0.000 description 3
- 239000012495 reaction gas Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/507—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using external electrodes, e.g. in tunnel type reactors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Description
前記連結部は、環状に形成されることを特徴とする。
前記スパイラル状の挿入溝は、前記環状のフェライトコアの外周から内周に円周方向に形成されることを特徴とする。
202 ガスノズル
203 基板
204 チャック
205 真空チャンバー
206 真空ポート
207 高周波アンテナ部
208 高周波アンテナコイル
211 高周波電源装置
212 連結部
213 ポール
214 低周波アンテナコイル
215 低周波アンテナ部
218 低周波電源装置
Claims (5)
- 処理対象基板が位置し、プラズマが発生する反応空間を有する真空チャンバーと、
前記真空チャンバー上面の外周に設けられ、前記反応空間にプラズマを発生させる低周波アンテナ部と、
前記低周波アンテナ部に低周波電圧を印加する低周波電源装置と、
前記真空チャンバー上面の中央部に設けられ、前記反応空間にプラズマを発生させる高周波アンテナ部と、
前記高周波アンテナ部に高周波電圧を印加する高周波電源装置と、
を含み、
前記高周波アンテナ部は、並列に連結された複数のアンテナコイルをそれぞれ含んで同心状に配置される複数のアンテナコイル群が互いに直列に連結されてなり、
前記低周波アンテナ部は、前記反応空間の外部に設けられた複数のポールと、前記複数のポールを互いに連結する連結部とを有するフェライトコアと;前記複数のポールに巻かれたアンテナコイルと;を含むことを特徴とする基板処理装置。 - 隣接した前記各ポールには、前記アンテナコイルがそれぞれ反対方向に巻かれることを特徴とする請求項1に記載の基板処理装置。
- 前記連結部は、環状に形成されることを特徴とする請求項1に記載の基板処理装置。
- 処理対象基板が位置し、プラズマが発生する反応空間を有する真空チャンバーと、
前記真空チャンバー上面の外周に設けられ、前記反応空間にプラズマを発生させる低周波アンテナ部と、
前記低周波アンテナ部に低周波電圧を印加する低周波電源装置と、
前記真空チャンバー上面の中央部に設けられ、前記反応空間にプラズマを発生させる高周波アンテナ部と、
前記高周波アンテナ部に高周波電圧を印加する高周波電源装置と、
を含み、
前記高周波アンテナ部は、並列に連結された複数のアンテナコイルをそれぞれ含んで同心状に配置される複数のアンテナコイル群が互いに直列に連結されてなり、
前記低周波アンテナ部は、前記反応空間の外部に設けられ、スパイラル状の挿入溝を有する環状のフェライトコアと、前記挿入溝に挿入されるアンテナコイルと、を含むことを特徴とする基板処理装置。 - 前記スパイラル状の挿入溝は、前記環状のフェライトコアの外周から内周に円周方向に形成されることを特徴とする請求項4に記載の基板処理装置。
Applications Claiming Priority (1)
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KR1020060069332A KR100808862B1 (ko) | 2006-07-24 | 2006-07-24 | 기판처리장치 |
Publications (2)
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JP2008027900A JP2008027900A (ja) | 2008-02-07 |
JP4642046B2 true JP4642046B2 (ja) | 2011-03-02 |
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JP2007156466A Active JP4642046B2 (ja) | 2006-07-24 | 2007-06-13 | 基板処理装置 |
Country Status (4)
Country | Link |
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US (1) | US8343309B2 (ja) |
JP (1) | JP4642046B2 (ja) |
KR (1) | KR100808862B1 (ja) |
CN (1) | CN101113514B (ja) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102115879B (zh) * | 2009-12-31 | 2013-06-26 | 丽佳达普株式会社 | 基板处理装置 |
US20110204023A1 (en) * | 2010-02-22 | 2011-08-25 | No-Hyun Huh | Multi inductively coupled plasma reactor and method thereof |
US10271416B2 (en) | 2011-10-28 | 2019-04-23 | Applied Materials, Inc. | High efficiency triple-coil inductively coupled plasma source with phase control |
US8933628B2 (en) * | 2011-10-28 | 2015-01-13 | Applied Materials, Inc. | Inductively coupled plasma source with phase control |
US9279179B2 (en) * | 2012-02-06 | 2016-03-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Multi coil target design |
US10170279B2 (en) * | 2012-07-20 | 2019-01-01 | Applied Materials, Inc. | Multiple coil inductively coupled plasma source with offset frequencies and double-walled shielding |
KR102010321B1 (ko) | 2013-01-10 | 2019-08-13 | 삼성전자주식회사 | 플라즈마 처리 방법과 상기 방법을 이용할 수 있는 장치들 |
JP5874077B1 (ja) * | 2015-03-02 | 2016-03-01 | ブレステクノロジー株式会社 | フィルタ装置、酸素濃縮装置 |
KR101979597B1 (ko) * | 2017-09-21 | 2019-05-20 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
KR101914902B1 (ko) * | 2018-02-14 | 2019-01-14 | 성균관대학교산학협력단 | 플라즈마 발생장치 및 이를 포함하는 기판 처리 장치 |
CN108682611B (zh) * | 2018-05-17 | 2020-03-13 | 大连理工大学 | 一种提高工艺等离子体均匀性的电极 |
US11037765B2 (en) * | 2018-07-03 | 2021-06-15 | Tokyo Electron Limited | Resonant structure for electron cyclotron resonant (ECR) plasma ionization |
KR102041518B1 (ko) * | 2019-07-18 | 2019-11-06 | 에이피티씨 주식회사 | 분리형 플라즈마 소스 코일 및 이의 제어 방법 |
KR20240052286A (ko) | 2022-10-14 | 2024-04-23 | 충남대학교산학협력단 | 유도결합 플라즈마 내에서 독립적인 플라즈마 이온 에너지의 제어가 가능한 안테나 시스템 |
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JP2003022977A (ja) * | 2001-07-10 | 2003-01-24 | Mitsubishi Heavy Ind Ltd | 給電アンテナ及び半導体製造装置 |
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-
2006
- 2006-07-24 KR KR1020060069332A patent/KR100808862B1/ko active IP Right Grant
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2007
- 2007-04-16 US US11/735,549 patent/US8343309B2/en active Active
- 2007-04-29 CN CN200710107773XA patent/CN101113514B/zh active Active
- 2007-06-13 JP JP2007156466A patent/JP4642046B2/ja active Active
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JP2002237487A (ja) * | 2001-02-09 | 2002-08-23 | Tokyo Ohka Kogyo Co Ltd | プラズマ処理装置 |
JP2003022977A (ja) * | 2001-07-10 | 2003-01-24 | Mitsubishi Heavy Ind Ltd | 給電アンテナ及び半導体製造装置 |
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Also Published As
Publication number | Publication date |
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US20080017317A1 (en) | 2008-01-24 |
CN101113514B (zh) | 2011-08-24 |
CN101113514A (zh) | 2008-01-30 |
KR20080009566A (ko) | 2008-01-29 |
US8343309B2 (en) | 2013-01-01 |
KR100808862B1 (ko) | 2008-03-03 |
JP2008027900A (ja) | 2008-02-07 |
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