JP4576876B2 - 顕微鏡システム - Google Patents

顕微鏡システム Download PDF

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Publication number
JP4576876B2
JP4576876B2 JP2004140264A JP2004140264A JP4576876B2 JP 4576876 B2 JP4576876 B2 JP 4576876B2 JP 2004140264 A JP2004140264 A JP 2004140264A JP 2004140264 A JP2004140264 A JP 2004140264A JP 4576876 B2 JP4576876 B2 JP 4576876B2
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JP
Japan
Prior art keywords
observation
optical system
mirror
objective lens
magnification
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Expired - Fee Related
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JP2004140264A
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English (en)
Japanese (ja)
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JP2005321657A5 (enExample
JP2005321657A (ja
Inventor
一郎 佐瀬
勝也 渡邊
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Nikon Corp
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Nikon Corp
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Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP2004140264A priority Critical patent/JP4576876B2/ja
Priority to US11/121,961 priority patent/US7630113B2/en
Priority to DE102005021569A priority patent/DE102005021569A1/de
Publication of JP2005321657A publication Critical patent/JP2005321657A/ja
Publication of JP2005321657A5 publication Critical patent/JP2005321657A5/ja
Priority to US12/536,408 priority patent/US7957057B2/en
Application granted granted Critical
Publication of JP4576876B2 publication Critical patent/JP4576876B2/ja
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/32—Micromanipulators structurally combined with microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
JP2004140264A 2004-05-10 2004-05-10 顕微鏡システム Expired - Fee Related JP4576876B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004140264A JP4576876B2 (ja) 2004-05-10 2004-05-10 顕微鏡システム
US11/121,961 US7630113B2 (en) 2004-05-10 2005-05-05 Microscope optical system, microscope, and virtual slide forming system
DE102005021569A DE102005021569A1 (de) 2004-05-10 2005-05-10 Optisches Mikroskopsystem, Mikroskop, und System zum Erzeugen virtueller Abbilder
US12/536,408 US7957057B2 (en) 2004-05-10 2009-08-05 Microscope optical system, microscope, and virtual slide forming system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004140264A JP4576876B2 (ja) 2004-05-10 2004-05-10 顕微鏡システム

Publications (3)

Publication Number Publication Date
JP2005321657A JP2005321657A (ja) 2005-11-17
JP2005321657A5 JP2005321657A5 (enExample) 2007-08-23
JP4576876B2 true JP4576876B2 (ja) 2010-11-10

Family

ID=35239177

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004140264A Expired - Fee Related JP4576876B2 (ja) 2004-05-10 2004-05-10 顕微鏡システム

Country Status (3)

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US (2) US7630113B2 (enExample)
JP (1) JP4576876B2 (enExample)
DE (1) DE102005021569A1 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4915071B2 (ja) * 2005-09-22 2012-04-11 株式会社ニコン 顕微鏡、およびバーチャルスライド作成システム
DE102006009452B4 (de) * 2005-10-20 2010-07-01 Carl Zeiss Surgical Gmbh Stereomikroskop
DE102006012388A1 (de) * 2005-10-20 2007-04-26 Carl Zeiss Surgical Gmbh Mikroskopiesystem
US20070165107A1 (en) * 2006-01-18 2007-07-19 Trulaske James A Visual positioning system for closed circuit video magnification system
DE102006003575A1 (de) * 2006-01-25 2007-07-26 Carl Zeiss Surgical Gmbh Optisches System, Verwendung eines optischen Systems sowie Verfahren zur Betrachtung eines Objektes mit einem optischen System
DE102006010767B4 (de) * 2006-03-08 2008-04-17 Carl Zeiss Surgical Gmbh Mikroskopiesystem
JP5014061B2 (ja) * 2007-10-22 2012-08-29 日本分光株式会社 顕微測定装置
JP2009116054A (ja) * 2007-11-07 2009-05-28 Nikon Corp 光学装置および顕微鏡
US20090244698A1 (en) * 2008-03-28 2009-10-01 Reto Zust Microscope comprising at least two components
JP2010117705A (ja) * 2008-10-14 2010-05-27 Olympus Corp バーチャルスライド作成システム用顕微鏡
EP2204686B9 (en) 2008-12-30 2012-11-14 Cellavision AB Analyser for optical analysis of a biological specimen
US8254023B2 (en) * 2009-02-23 2012-08-28 Visiongate, Inc. Optical tomography system with high-speed scanner
JP5739351B2 (ja) 2009-03-11 2015-06-24 サクラ ファインテック ユー．エス．エー．， インコーポレイテッド 自動合焦方法および自動合焦装置
DE102009041994A1 (de) * 2009-09-18 2011-03-24 Carl Zeiss Microlmaging Gmbh Variables Mikroskopsystem
US10139613B2 (en) 2010-08-20 2018-11-27 Sakura Finetek U.S.A., Inc. Digital microscope and method of sensing an image of a tissue sample
JP2013152454A (ja) * 2011-12-27 2013-08-08 Canon Inc 画像処理装置、画像処理システム、画像処理方法および画像処理プログラム
US9628676B2 (en) 2012-06-07 2017-04-18 Complete Genomics, Inc. Imaging systems with movable scan mirrors
US9488823B2 (en) 2012-06-07 2016-11-08 Complete Genomics, Inc. Techniques for scanned illumination
JP2014163976A (ja) * 2013-02-21 2014-09-08 Canon Inc 画像取得装置および画像取得システム
DE102013103971A1 (de) 2013-04-19 2014-11-06 Sensovation Ag Verfahren zum Erzeugen eines aus mehreren Teilbildern zusammengesetzten Gesamtbilds eines Objekts
JP6285112B2 (ja) * 2013-06-03 2018-02-28 浜松ホトニクス株式会社 光分割装置
US10007102B2 (en) 2013-12-23 2018-06-26 Sakura Finetek U.S.A., Inc. Microscope with slide clamping assembly
CN107949800B (zh) 2015-09-17 2021-12-10 国立研究开发法人科学技术振兴机构 显微镜用光学模块、显微镜、显微镜用光学模块控制装置以及多光子激发显微镜
US11069054B2 (en) 2015-12-30 2021-07-20 Visiongate, Inc. System and method for automated detection and monitoring of dysplasia and administration of immunotherapy and chemotherapy
JP2019514051A (ja) * 2016-03-24 2019-05-30 マツクス−プランク−ゲゼルシヤフト ツール フエルデルング デル ヴイツセンシヤフテン エー フアウＭＡＸ−ＰＬＡＮＣＫ−ＧＥＳＥＬＬＳＣＨＡＦＴ ＺＵＲ ＦＯｅＲＤＥＲＵＮＧ ＤＥＲ ＷＩＳＳＥＮＳＣＨＡＦＴＥＮ Ｅ．Ｖ． 垂直方向のカメラを含む時空間光変調結像システム、および物体を共焦点結像させるための方法
WO2018089839A1 (en) 2016-11-10 2018-05-17 The Trustees Of Columbia University In The City Of New York Rapid high-resolution imaging methods for large samples
US11280803B2 (en) 2016-11-22 2022-03-22 Sakura Finetek U.S.A., Inc. Slide management system
WO2018151302A1 (ja) * 2017-02-20 2018-08-23 株式会社ＬｉｇｈｔｅＳ 光学装置
US10641659B2 (en) * 2018-08-14 2020-05-05 Shimadzu Corporation Infrared microscope with adjustable connection optical system
US11256078B2 (en) * 2019-10-13 2022-02-22 Yale University Continuous scanning for localization microscopy

Family Cites Families (19)

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Publication number Priority date Publication date Assignee Title
DE1472293A1 (de) * 1966-08-10 1969-01-23 Leitz Ernst Gmbh Vorrichtung zur optischen Abtastung mikroskopischer Objekte
DE10136481A1 (de) * 2001-07-27 2003-02-20 Leica Microsystems Anordnung zum Mikromanipulieren von biologischen Objekten
DE2908334A1 (de) * 1978-04-03 1979-10-18 Leitz Ernst Gmbh Mikrofotografische lichtmesseinrichtung
DE3718066A1 (de) * 1987-05-29 1988-12-08 Zeiss Carl Fa Verfahren zur mikroinjektion in zellen bzw. zum absaugen aus einzelnen zellen oder ganzer zellen aus zellkulturen
JPH08164148A (ja) * 1994-12-13 1996-06-25 Olympus Optical Co Ltd 内視鏡下手術装置
JP3655677B2 (ja) * 1995-11-08 2005-06-02 オリンパス株式会社 共焦点走査型光学顕微鏡
US6272235B1 (en) * 1997-03-03 2001-08-07 Bacus Research Laboratories, Inc. Method and apparatus for creating a virtual microscope slide
DE19654211C2 (de) * 1996-12-24 2000-07-06 Leica Microsystems Konfokales Mikroskop
US6771310B1 (en) 1997-01-14 2004-08-03 Canon Denshi Kabushiki Kaisha Image pickup apparatus with optical beam shifting with independently controlled optical elements
JP3816632B2 (ja) * 1997-05-14 2006-08-30 オリンパス株式会社 走査型顕微鏡
JPH10325798A (ja) * 1997-05-23 1998-12-08 Olympus Optical Co Ltd 顕微鏡装置
US6313452B1 (en) * 1998-06-10 2001-11-06 Sarnoff Corporation Microscopy system utilizing a plurality of images for enhanced image processing capabilities
JP3379928B2 (ja) * 1998-11-30 2003-02-24 オリンパス光学工業株式会社 測定装置
JP2000187165A (ja) * 1998-12-22 2000-07-04 Sony Corp 顕微鏡装置
DE10029680B4 (de) * 2000-06-23 2016-06-16 Leica Microsystems Cms Gmbh Mikroskop-Aufbau
JP2002031758A (ja) 2000-07-17 2002-01-31 Olympus Optical Co Ltd 顕微鏡
US6945930B2 (en) * 2001-08-31 2005-09-20 Olympus Corporation Environment adaptable measurement endoscope
AU2003272519A1 (en) * 2002-09-16 2004-04-30 Rensselaer Polytechnic Institute Microscope with extended field of vision
US7233340B2 (en) * 2003-02-27 2007-06-19 Applied Imaging Corp. Linking of images to enable simultaneous viewing of multiple objects

Also Published As

Publication number Publication date
DE102005021569A1 (de) 2005-12-08
US20100002289A1 (en) 2010-01-07
US7630113B2 (en) 2009-12-08
US7957057B2 (en) 2011-06-07
JP2005321657A (ja) 2005-11-17
US20050248837A1 (en) 2005-11-10

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