JP4414595B2 - 光学部品を欠陥がないか検査するための検査モジュール - Google Patents

光学部品を欠陥がないか検査するための検査モジュール Download PDF

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Publication number
JP4414595B2
JP4414595B2 JP2000565375A JP2000565375A JP4414595B2 JP 4414595 B2 JP4414595 B2 JP 4414595B2 JP 2000565375 A JP2000565375 A JP 2000565375A JP 2000565375 A JP2000565375 A JP 2000565375A JP 4414595 B2 JP4414595 B2 JP 4414595B2
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Japan
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inspection
container
inspected
liquid
inspection module
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JP2000565375A
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English (en)
Japanese (ja)
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JP2002522784A (ja
JP2002522784A5 (https=
Inventor
ビッケルト,シュテファン
ハウク,ロランド
ローテ,オラフ
ザイベルト,ロランド
ヴェルナー,ハンス
ハグマン,ペーター
ビール,ロジャー
Original Assignee
ノバルティス アクチエンゲゼルシャフト
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Publication of JP2002522784A5 publication Critical patent/JP2002522784A5/ja
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Publication of JP4414595B2 publication Critical patent/JP4414595B2/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0207Details of measuring devices
    • G01M11/0214Details of devices holding the object to be tested
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0207Details of measuring devices

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Couplings Of Light Guides (AREA)
  • Eyeglasses (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2000565375A 1998-08-17 1999-08-13 光学部品を欠陥がないか検査するための検査モジュール Expired - Lifetime JP4414595B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP98250293 1998-08-17
EP98250293.2 1998-08-17
PCT/EP1999/005935 WO2000009980A1 (de) 1998-08-17 1999-08-13 Prüfmodul zum prüfen von optischen teilen auf fehler

Publications (3)

Publication Number Publication Date
JP2002522784A JP2002522784A (ja) 2002-07-23
JP2002522784A5 JP2002522784A5 (https=) 2006-09-28
JP4414595B2 true JP4414595B2 (ja) 2010-02-10

Family

ID=8234600

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000565375A Expired - Lifetime JP4414595B2 (ja) 1998-08-17 1999-08-13 光学部品を欠陥がないか検査するための検査モジュール

Country Status (7)

Country Link
US (1) US6606150B2 (https=)
EP (1) EP1105707B1 (https=)
JP (1) JP4414595B2 (https=)
AT (1) ATE433100T1 (https=)
AU (1) AU5515899A (https=)
DE (1) DE59915032D1 (https=)
WO (1) WO2000009980A1 (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4511731B2 (ja) * 1998-08-17 2010-07-28 ノバルティス アーゲー 眼科用レンズの光学的検査のためのキュベット
US6765661B2 (en) * 2001-03-09 2004-07-20 Novartis Ag Lens inspection
US6909503B2 (en) 2001-08-17 2005-06-21 Novartis Ag Cuvette for lens inspection
US7837327B2 (en) * 2002-04-12 2010-11-23 Menicon Co., Ltd. Contact lens user support system and support method
US7130037B1 (en) * 2003-01-09 2006-10-31 Kla-Tencor Technologies Corp. Systems for inspecting wafers and reticles with increased resolution
US7347466B1 (en) * 2005-02-14 2008-03-25 Michael Alan Feldman Multipurpose contact lens accessory
US20070152459A1 (en) * 2005-12-29 2007-07-05 Bausch & Lomb Incorporated Contact lens picker
WO2007143647A2 (en) * 2006-06-05 2007-12-13 Visicon Inspection Technologies Llc Stent inspection system
US7477366B2 (en) * 2006-12-07 2009-01-13 Coopervision International Holding Company, Lp Contact lens blister packages and methods for automated inspection of hydrated contact lenses
WO2009076049A1 (en) * 2007-12-10 2009-06-18 Bausch & Lomb Incorporated Apparatus and method for degassing a fluid to enhance inspection of ophthalmic devices
US20100129181A1 (en) * 2008-11-21 2010-05-27 Blasiak Joseph D Lens handler
MY160654A (en) 2010-12-16 2017-03-15 Novartis Ag Method and apparatus for transferring objects between two consecutive processing stations being operated with different cycle speeds
JP5960252B2 (ja) * 2011-06-03 2016-08-02 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッドJohnson & Johnson Vision Care, Inc. 眼科用レンズの複数放射検査
US8789282B2 (en) * 2012-05-25 2014-07-29 Shavelogic, Inc. Magnetic attachment for shaving cartridge
WO2015134449A1 (en) 2014-03-05 2015-09-11 Novartis Ag Method for automatic inspection of contact lenses
WO2016083221A1 (en) * 2014-11-25 2016-06-02 Novartis Ag Cuvette system and methods for the inspection of ophthalmic lenses
US9718625B2 (en) 2015-11-20 2017-08-01 Greatquo Technology Co., Ltd. Automatically cycling detecting-and-sorting device
CN107727366B (zh) * 2017-09-30 2019-11-22 北京亚欧震达科技发展有限公司 动车检修库管廊照明的检测方法、装置、系统及存储介质
JP7676941B2 (ja) * 2021-05-19 2025-05-15 日本電気硝子株式会社 微小物体の検査方法
US12517006B2 (en) * 2021-08-10 2026-01-06 Johnson & Johnson Vision Care, Inc. Quality control for sealed lens packages

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4623249A (en) * 1983-10-14 1986-11-18 Grant Alan H Container for an optical element
JPS6098035U (ja) * 1983-12-13 1985-07-04 キヤノン株式会社 ソフトコンタクトレンズの光学特性測定用装置
US4736130A (en) * 1987-01-09 1988-04-05 Puskas William L Multiparameter generator for ultrasonic transducers
CH676656A5 (https=) * 1988-09-07 1991-02-28 Fritz Dr Med Bieri
JPH0260872U (https=) * 1988-10-26 1990-05-07
US5086397A (en) * 1989-07-18 1992-02-04 Schuster Pamela K Method and apparatus for data collection of testing and inspection of products made on a production assembly line
AU649291B2 (en) * 1990-12-19 1994-05-19 Bodenseewerk Geratetechnik Gmbh Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects
AU649287B2 (en) * 1990-12-19 1994-05-19 Novartis Ag Process for rendering contact lenses hydrophilic
JPH0827291B2 (ja) * 1992-06-29 1996-03-21 株式会社東芝 自動化学分析装置
IL107513A (en) * 1992-12-21 1997-07-13 Johnson & Johnson Vision Prod Ophthalmic lens inspection system and method
GR1002789B (el) * 1992-12-21 1997-10-17 Johnson & Johnson Vision Products Inc. Μια συσκευη για την μεταφορα οφθαλμικων φακων.
GR1002072B (en) * 1992-12-21 1995-11-30 Johnson & Johnson Vision Prod Illumination system for opthalmic lens inspection.
EP0711409B1 (en) * 1993-07-29 1999-02-24 Wesley Jessen Corporation Inspection system for optical components
JP3734512B2 (ja) * 1993-12-27 2006-01-11 株式会社メニコン コンタクトレンズ外観検査方法および外観検査装置
IL113950A0 (en) * 1994-06-10 1995-08-31 Johnson & Johnson Vision Prod A method of positioning ophthalimic lenses
US5578331A (en) * 1994-06-10 1996-11-26 Vision Products, Inc. Automated apparatus for preparing contact lenses for inspection and packaging
JPH08122337A (ja) * 1994-10-24 1996-05-17 Toshiba Corp 自動分析装置
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components
EP0834848A3 (en) * 1996-10-02 1998-09-16 Texas Instruments Incorporated Fixed optic sensor system and distributed sensor network
JPH10197442A (ja) * 1997-01-07 1998-07-31 Iseki & Co Ltd 分光分析機の遠隔集中管理装置

Also Published As

Publication number Publication date
EP1105707B1 (de) 2009-06-03
ATE433100T1 (de) 2009-06-15
WO2000009980A1 (de) 2000-02-24
DE59915032D1 (de) 2009-07-16
JP2002522784A (ja) 2002-07-23
US6606150B2 (en) 2003-08-12
AU5515899A (en) 2000-03-06
US20020009217A1 (en) 2002-01-24
EP1105707A1 (de) 2001-06-13

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