AU5515899A - Inspection module for inspecting optical parts for faults - Google Patents

Inspection module for inspecting optical parts for faults

Info

Publication number
AU5515899A
AU5515899A AU55158/99A AU5515899A AU5515899A AU 5515899 A AU5515899 A AU 5515899A AU 55158/99 A AU55158/99 A AU 55158/99A AU 5515899 A AU5515899 A AU 5515899A AU 5515899 A AU5515899 A AU 5515899A
Authority
AU
Australia
Prior art keywords
optical parts
vessels
image
parts
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU55158/99A
Other languages
English (en)
Inventor
Roger Biel
Peter Hagmann
Roland Dr. Hauck
Olaf Rothe
Roland Seibert
Hans Worner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Novartis AG
Original Assignee
Novartis AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Novartis AG filed Critical Novartis AG
Publication of AU5515899A publication Critical patent/AU5515899A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G01M11/0214—Details of devices holding the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Couplings Of Light Guides (AREA)
  • Eyeglasses (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AU55158/99A 1998-08-17 1999-08-13 Inspection module for inspecting optical parts for faults Abandoned AU5515899A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP98250293 1998-08-17
EP98250293 1998-08-17
PCT/EP1999/005935 WO2000009980A1 (de) 1998-08-17 1999-08-13 Prüfmodul zum prüfen von optischen teilen auf fehler

Publications (1)

Publication Number Publication Date
AU5515899A true AU5515899A (en) 2000-03-06

Family

ID=8234600

Family Applications (1)

Application Number Title Priority Date Filing Date
AU55158/99A Abandoned AU5515899A (en) 1998-08-17 1999-08-13 Inspection module for inspecting optical parts for faults

Country Status (7)

Country Link
US (1) US6606150B2 (https=)
EP (1) EP1105707B1 (https=)
JP (1) JP4414595B2 (https=)
AT (1) ATE433100T1 (https=)
AU (1) AU5515899A (https=)
DE (1) DE59915032D1 (https=)
WO (1) WO2000009980A1 (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4511731B2 (ja) * 1998-08-17 2010-07-28 ノバルティス アーゲー 眼科用レンズの光学的検査のためのキュベット
US6765661B2 (en) * 2001-03-09 2004-07-20 Novartis Ag Lens inspection
US6909503B2 (en) 2001-08-17 2005-06-21 Novartis Ag Cuvette for lens inspection
US7837327B2 (en) * 2002-04-12 2010-11-23 Menicon Co., Ltd. Contact lens user support system and support method
US7130037B1 (en) * 2003-01-09 2006-10-31 Kla-Tencor Technologies Corp. Systems for inspecting wafers and reticles with increased resolution
US7347466B1 (en) * 2005-02-14 2008-03-25 Michael Alan Feldman Multipurpose contact lens accessory
US20070152459A1 (en) * 2005-12-29 2007-07-05 Bausch & Lomb Incorporated Contact lens picker
WO2007143647A2 (en) * 2006-06-05 2007-12-13 Visicon Inspection Technologies Llc Stent inspection system
US7477366B2 (en) * 2006-12-07 2009-01-13 Coopervision International Holding Company, Lp Contact lens blister packages and methods for automated inspection of hydrated contact lenses
WO2009076049A1 (en) * 2007-12-10 2009-06-18 Bausch & Lomb Incorporated Apparatus and method for degassing a fluid to enhance inspection of ophthalmic devices
US20100129181A1 (en) * 2008-11-21 2010-05-27 Blasiak Joseph D Lens handler
MY160654A (en) 2010-12-16 2017-03-15 Novartis Ag Method and apparatus for transferring objects between two consecutive processing stations being operated with different cycle speeds
JP5960252B2 (ja) * 2011-06-03 2016-08-02 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッドＪｏｈｎｓｏｎ ＆ Ｊｏｈｎｓｏｎ Ｖｉｓｉｏｎ Ｃａｒｅ， Ｉｎｃ． 眼科用レンズの複数放射検査
US8789282B2 (en) * 2012-05-25 2014-07-29 Shavelogic, Inc. Magnetic attachment for shaving cartridge
WO2015134449A1 (en) 2014-03-05 2015-09-11 Novartis Ag Method for automatic inspection of contact lenses
WO2016083221A1 (en) * 2014-11-25 2016-06-02 Novartis Ag Cuvette system and methods for the inspection of ophthalmic lenses
US9718625B2 (en) 2015-11-20 2017-08-01 Greatquo Technology Co., Ltd. Automatically cycling detecting-and-sorting device
CN107727366B (zh) * 2017-09-30 2019-11-22 北京亚欧震达科技发展有限公司 动车检修库管廊照明的检测方法、装置、系统及存储介质
JP7676941B2 (ja) * 2021-05-19 2025-05-15 日本電気硝子株式会社 微小物体の検査方法
US12517006B2 (en) * 2021-08-10 2026-01-06 Johnson & Johnson Vision Care, Inc. Quality control for sealed lens packages

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4623249A (en) * 1983-10-14 1986-11-18 Grant Alan H Container for an optical element
JPS6098035U (ja) * 1983-12-13 1985-07-04 キヤノン株式会社 ソフトコンタクトレンズの光学特性測定用装置
US4736130A (en) * 1987-01-09 1988-04-05 Puskas William L Multiparameter generator for ultrasonic transducers
CH676656A5 (https=) * 1988-09-07 1991-02-28 Fritz Dr Med Bieri
JPH0260872U (https=) * 1988-10-26 1990-05-07
US5086397A (en) * 1989-07-18 1992-02-04 Schuster Pamela K Method and apparatus for data collection of testing and inspection of products made on a production assembly line
AU649291B2 (en) * 1990-12-19 1994-05-19 Bodenseewerk Geratetechnik Gmbh Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects
AU649287B2 (en) * 1990-12-19 1994-05-19 Novartis Ag Process for rendering contact lenses hydrophilic
JPH0827291B2 (ja) * 1992-06-29 1996-03-21 株式会社東芝 自動化学分析装置
IL107513A (en) * 1992-12-21 1997-07-13 Johnson & Johnson Vision Prod Ophthalmic lens inspection system and method
GR1002789B (el) * 1992-12-21 1997-10-17 Johnson & Johnson Vision Products Inc. Μια συσκευη για την μεταφορα οφθαλμικων φακων.
GR1002072B (en) * 1992-12-21 1995-11-30 Johnson & Johnson Vision Prod Illumination system for opthalmic lens inspection.
EP0711409B1 (en) * 1993-07-29 1999-02-24 Wesley Jessen Corporation Inspection system for optical components
JP3734512B2 (ja) * 1993-12-27 2006-01-11 株式会社メニコン コンタクトレンズ外観検査方法および外観検査装置
IL113950A0 (en) * 1994-06-10 1995-08-31 Johnson & Johnson Vision Prod A method of positioning ophthalimic lenses
US5578331A (en) * 1994-06-10 1996-11-26 Vision Products, Inc. Automated apparatus for preparing contact lenses for inspection and packaging
JPH08122337A (ja) * 1994-10-24 1996-05-17 Toshiba Corp 自動分析装置
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components
EP0834848A3 (en) * 1996-10-02 1998-09-16 Texas Instruments Incorporated Fixed optic sensor system and distributed sensor network
JPH10197442A (ja) * 1997-01-07 1998-07-31 Iseki & Co Ltd 分光分析機の遠隔集中管理装置

Also Published As

Publication number Publication date
EP1105707B1 (de) 2009-06-03
ATE433100T1 (de) 2009-06-15
WO2000009980A1 (de) 2000-02-24
DE59915032D1 (de) 2009-07-16
JP2002522784A (ja) 2002-07-23
US6606150B2 (en) 2003-08-12
JP4414595B2 (ja) 2010-02-10
US20020009217A1 (en) 2002-01-24
EP1105707A1 (de) 2001-06-13

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase