JP4387161B2 - 加工装置 - Google Patents
加工装置 Download PDFInfo
- Publication number
- JP4387161B2 JP4387161B2 JP2003372110A JP2003372110A JP4387161B2 JP 4387161 B2 JP4387161 B2 JP 4387161B2 JP 2003372110 A JP2003372110 A JP 2003372110A JP 2003372110 A JP2003372110 A JP 2003372110A JP 4387161 B2 JP4387161 B2 JP 4387161B2
- Authority
- JP
- Japan
- Prior art keywords
- unit
- lighting device
- wafer
- image
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005286 illumination Methods 0.000 claims description 18
- 238000003384 imaging method Methods 0.000 claims description 16
- 230000003287 optical effect Effects 0.000 claims description 9
- 229910052736 halogen Inorganic materials 0.000 claims description 6
- 150000002367 halogens Chemical class 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 3
- 235000012431 wafers Nutrition 0.000 description 37
- 239000004065 semiconductor Substances 0.000 description 8
- 238000004140 cleaning Methods 0.000 description 6
- 238000004904 shortening Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Description
2:カセット
3:搬出入手段
4:仮置き領域
5:第一の搬送手段
6:チャックテーブル
7:アライメント手段
70:光学系 71:撮像部 72:照明機器 73:画像処理手段
74:電圧調整手段
740:判断部 741:切り替え部
8:切削手段
9:洗浄手段
10:第二の搬送手段
Claims (2)
- ウェーハを保持するチャックテーブルと、該チャックテーブルに保持されたウェーハを撮像して加工領域を検出するアライメント手段と、該チャックテーブルに保持されたウェーハに加工を施す加工手段とを少なくとも備え、
該アライメント手段には、光学系と、該光学系がとり入れた光を電気信号に変換する撮像部と、該ウェーハの加工領域を照明する照明機器とを備え、
該撮像部は、該撮像部において取得した電気信号に処理を施す画像処理手段に接続され、
該照明機器は、該照明機器に供給する電圧の値を調整する電圧値調整手段に接続され、
該電圧値調整手段は、該照明機器に接続された切り替え部と、該画像処理手段に接続され画像処理手段からの信号に基づきウェーハの撮像による画像を取り込んでいるか否かを判断する判断部とから構成され、
該判断部が画像を取り込んでいると判断すると、該切り替え部が該照明機器の使用時の電圧を該照明機器に供給し、該判断部が画像を取り込んでいないと判断すると、該切り替え部が画像の取り込み中より低い待機時の電圧を該照明機器に供給することを特徴とする加工装置。 - 前記照明機器はハロゲンランプである請求項1に記載の加工装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003372110A JP4387161B2 (ja) | 2003-10-31 | 2003-10-31 | 加工装置 |
CNB2004100857389A CN100347844C (zh) | 2003-10-31 | 2004-10-11 | 加工装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003372110A JP4387161B2 (ja) | 2003-10-31 | 2003-10-31 | 加工装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005136293A JP2005136293A (ja) | 2005-05-26 |
JP4387161B2 true JP4387161B2 (ja) | 2009-12-16 |
Family
ID=34648574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003372110A Expired - Lifetime JP4387161B2 (ja) | 2003-10-31 | 2003-10-31 | 加工装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP4387161B2 (ja) |
CN (1) | CN100347844C (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5389580B2 (ja) * | 2009-09-17 | 2014-01-15 | 株式会社ディスコ | 切削装置 |
EP3487267A1 (de) * | 2017-11-20 | 2019-05-22 | Atlas Material Testing Technology GmbH | Hochleistungsbelichtung für simulationsanordnung für kraftfahrzeugunfälle |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06232255A (ja) * | 1993-01-29 | 1994-08-19 | Disco Abrasive Syst Ltd | ウェーハのダイシング方法 |
JPH08264622A (ja) * | 1995-03-22 | 1996-10-11 | Disco Abrasive Syst Ltd | アライメント方法及びキーパターン検出方法 |
US6106662A (en) * | 1998-06-08 | 2000-08-22 | Speedfam-Ipec Corporation | Method and apparatus for endpoint detection for chemical mechanical polishing |
JP4617028B2 (ja) * | 2001-08-17 | 2011-01-19 | 株式会社ディスコ | 加工歪除去装置 |
-
2003
- 2003-10-31 JP JP2003372110A patent/JP4387161B2/ja not_active Expired - Lifetime
-
2004
- 2004-10-11 CN CNB2004100857389A patent/CN100347844C/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN100347844C (zh) | 2007-11-07 |
CN1612319A (zh) | 2005-05-04 |
JP2005136293A (ja) | 2005-05-26 |
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