JP4506524B2 - 発光分光分析装置 - Google Patents

発光分光分析装置 Download PDF

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Publication number
JP4506524B2
JP4506524B2 JP2005076958A JP2005076958A JP4506524B2 JP 4506524 B2 JP4506524 B2 JP 4506524B2 JP 2005076958 A JP2005076958 A JP 2005076958A JP 2005076958 A JP2005076958 A JP 2005076958A JP 4506524 B2 JP4506524 B2 JP 4506524B2
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background
wavelength
sample
emission spectroscopic
samples
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Japanese (ja)
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JP2006258633A5 (enExample
JP2006258633A (ja
Inventor
敬久 大森
伸彦 西
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Shimadzu Corp
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Shimadzu Corp
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  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2005076958A 2005-03-17 2005-03-17 発光分光分析装置 Expired - Lifetime JP4506524B2 (ja)

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JP2005076958A JP4506524B2 (ja) 2005-03-17 2005-03-17 発光分光分析装置

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JP2005076958A JP4506524B2 (ja) 2005-03-17 2005-03-17 発光分光分析装置

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JP2006258633A JP2006258633A (ja) 2006-09-28
JP2006258633A5 JP2006258633A5 (enExample) 2007-07-26
JP4506524B2 true JP4506524B2 (ja) 2010-07-21

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3217420A1 (en) * 2016-03-09 2017-09-13 Carl Zeiss Microscopy Ltd. Method, analysis system and computer program product for semi-automated x-ray elemental analysis using a particle microscope

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6316064B2 (ja) * 2014-03-31 2018-04-25 株式会社日立ハイテクサイエンス Ｉｃｐ発光分光分析装置
JP6501230B2 (ja) 2016-03-08 2019-04-17 株式会社リガク 多元素同時型蛍光ｘ線分析装置および多元素同時蛍光ｘ線分析方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61270645A (ja) * 1985-05-24 1986-11-29 Hitachi Ltd 誘導結合プラズマ発光分析装置
JP4068256B2 (ja) * 1999-02-26 2008-03-26 独立行政法人科学技術振興機構 フーリエ変換ラマン分光測定による樹木組織構造の定量方法、定量装置及びコンピュータ読取り可能な記録媒体

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3217420A1 (en) * 2016-03-09 2017-09-13 Carl Zeiss Microscopy Ltd. Method, analysis system and computer program product for semi-automated x-ray elemental analysis using a particle microscope

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JP2006258633A (ja) 2006-09-28

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