JP4629158B1 - 蛍光x線分析方法 - Google Patents
蛍光x線分析方法 Download PDFInfo
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- JP4629158B1 JP4629158B1 JP2010150813A JP2010150813A JP4629158B1 JP 4629158 B1 JP4629158 B1 JP 4629158B1 JP 2010150813 A JP2010150813 A JP 2010150813A JP 2010150813 A JP2010150813 A JP 2010150813A JP 4629158 B1 JP4629158 B1 JP 4629158B1
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
【解決手段】炭素、酸素および窒素のうちの少なくとも1元素と水素を主成分とする液体試料3Aに1次X線2を照射し、液体試料3A中の原子番号9〜20の各元素から発生する蛍光X線4の強度と、液体試料3Aで散乱する1次X線の連続X線の散乱線12の強度とを測定し、各元素から発生する蛍光X線4の測定強度と1次X線の連続X線の散乱線12の測定強度との比に基づいて、液体試料3Aにおける元素の濃度を算出する蛍光X線分析方法であり、1次X線の連続X線の散乱線12の波長を、各元素から発生する蛍光X線4の波長よりも短く、かつ、液体試料3Aにおける組成の変動範囲内で、1次X線の連続X線の散乱線12についての測定強度と質量吸収係数とが反比例するように、設定する。
【選択図】図1
Description
2 1次X線
3 試料
3A 液体試料
4 蛍光X線
9 検出手段
10 算出手段
11 入力手段
12 1次X線の連続X線の散乱線
Claims (3)
- 炭素、酸素および窒素のうちの少なくとも1元素ならびに水素を主成分とする液体試料に1次X線を照射し、内標準線として1次X線の連続X線の散乱線を用いる散乱線内標準法を適用する蛍光X線分析方法であって、
前記液体試料中の原子番号9から20までの各元素から発生する蛍光X線の強度と、前記液体試料で散乱する、前記内標準線として用いる1次X線の連続X線の散乱線の強度とを測定し、
前記各元素から発生する蛍光X線の測定強度と前記内標準線として用いる1次X線の連続X線の散乱線の測定強度との比に基づいて、前記液体試料における元素の濃度を算出するにあたり、
前記内標準線として用いる1次X線の連続X線の散乱線の波長を、前記各元素から発生する蛍光X線の波長よりも短く、かつ、無限厚とみなされる試料において、前記液体試料における組成の変動範囲内で、前記内標準線として用いる1次X線の連続X線の散乱線についての測定強度と質量吸収係数とが反比例するように、設定する蛍光X線分析方法。 - 請求項1に記載の蛍光X線分析方法において、
前記内標準線として用いる1次X線の連続X線の散乱線の波長を0.1042nm以上0.2505nm以下に設定する蛍光X線分析方法。 - 請求項1に記載の蛍光X線分析方法において、
前記液体試料中の原子番号15から17までの元素に対して、前記内標準線として用いる1次X線の連続X線の散乱線の波長を0.123nm以上0.193nm以下に設定する蛍光X線分析方法。
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JP2010150813A JP4629158B1 (ja) | 2009-09-07 | 2010-07-01 | 蛍光x線分析方法 |
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US (1) | US8433035B2 (ja) |
EP (1) | EP2333529B1 (ja) |
JP (1) | JP4629158B1 (ja) |
CN (1) | CN102187208B (ja) |
BR (1) | BRPI1005172B8 (ja) |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8433035B2 (en) | 2009-09-07 | 2013-04-30 | Rigaku Corporation | X-ray fluorescence analyzing method |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110304437A1 (en) * | 2010-06-09 | 2011-12-15 | Plus Location Systems USA LLC | Antenna and Sensor System for Sharply Defined Active Sensing Zones |
WO2012045846A1 (en) * | 2010-10-08 | 2012-04-12 | Hecus X-Ray Systems Gmbh | Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation |
JP2013053873A (ja) * | 2011-09-01 | 2013-03-21 | Jeol Ltd | スペクトル表示装置、スペクトル表示方法、およびプログラム |
DE102012204350B4 (de) | 2012-03-20 | 2021-12-02 | Siemens Healthcare Gmbh | Verfahren zur Energie-Kalibrierung quantenzählender Röntgendetektoren in einem Dual-Source Computertomographen |
CN103940836A (zh) * | 2013-01-22 | 2014-07-23 | 中国科学院青海盐湖研究所 | 液体x射线散射样品池 |
WO2015056305A1 (ja) * | 2013-10-15 | 2015-04-23 | 株式会社島津製作所 | 蛍光x線分析方法及び蛍光x線分析装置 |
FR3030043B1 (fr) * | 2014-12-12 | 2017-12-22 | Commissariat Energie Atomique | Procede d'etude d'une zone d'un objet pour en determiner une epaisseur massique et une composition en utilisant un faisceau d'electrons et des mesures d'intensite d'un rayonnement x |
US10018748B2 (en) | 2015-01-16 | 2018-07-10 | Saudi Arabian Oil Company | Inline density and fluorescence spectrometry meter |
US9784699B2 (en) * | 2015-03-03 | 2017-10-10 | Panalytical B.V. | Quantitative X-ray analysis—matrix thickness correction |
EP3239702B1 (en) * | 2015-08-28 | 2019-03-27 | Rigaku Corporation | X-ray fluorescence spectrometer |
CN106908466A (zh) * | 2017-03-29 | 2017-06-30 | 中国科学院过程工程研究所 | 一种在线x射线荧光光谱分析系统 |
JP7111719B2 (ja) * | 2017-08-07 | 2022-08-02 | 上村工業株式会社 | 蛍光x線分析の測定方法及び蛍光x線分析の測定装置 |
JP6979650B2 (ja) * | 2018-03-13 | 2021-12-15 | 株式会社リガク | 蛍光x線分析方法、蛍光x線分析装置またはプログラム |
CN110132188B (zh) * | 2019-06-19 | 2020-11-10 | 中国人民解放军空军工程大学 | 一种基于多元素x射线特征光谱综合分析的涂渗层厚度计算方法 |
JP7302504B2 (ja) * | 2020-02-27 | 2023-07-04 | 株式会社島津製作所 | 蛍光x線分析装置 |
JP2023081557A (ja) * | 2021-12-01 | 2023-06-13 | 株式会社リガク | 蛍光x線分析装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5459193A (en) * | 1977-10-19 | 1979-05-12 | Mitsubishi Electric Corp | Fluorescent x-ray sulfur analytical apparatus |
JPH01214748A (ja) * | 1988-02-24 | 1989-08-29 | Nippon I T S Kk | 微量試料液用蛍光x線分析方法および装置 |
JPH1082749A (ja) * | 1996-07-18 | 1998-03-31 | Rigaku Ind Co | X線分析方法および装置 |
JP2002071590A (ja) * | 2000-09-04 | 2002-03-08 | Rigaku Industrial Co | 蛍光x線分析装置 |
JP2007278965A (ja) * | 2006-04-11 | 2007-10-25 | Rigaku Industrial Co | 蛍光x線分析装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6482749A (en) | 1987-09-24 | 1989-03-28 | Nec Corp | Announcement machine |
US7298817B2 (en) * | 2003-12-01 | 2007-11-20 | X-Ray Optical Systems, Inc. | Portable and on-line arsenic analyzer for drinking water |
JP4247559B2 (ja) * | 2005-06-07 | 2009-04-02 | 株式会社リガク | 蛍光x線分析装置およびそれに用いるプログラム |
JP4262734B2 (ja) * | 2005-09-14 | 2009-05-13 | 株式会社リガク | 蛍光x線分析装置および方法 |
JP4908119B2 (ja) * | 2005-10-19 | 2012-04-04 | 株式会社リガク | 蛍光x線分析装置 |
EP1978354A1 (en) * | 2007-04-05 | 2008-10-08 | Panalytical B.V. | Wavelength dispersive X-ray Fluorescence Apparatus with energy dispersive detector in the form of a silicon drift detector to improve background supression |
JP4514772B2 (ja) | 2007-06-01 | 2010-07-28 | 株式会社リガク | 蛍光x線分析装置およびその方法 |
JP2009205822A (ja) | 2008-02-26 | 2009-09-10 | Panasonic Electric Works Co Ltd | 照明器具 |
US8433035B2 (en) | 2009-09-07 | 2013-04-30 | Rigaku Corporation | X-ray fluorescence analyzing method |
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- 2010-07-01 WO PCT/JP2010/061250 patent/WO2011027613A1/ja active Application Filing
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5459193A (en) * | 1977-10-19 | 1979-05-12 | Mitsubishi Electric Corp | Fluorescent x-ray sulfur analytical apparatus |
JPH01214748A (ja) * | 1988-02-24 | 1989-08-29 | Nippon I T S Kk | 微量試料液用蛍光x線分析方法および装置 |
JPH1082749A (ja) * | 1996-07-18 | 1998-03-31 | Rigaku Ind Co | X線分析方法および装置 |
JP2002071590A (ja) * | 2000-09-04 | 2002-03-08 | Rigaku Industrial Co | 蛍光x線分析装置 |
JP2007278965A (ja) * | 2006-04-11 | 2007-10-25 | Rigaku Industrial Co | 蛍光x線分析装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8433035B2 (en) | 2009-09-07 | 2013-04-30 | Rigaku Corporation | X-ray fluorescence analyzing method |
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EP2333529B1 (en) | 2013-10-16 |
EP2333529A1 (en) | 2011-06-15 |
BRPI1005172B8 (pt) | 2020-09-08 |
CN102187208A (zh) | 2011-09-14 |
EP2333529A4 (en) | 2011-09-07 |
WO2011027613A1 (ja) | 2011-03-10 |
US8433035B2 (en) | 2013-04-30 |
BRPI1005172B1 (pt) | 2019-09-10 |
US20110243301A1 (en) | 2011-10-06 |
CN102187208B (zh) | 2013-12-04 |
BRPI1005172A2 (pt) | 2017-04-25 |
JP2011075542A (ja) | 2011-04-14 |
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