JP4574011B2 - 湾曲基板における真空蒸着法 - Google Patents

湾曲基板における真空蒸着法 Download PDF

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Publication number
JP4574011B2
JP4574011B2 JP2000569032A JP2000569032A JP4574011B2 JP 4574011 B2 JP4574011 B2 JP 4574011B2 JP 2000569032 A JP2000569032 A JP 2000569032A JP 2000569032 A JP2000569032 A JP 2000569032A JP 4574011 B2 JP4574011 B2 JP 4574011B2
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Japan
Prior art keywords
mask
curved substrate
sputtering
substrate according
diameter
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Expired - Lifetime
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JP2000569032A
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English (en)
Japanese (ja)
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JP2002524659A5 (https=
JP2002524659A (ja
Inventor
パスカル コンブル
ジェラール ケラー
フレデリック ムーオ
Original Assignee
エシロール アンテルナショナル コムパニー ジェネラル ドプテイク
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Publication of JP2002524659A5 publication Critical patent/JP2002524659A5/ja
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • C23C14/044Coating on selected surface areas, e.g. using masks using masks using masks to redistribute rather than totally prevent coating, e.g. producing thickness gradient

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Laminated Bodies (AREA)
JP2000569032A 1998-09-04 1999-09-02 湾曲基板における真空蒸着法 Expired - Lifetime JP4574011B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR9811100A FR2783001B1 (fr) 1998-09-04 1998-09-04 Procede pour le traitement sous vide d'un quelconque substrat courbe, notamment un verre de lunettes, et cache propre a la mise en oeuvre d'un tel procede
FR98/11100 1998-09-04
PCT/FR1999/002092 WO2000014294A1 (fr) 1998-09-04 1999-09-02 Procede pour le depot sous vide d'un substrat courbe

Publications (3)

Publication Number Publication Date
JP2002524659A JP2002524659A (ja) 2002-08-06
JP2002524659A5 JP2002524659A5 (https=) 2010-04-30
JP4574011B2 true JP4574011B2 (ja) 2010-11-04

Family

ID=9530149

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000569032A Expired - Lifetime JP4574011B2 (ja) 1998-09-04 1999-09-02 湾曲基板における真空蒸着法

Country Status (10)

Country Link
US (1) US7122223B1 (https=)
EP (1) EP1114200B1 (https=)
JP (1) JP4574011B2 (https=)
AT (1) ATE217362T1 (https=)
AU (1) AU761513B2 (https=)
CA (1) CA2341608C (https=)
DE (1) DE69901455T2 (https=)
ES (1) ES2177311T3 (https=)
FR (1) FR2783001B1 (https=)
WO (1) WO2000014294A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7014317B2 (en) 2001-11-02 2006-03-21 Essilor International (Compagnie Generale D'optique) Method for manufacturing multifocal lenses
DE10234855A1 (de) * 2002-07-31 2004-02-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Einrichtung zur Einstellung einer vorgegebenen Schichtdickenverteilung bei Vakuumbeschichtungsprozessen auf bewegten Substraten
US8347814B2 (en) * 2008-01-22 2013-01-08 Raytheon Canada Limited Method and apparatus for coating a curved surface
US20090258151A1 (en) * 2008-04-10 2009-10-15 Raytheon Company Method and Apparatus for Coating Curved Surfaces
US8293017B2 (en) * 2008-04-10 2012-10-23 Raytheon Canada Limited Method and apparatus for coating surfaces
US8398776B2 (en) * 2008-05-12 2013-03-19 Raytheon Canada Limited Method and apparatus for supporting workpieces in a coating apparatus
US8246748B2 (en) * 2008-07-09 2012-08-21 Raytheon Canada Limited Method and apparatus for coating surfaces
US20100047594A1 (en) * 2008-08-20 2010-02-25 Aharon Inspektor Equipment and method for physical vapor deposition
US20110020623A1 (en) * 2009-07-22 2011-01-27 Raytheon Company Method and Apparatus for Repairing an Optical Component Substrate Through Coating
CN104988464B (zh) * 2015-06-30 2017-10-27 中国工程物理研究院材料研究所 一种轴对称曲面件内表面均匀磁控溅射沉积方法及其装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1380432A (fr) * 1961-12-14 1964-12-04 Siemens Ag Procédé pour déposer au moyen d'une vapeur une couche sur un support, en particulier un corps semi-conducteur en forme de disque
US3627569A (en) * 1968-12-27 1971-12-14 Bell Telephone Labor Inc Deposition of thin films with controlled thickness and planar area profile
FR2406217A1 (fr) * 1977-10-14 1979-05-11 Essilor Int Procede pour le marquage d'une lentille ophtalmique en matiere organique, et une telle lentille ainsi marquee
US4222345A (en) * 1978-11-30 1980-09-16 Optical Coating Laboratory, Inc. Vacuum coating apparatus with rotary motion assembly
JPH0239588B2 (ja) * 1984-04-16 1990-09-06 Ulvac Corp Puranetariishikiseimakusochiniokerumakuatsushuseisochi
JPS62239103A (ja) * 1986-04-11 1987-10-20 Alps Electric Co Ltd プラスチツクレンズ
US5225057A (en) * 1988-02-08 1993-07-06 Optical Coating Laboratory, Inc. Process for depositing optical films on both planar and non-planar substrates
DE3816578C1 (en) * 1988-05-14 1989-03-16 Agfa-Gevaert Ag, 5090 Leverkusen, De Process and device for the vapour deposition of graded-light filter layers on transparent plates
JPH0331473A (ja) * 1989-06-27 1991-02-12 Mitsubishi Electric Corp プラネタリー式成膜装置
US5389397A (en) 1989-08-29 1995-02-14 North American Philips Corporation Method for controlling the thickness distribution of a deposited layer
JP2825918B2 (ja) * 1990-03-13 1998-11-18 キヤノン株式会社 真空蒸着装置
EP0496036B1 (en) * 1991-01-25 1994-12-14 Sony Corporation A sputtering apparatus
JPH04371578A (ja) * 1991-06-19 1992-12-24 Sony Corp マグネトロンスパッタリング装置
JPH0643304A (ja) * 1992-07-24 1994-02-18 Nikon Corp 反射防止膜及び反射防止膜付き光学部品
JP3412849B2 (ja) * 1992-12-25 2003-06-03 キヤノン株式会社 薄膜蒸着装置
US5724189A (en) * 1995-12-15 1998-03-03 Mcdonnell Douglas Corporation Methods and apparatus for creating an aspheric optical element and the aspheric optical elements formed thereby
JPH10176267A (ja) * 1996-12-13 1998-06-30 Applied Materials Inc スパッタ装置
GB9701114D0 (en) * 1997-01-20 1997-03-12 Coherent Optics Europ Ltd Three-dimensional masking method for control of optical coating thickness

Also Published As

Publication number Publication date
FR2783001B1 (fr) 2000-11-24
AU5428099A (en) 2000-03-27
US7122223B1 (en) 2006-10-17
DE69901455D1 (de) 2002-06-13
WO2000014294A1 (fr) 2000-03-16
CA2341608C (fr) 2005-07-12
EP1114200B1 (fr) 2002-05-08
DE69901455T2 (de) 2002-12-12
ATE217362T1 (de) 2002-05-15
CA2341608A1 (fr) 2000-03-16
EP1114200A1 (fr) 2001-07-11
FR2783001A1 (fr) 2000-03-10
AU761513B2 (en) 2003-06-05
JP2002524659A (ja) 2002-08-06
ES2177311T3 (es) 2002-12-01

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