JP4619349B2 - 偏心断層合成 - Google Patents
偏心断層合成 Download PDFInfo
- Publication number
- JP4619349B2 JP4619349B2 JP2006351449A JP2006351449A JP4619349B2 JP 4619349 B2 JP4619349 B2 JP 4619349B2 JP 2006351449 A JP2006351449 A JP 2006351449A JP 2006351449 A JP2006351449 A JP 2006351449A JP 4619349 B2 JP4619349 B2 JP 4619349B2
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- Prior art keywords
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- QTOFPEIEEXFFFK-UHFFFAOYSA-N C(C1)c(cc2)c3c4c2ccc2c4c4c5c3c1ccc5ccc4cc2 Chemical compound C(C1)c(cc2)c3c4c2ccc2c4c4c5c3c1ccc5ccc4cc2 QTOFPEIEEXFFFK-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/044—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Description
更に、操舵可能なX線源と大型フォーマット検出器の両方を必要としない断層合成画像化技法を使ったX線検査システムの技術が必要とされている。
Claims (6)
- 試験対象のX線画像を捕捉するための装置において、
X線ビームを生成するための操舵可能なX線源であって、垂直軸に直交する水平経路に沿って、それぞれが垂直軸からある角度に配置された多数の異なる位置からX線を差し向けるX線源と、
前記X線源の前記異なる位置の各々からの、前記試験対象の少なくとも2つの関心領域を透過するX線を受け取り、受け取ったX線から、複数の捕捉された別個の画像の電子的表示を作成するように配置された検出器と、を備え、
前記X線源の前記異なる位置にて捕捉される前記画像は、それぞれ前記試験対象の異なる前記関心領域に対応した画像である、装置。 - 制御システムは、前記X線を、前記各位置で前記試験対象の第2の関心領域に向かわせる、請求項1に記載の装置。
- 一つの位置に対応する第1の関心領域の画像と、もう一つの位置に対応する第2の関心領域の画像は、順次捕捉される、請求項1に記載の装置。
- 前記検出器は、ヨウ化セシウム製のスクリーンを含んでいる、請求項1に記載の装置。
- 前記検出器に連結したカメラを更に含んでいる、請求項1に記載の装置。
- 複数のX線画像を捕捉する方法において、
少なくとも2つの関心領域を有する試験対象を検査面に配置する段階と、
垂直軸に直交する水平経路に沿う多数の異なる位置から、X線源からのX線ビームを操舵する段階と、
前記X線源の前記異なる位置の各々から、前記試験対象の第1の関心領域及び第2の関心領域に対してX線を向かわせる段階と、
前記第1の関心領域及び前記第2の関心領域を透過するX線を検出器上で受け取る段階と、
受け取ったX線から、複数の捕捉された別個の画像の電子的表示を作成する段階であって、前記X線源の前記異なる位置にて捕捉される前記画像が、それぞれ前記試験対象の異なる前記関心領域に対応した画像である、段階と、から成る方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/731,335 US6748046B2 (en) | 2000-12-06 | 2000-12-06 | Off-center tomosynthesis |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002548419A Division JP2004515762A (ja) | 2000-12-06 | 2001-12-05 | 偏心断層合成 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007127668A JP2007127668A (ja) | 2007-05-24 |
JP4619349B2 true JP4619349B2 (ja) | 2011-01-26 |
Family
ID=24939067
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002548419A Pending JP2004515762A (ja) | 2000-12-06 | 2001-12-05 | 偏心断層合成 |
JP2006351449A Expired - Fee Related JP4619349B2 (ja) | 2000-12-06 | 2006-12-27 | 偏心断層合成 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002548419A Pending JP2004515762A (ja) | 2000-12-06 | 2001-12-05 | 偏心断層合成 |
Country Status (13)
Country | Link |
---|---|
US (1) | US6748046B2 (ja) |
EP (1) | EP1350088B1 (ja) |
JP (2) | JP2004515762A (ja) |
KR (2) | KR20080074986A (ja) |
CN (1) | CN100465629C (ja) |
AT (1) | ATE498124T1 (ja) |
AU (1) | AU2002226058A1 (ja) |
BR (1) | BR0116192A (ja) |
CA (1) | CA2441881A1 (ja) |
DE (1) | DE60144026D1 (ja) |
MX (1) | MXPA03004979A (ja) |
TW (1) | TW573118B (ja) |
WO (1) | WO2002046729A1 (ja) |
Families Citing this family (37)
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US10638994B2 (en) | 2002-11-27 | 2020-05-05 | Hologic, Inc. | X-ray mammography with tomosynthesis |
US7110490B2 (en) * | 2002-12-10 | 2006-09-19 | General Electric Company | Full field digital tomosynthesis method and apparatus |
US20050100102A1 (en) * | 2003-08-04 | 2005-05-12 | Gazdzinski Robert F. | Error-corrected wideband holographic communications apparatus and methods |
JP4603823B2 (ja) * | 2003-10-14 | 2010-12-22 | キヤノン株式会社 | 放射線撮像装置、放射線撮像方法及びプログラム |
JP4636500B2 (ja) * | 2005-03-28 | 2011-02-23 | 名古屋電機工業株式会社 | X線検査装置、x線検査方法およびx線検査プログラム |
US7245693B2 (en) * | 2005-06-02 | 2007-07-17 | Agilent Technologies, Inc. | X-ray inspection system having on-axis and off-axis sensors |
DE102005026578A1 (de) * | 2005-06-08 | 2006-12-21 | Comet Gmbh | Vorrichtung zur Röntgen-Laminographie und/oder Tomosynthese |
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DE202005017496U1 (de) * | 2005-11-07 | 2007-03-15 | Comet Gmbh | Target für eine Mikrofocus- oder Nanofocus-Röntgenröhre |
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US8031929B2 (en) * | 2007-09-21 | 2011-10-04 | Teradyne, Inc. | X-ray inspection of solder reflow in high-density printed circuit board applications |
WO2009078415A1 (ja) * | 2007-12-17 | 2009-06-25 | Uni-Hite System Corporation | X線検査装置および方法 |
CN101960296B (zh) * | 2007-12-27 | 2012-12-12 | 欧姆龙株式会社 | X射线检查装置及x射线检查方法 |
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WO2009121051A2 (en) * | 2008-03-28 | 2009-10-01 | Nordson Corporation | X-ray inspection systems and methods |
DE102008046698A1 (de) * | 2008-09-10 | 2010-03-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Röntgencomputertomograf zur zerstörungsfreien Prüfung von aus Materiallagen aufgebauten Objekten mittels Röntgencomputertomografie |
TWI394490B (zh) * | 2008-09-10 | 2013-04-21 | Omron Tateisi Electronics Co | X射線檢查裝置及x射線檢查方法 |
US7986764B2 (en) * | 2008-12-08 | 2011-07-26 | Morpho Detection, Inc. | X-ray laminography device, object imaging system, and method for operating a security system |
CN102265142A (zh) * | 2008-12-22 | 2011-11-30 | 欧姆龙株式会社 | X射线检查方法和x射线检查装置 |
US20110255660A1 (en) * | 2008-12-22 | 2011-10-20 | Omron Corporation | X-ray inspection method and x-ray inspection apparatus |
US8515004B2 (en) * | 2009-01-16 | 2013-08-20 | Varian Medical Systems, Inc. | Real-time motion tracking using tomosynthesis |
CN101839871B (zh) * | 2010-05-18 | 2011-12-28 | 华南理工大学 | 一种x射线分层摄影检测方法与系统 |
CN103278515A (zh) * | 2013-05-16 | 2013-09-04 | 华南理工大学 | 旋转式x射线分层摄影检测系统与方法 |
WO2014204628A1 (en) * | 2013-06-17 | 2014-12-24 | Hexagon Metrology, Inc. | Method and apparatus of measuring objects using selective imaging |
US9642581B2 (en) * | 2013-11-12 | 2017-05-09 | KUB Technologies, Inc. | Specimen radiography with tomosynthesis in a cabinet |
US10488351B2 (en) | 2016-09-07 | 2019-11-26 | KUB Technologies, Inc. | Specimen radiography with tomosynthesis in a cabinet with geometric magnification |
US10830712B2 (en) * | 2017-03-27 | 2020-11-10 | KUB Technologies, Inc. | System and method for cabinet x-ray systems with camera |
JP6622260B2 (ja) * | 2017-07-07 | 2019-12-18 | 名古屋電機工業株式会社 | 3次元撮像装置、3次元撮像方法および3次元撮像プログラム |
EP3832689A3 (en) | 2019-12-05 | 2021-08-11 | Hologic, Inc. | Systems and methods for improved x-ray tube life |
US11471118B2 (en) | 2020-03-27 | 2022-10-18 | Hologic, Inc. | System and method for tracking x-ray tube focal spot position |
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JPH05503652A (ja) * | 1990-08-30 | 1993-06-17 | フォア ピーアイ システムズ コーポレイション | 多軌道断層撮影システム |
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JP2000180997A (ja) * | 1998-12-18 | 2000-06-30 | Matsushita Electric Ind Co Ltd | X線受像装置 |
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-
2000
- 2000-12-06 US US09/731,335 patent/US6748046B2/en not_active Expired - Fee Related
-
2001
- 2001-12-05 CA CA002441881A patent/CA2441881A1/en not_active Abandoned
- 2001-12-05 EP EP01995480A patent/EP1350088B1/en not_active Expired - Lifetime
- 2001-12-05 WO PCT/US2001/047540 patent/WO2002046729A1/en active IP Right Grant
- 2001-12-05 JP JP2002548419A patent/JP2004515762A/ja active Pending
- 2001-12-05 MX MXPA03004979A patent/MXPA03004979A/es active IP Right Grant
- 2001-12-05 AT AT01995480T patent/ATE498124T1/de not_active IP Right Cessation
- 2001-12-05 BR BR0116192-0A patent/BR0116192A/pt not_active IP Right Cessation
- 2001-12-05 CN CNB018201628A patent/CN100465629C/zh not_active Expired - Fee Related
- 2001-12-05 DE DE60144026T patent/DE60144026D1/de not_active Expired - Lifetime
- 2001-12-05 KR KR1020087014573A patent/KR20080074986A/ko active Search and Examination
- 2001-12-05 AU AU2002226058A patent/AU2002226058A1/en not_active Abandoned
- 2001-12-05 KR KR1020037007589A patent/KR100863975B1/ko not_active IP Right Cessation
-
2002
- 2002-10-08 TW TW091123171A patent/TW573118B/zh not_active IP Right Cessation
-
2006
- 2006-12-27 JP JP2006351449A patent/JP4619349B2/ja not_active Expired - Fee Related
Patent Citations (3)
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JPH05503652A (ja) * | 1990-08-30 | 1993-06-17 | フォア ピーアイ システムズ コーポレイション | 多軌道断層撮影システム |
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JP2000180997A (ja) * | 1998-12-18 | 2000-06-30 | Matsushita Electric Ind Co Ltd | X線受像装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20080074986A (ko) | 2008-08-13 |
CN1479868A (zh) | 2004-03-03 |
DE60144026D1 (en) | 2011-03-24 |
JP2004515762A (ja) | 2004-05-27 |
CA2441881A1 (en) | 2002-06-13 |
JP2007127668A (ja) | 2007-05-24 |
MXPA03004979A (es) | 2005-04-29 |
CN100465629C (zh) | 2009-03-04 |
EP1350088A1 (en) | 2003-10-08 |
US20030058983A1 (en) | 2003-03-27 |
AU2002226058A1 (en) | 2002-06-18 |
EP1350088A4 (en) | 2006-05-03 |
KR20030055340A (ko) | 2003-07-02 |
ATE498124T1 (de) | 2011-02-15 |
KR100863975B1 (ko) | 2008-10-16 |
TW573118B (en) | 2004-01-21 |
BR0116192A (pt) | 2004-01-13 |
US6748046B2 (en) | 2004-06-08 |
WO2002046729A1 (en) | 2002-06-13 |
EP1350088B1 (en) | 2011-02-09 |
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