JP4628165B2 - 磁粉式探傷装置 - Google Patents

磁粉式探傷装置 Download PDF

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JP4628165B2
JP4628165B2 JP2005115475A JP2005115475A JP4628165B2 JP 4628165 B2 JP4628165 B2 JP 4628165B2 JP 2005115475 A JP2005115475 A JP 2005115475A JP 2005115475 A JP2005115475 A JP 2005115475A JP 4628165 B2 JP4628165 B2 JP 4628165B2
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phase
magnetic
flaw detection
axis
magnetizing
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JP2006292607A (ja
JP2006292607A5 (enrdf_load_stackoverflow
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充孝 堀
通 山田
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日本電磁測器株式会社
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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP2005115475A 2005-04-13 2005-04-13 磁粉式探傷装置 Expired - Lifetime JP4628165B2 (ja)

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JP2005115475A JP4628165B2 (ja) 2005-04-13 2005-04-13 磁粉式探傷装置

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JP2005115475A JP4628165B2 (ja) 2005-04-13 2005-04-13 磁粉式探傷装置

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JP2006292607A JP2006292607A (ja) 2006-10-26
JP2006292607A5 JP2006292607A5 (enrdf_load_stackoverflow) 2008-03-27
JP4628165B2 true JP4628165B2 (ja) 2011-02-09

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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2955514B1 (de) * 2014-06-12 2019-01-09 Helling GmbH Vorrichtung und Verfahren zur zerstörungsfreien Prüfung metallischer Werkstücke
CN107941901B (zh) * 2018-01-19 2024-03-01 沈阳工业大学 一种基于逐级磁饱和结构的高速漏磁检测系统
CN111595935B (zh) * 2020-05-13 2020-12-01 盐城工学院 一种物联网磁粉探伤设备
CN111965247A (zh) * 2020-08-17 2020-11-20 北京聚龙科技发展有限公司 一种物联网探伤控制装置及控制方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56167309A (en) * 1980-05-28 1981-12-23 Kenzo Okumura Omnidirectional magnetizing device
JPS63174588A (ja) * 1986-12-24 1988-07-19 タイ−ハ−　ヤン 三相或いはその倍数相の同極性磁極構成の交流モ−タ
JPH07103942A (ja) * 1993-09-30 1995-04-21 Nippon Denji Sokki Kk 探傷用磁化装置
JP3053521B2 (ja) * 1994-03-14 2000-06-19 日本鋼管株式会社 磁粉探傷装置
JP4046392B2 (ja) * 1997-12-02 2008-02-13 日本電磁測器株式会社 磁粉探傷用磁化装置
JP2004037438A (ja) * 2002-07-05 2004-02-05 Nippon Jiki Kogyo Kk 組み合わせコイルを用いた３軸式パルス電流磁化磁粉探傷方法

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