JP4335500B2 - 半導体レーザおよびその製造方法 - Google Patents
半導体レーザおよびその製造方法 Download PDFInfo
- Publication number
- JP4335500B2 JP4335500B2 JP2002213798A JP2002213798A JP4335500B2 JP 4335500 B2 JP4335500 B2 JP 4335500B2 JP 2002213798 A JP2002213798 A JP 2002213798A JP 2002213798 A JP2002213798 A JP 2002213798A JP 4335500 B2 JP4335500 B2 JP 4335500B2
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- JP
- Japan
- Prior art keywords
- active region
- semiconductor laser
- substrate
- laser
- active
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 29
- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 239000000758 substrate Substances 0.000 claims description 19
- 230000003071 parasitic effect Effects 0.000 description 10
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 238000003631 wet chemical etching Methods 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/227—Buried mesa structure ; Striped active layer
- H01S5/2275—Buried mesa structure ; Striped active layer mesa created by etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/227—Buried mesa structure ; Striped active layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0233—Mounting configuration of laser chips
- H01S5/02345—Wire-bonding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04254—Electrodes, e.g. characterised by the structure characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/06226—Modulation at ultra-high frequencies
Landscapes
- Physics & Mathematics (AREA)
- Geometry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP01306520A EP1282208A1 (en) | 2001-07-30 | 2001-07-30 | Semiconductor laser structure and method of manufacturing same |
| EP01306520.6 | 2001-07-30 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2003115638A JP2003115638A (ja) | 2003-04-18 |
| JP2003115638A5 JP2003115638A5 (enExample) | 2005-10-27 |
| JP4335500B2 true JP4335500B2 (ja) | 2009-09-30 |
Family
ID=8182153
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002213798A Expired - Fee Related JP4335500B2 (ja) | 2001-07-30 | 2002-07-23 | 半導体レーザおよびその製造方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6782026B2 (enExample) |
| EP (1) | EP1282208A1 (enExample) |
| JP (1) | JP4335500B2 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003338664A (ja) * | 2002-05-20 | 2003-11-28 | Mitsubishi Electric Corp | 半導体装置 |
| JP2010272784A (ja) * | 2009-05-25 | 2010-12-02 | Panasonic Corp | 半導体レーザ装置 |
| CN113594846B (zh) * | 2021-07-28 | 2024-09-27 | 中国科学院半导体研究所 | 半导体激光器及其制备方法 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5878487A (ja) * | 1981-10-29 | 1983-05-12 | Kokusai Denshin Denwa Co Ltd <Kdd> | 分布帰還形半導体レ−ザ |
| GB2156584B (en) * | 1984-03-16 | 1987-11-04 | Hitachi Ltd | Semiconductor laser chip |
| CA1247947A (en) * | 1984-07-31 | 1989-01-03 | Masaru Wada | Method of manufacturing semiconductor device |
| EP0236713A3 (de) * | 1986-02-10 | 1988-06-29 | Siemens Aktiengesellschaft | Laserdiode |
| JPS62283685A (ja) * | 1986-05-31 | 1987-12-09 | Mitsubishi Electric Corp | 半導体レ−ザ装置の製造方法 |
| US4924476A (en) * | 1987-12-04 | 1990-05-08 | Cornell Research Foundation, Inc. | Traveling wave semi-conductor laser |
| JPH02164089A (ja) * | 1988-12-19 | 1990-06-25 | Nec Corp | 半導体レーザ素子 |
| EP0437836B1 (en) | 1989-12-27 | 1995-05-17 | Nec Corporation | Optical semiconductor device |
| JPH03206678A (ja) * | 1990-01-08 | 1991-09-10 | Nec Corp | 半導体レーザー |
| JP3149030B2 (ja) * | 1991-06-13 | 2001-03-26 | 富士通株式会社 | 半導体量子箱装置及びその製造方法 |
| KR940007605B1 (ko) * | 1991-11-07 | 1994-08-20 | 주식회사 금성사 | 반도체 레이저 다이오드 제조방법 |
| JP3142333B2 (ja) * | 1991-12-17 | 2001-03-07 | 株式会社東芝 | 分布帰還型半導体レ−ザ及びその駆動方法 |
| DE69331979T2 (de) * | 1992-02-28 | 2003-01-23 | Hitachi, Ltd. | Optische integrierte Halbleitervorrichtung und Verfahren zur Herstellung und Verwendung in einem Lichtempfänger |
| JPH06232099A (ja) * | 1992-09-10 | 1994-08-19 | Mitsubishi Electric Corp | 半導体装置の製造方法,半導体装置の製造装置,半導体レーザの製造方法,量子細線構造の製造方法,及び結晶成長方法 |
| JPH07202263A (ja) * | 1993-12-28 | 1995-08-04 | Ricoh Co Ltd | 端面発光型発光ダイオード、アレイ状光源、側面受光型受光素子、受発光素子、端面発光型発光ダイオードアレイ状光源 |
| GB2309581B (en) * | 1996-01-27 | 2000-03-22 | Northern Telecom Ltd | Semiconductor lasers |
| JPH1075009A (ja) * | 1996-08-30 | 1998-03-17 | Nec Corp | 光半導体装置とその製造方法 |
| US5972730A (en) * | 1996-09-26 | 1999-10-26 | Kabushiki Kaisha Toshiba | Nitride based compound semiconductor light emitting device and method for producing the same |
| JP3734900B2 (ja) * | 1996-10-31 | 2006-01-11 | 古河電気工業株式会社 | 半導体光導波路構造、光デバイス、及び、それらの製造方法 |
| JP3244116B2 (ja) * | 1997-08-18 | 2002-01-07 | 日本電気株式会社 | 半導体レーザー |
| US6052397A (en) * | 1997-12-05 | 2000-04-18 | Sdl, Inc. | Laser diode device having a substantially circular light output beam and a method of forming a tapered section in a semiconductor device to provide for a reproducible mode profile of the output beam |
| JP2000312054A (ja) * | 1998-04-28 | 2000-11-07 | Sharp Corp | 半導体素子の製造方法、及び半導体素子 |
| KR100277940B1 (ko) * | 1998-07-14 | 2001-02-01 | 구자홍 | 지에이엔(gan) 반도체 레이저 다이오드 및 그 제조방법 |
| JP4618854B2 (ja) * | 2000-08-11 | 2011-01-26 | Okiセミコンダクタ株式会社 | 半導体装置およびその製造方法 |
-
2001
- 2001-07-30 EP EP01306520A patent/EP1282208A1/en not_active Withdrawn
-
2002
- 2002-07-23 JP JP2002213798A patent/JP4335500B2/ja not_active Expired - Fee Related
- 2002-07-29 US US10/206,833 patent/US6782026B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP1282208A1 (en) | 2003-02-05 |
| JP2003115638A (ja) | 2003-04-18 |
| US20030021321A1 (en) | 2003-01-30 |
| US6782026B2 (en) | 2004-08-24 |
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